公开(公告)号：US20120231744A1

公开(公告)日：2012-09-13

申请号：US13044844

申请日：2011-03-10

申请人： Justin Gregg ,  Adil Syed ,  Tomoki Takeya

发明人： Justin Gregg ,  Adil Syed ,  Tomoki Takeya

IPC分类号： H04B17/00

CPC分类号： H04B17/309 ,  H04B17/29 ,  H04W52/143

摘要： A test station may include a test host, a tester, and a test chamber. Multiple devices under test (DUTs) may be placed in the test chamber during device characterization operations. Radio-frequency signals may be conveyed from the tester to the multiple DUTs using a radiated arrangement through an antenna in the test chamber. The tester may broadcast downlink test signals in parallel to the multiple DUTs. The DUTs may simultaneously synchronize with the downlink test signals and measure radio-frequency performance levels while receiving the downlink test signals. The test host may direct the tester to gradually lower its output power level. The DUTs may be used to determine downlink sensitivity by monitoring the measured radio-frequency performance levels as the output power level of the tester is lowered. Simultaneously downlink sensitivity testing may be performed for multiple modulation schemes and data rates for any communications protocol.

摘要翻译： 测试台可以包括测试主机，测试器和测试室。 在设备表征操作期间，可以将多个被测设备（DUT）放置在测试室中。 射频信号可以使用辐射布置通过测试室中的天线从测试仪传送到多个DUT。 测试者可以并行地向多个DUT广播下行链路测试信号。 DUT可以同时与下行链路测试信号同步并且在接收下行链路测试信号的同时测量射频性能水平。 测试主机可以指示测试仪逐渐降低其输出功率电平。 当测试仪的输出功率电平降低时，DUT可以通过监测测量的射频性能水平来确定下行链路灵敏度。 同时可以针对任何通信协议的多个调制方案和数据速率执行下行链路灵敏度测试。

公开(公告)号：US20110301905A1

公开(公告)日：2011-12-08

申请号：US13011695

申请日：2011-01-21

申请人： Justin Gregg ,  Tomoki Takeya ,  Adil Syed

发明人： Justin Gregg ,  Tomoki Takeya ,  Adil Syed

IPC分类号： G06F19/00

CPC分类号： G01R35/005 ,  G01R27/28 ,  G01R31/2822 ,  G01R31/2837 ,  H04B17/0085 ,  H04B17/14 ,  H04B17/318 ,  H04W24/00 ,  H04W24/06 ,  H04W24/10 ,  H04W28/04

摘要： Calibration equipment for calibrating multiple test stations in a test system is provided. Each test station may include a test unit, a test fixture, and a radio-frequency (RF) cable that connects the test unit to the test fixture. A control test setup may be used to calibrate uplink and downlink characteristics associated with each test station (e.g., to determine path loss associated with the RF cable and test fixture and variations associated with the test unit). The control test setup may calibrate each test station at desired frequencies to generate a test station error (offset) table. The test unit of each test station may be individually configured based on the test station error table so that offset is minimized among the different stations and so that the test stations may reliably measure hundreds or thousands of wireless electronic devices during product testing.

摘要翻译： 提供了用于在测试系统中校准多个测试站的校准设备。 每个测试台可以包括测试单元，测试夹具和将测试单元连接到测试夹具的射频（RF）电缆。 可以使用控制测试设置来校准与每个测试站相关联的上行链路和下行链路特性（例如，确定与RF电缆和测试夹具相关联的路径损耗以及与测试单元相关联的变化）。 控制测试设置可以以期望的频率校准每个测试站，以产生测试站错误（偏移）表。 每个测试台的测试单元可以基于测试台错误表单独配置，使得不同站之间的偏移最小化，并且使得测试站可以在产品测试期间可靠地测量数百或数千个无线电子设备。

公开(公告)号：US08903672B2

公开(公告)日：2014-12-02

申请号：US13011695

申请日：2011-01-21

申请人： Justin Gregg ,  Tomoki Takeya ,  Adil Syed

发明人： Justin Gregg ,  Tomoki Takeya ,  Adil Syed

IPC分类号： G06F3/02 ,  G06F3/00 ,  G06F3/01 ,  G06F13/00 ,  G01R35/00 ,  H04B17/00 ,  H04W24/00 ,  G01R31/28 ,  G01R27/28 ,  H04W24/06 ,  H04W24/10 ,  H04W28/04

