公开(公告)号：US20060090148A1

公开(公告)日：2006-04-27

申请号：US10974104

申请日：2004-10-26

申请人： Jun Zhu ,  Yulan Wang ,  Charles McFalls

发明人： Jun Zhu ,  Yulan Wang ,  Charles McFalls

IPC分类号： G06F17/50

CPC分类号： G06F17/5081

摘要： Wide geometry can be accurately extracted from the physical layout of an integrated circuit through the use of detection circles having diameters equal to a threshold width. Projection regions in the layout are selected, and for each projection region, a detection circle of a threshold width (diameter) is defined. A trim region within each projection region is defined using the associated detection circle, such that a portion of the trim region boundary exhibits tangency to the detection circle. The trim regions, which represent non-wide portions of the layout, are then removed to generate a wide element layout. Because the detection circle is a rotation-independent geometry, the over-extraction and under-extraction problems associated with conventional wide element extraction methods can be eliminated.

摘要翻译： 通过使用直径等于阈值宽度的检测圆，可以从集成电路的物理布局中精确地提取宽几何形状。 选择布局中的投影区域，并且对于每个投影区域，定义阈值宽度（直径）的检测圆。 使用相关联的检测圆限定每个投影区域内的修剪区域，使得修剪区域边界的一部分显示与检测圆相切。 然后移除表示布局的非宽部分的修剪区域以生成宽的元素布局。 由于检测圈是旋转独立的几何形状，因此可以消除与常规宽元件提取方法相关的过度提取和欠提取问题。