CPC分类号： G01R35/005 ,  G01R27/28 ,  G01R31/2822 ,  G01R31/2837 ,  H04B17/0085 ,  H04B17/14 ,  H04B17/318 ,  H04W24/00 ,  H04W24/06 ,  H04W24/10 ,  H04W28/04

摘要： Calibration equipment for calibrating multiple test stations in a test system is provided. Each test station may include a test unit, a test fixture, and a radio-frequency (RF) cable that connects the test unit to the test fixture. A control test setup may be used to calibrate uplink and downlink characteristics associated with each test station (e.g., to determine path loss associated with the RF cable and test fixture and variations associated with the test unit). The control test setup may calibrate each test station at desired frequencies to generate a test station error (offset) table. The test unit of each test station may be individually configured based on the test station error table so that offset is minimized among the different stations and so that the test stations may reliably measure hundreds or thousands of wireless electronic devices during product testing.

摘要翻译： 提供了用于在测试系统中校准多个测试站的校准设备。 每个测试台可以包括测试单元，测试夹具和将测试单元连接到测试夹具的射频（RF）电缆。 可以使用控制测试设置来校准与每个测试站相关联的上行链路和下行链路特性（例如，确定与RF电缆和测试夹具相关联的路径损耗以及与测试单元相关联的变化）。 控制测试设置可以以期望的频率校准每个测试站，以生成测试站错误（偏移）表。 每个测试台的测试单元可以基于测试台错误表单独配置，使得不同站之间的偏移最小化，并且使得测试站可以在产品测试期间可靠地测量数百或数千个无线电子设备。

公开(公告)号：US08588704B2

公开(公告)日：2013-11-19

申请号：US13044844

申请日：2011-03-10

申请人： Justin Gregg ,  Adil Syed ,  Tomoki Takeya

发明人： Justin Gregg ,  Adil Syed ,  Tomoki Takeya

IPC分类号： H04B17/00

CPC分类号： H04B17/309 ,  H04B17/29 ,  H04W52/143

摘要： A test station may include a test host, a tester, and a test chamber. Multiple devices under test (DUTs) may be placed in the test chamber during device characterization operations. Radio-frequency signals may be conveyed from the tester to the multiple DUTs using a radiated arrangement through an antenna in the test chamber. The tester may broadcast downlink test signals in parallel to the multiple DUTs. The DUTs may simultaneously synchronize with the downlink test signals and measure radio-frequency performance levels while receiving the downlink test signals. The test host may direct the tester to gradually lower its output power level. The DUTs may be used to determine downlink sensitivity by monitoring the measured radio-frequency performance levels as the output power level of the tester is lowered. Simultaneously downlink sensitivity testing may be performed for multiple modulation schemes and data rates for any communications protocol.

摘要翻译： 测试台可以包括测试主机，测试器和测试室。 在设备表征操作期间，可以将多个被测设备（DUT）放置在测试室中。 射频信号可以使用辐射布置通过测试室中的天线从测试仪传送到多个DUT。 测试者可以并行地向多个DUT广播下行链路测试信号。 DUT可以同时与下行链路测试信号同步并且在接收下行链路测试信号的同时测量射频性能水平。 测试主机可以指示测试仪逐渐降低其输出功率电平。 当测试仪的输出功率电平降低时，DUT可以通过监测测量的射频性能水平来确定下行链路灵敏度。 同时可以针对任何通信协议的多个调制方案和数据速率执行下行链路灵敏度测试。

公开(公告)号：US08374815B2

公开(公告)日：2013-02-12

申请号：US12769602

申请日：2010-04-28

申请人： Justin Gregg ,  Tomoki Takeya ,  Adil Syed

发明人： Justin Gregg ,  Tomoki Takeya ,  Adil Syed

IPC分类号： G01D18/00 ,  G06F11/30

CPC分类号： H01L22/20 ,  G01R31/2894 ,  G01R31/3025 ,  G01R35/005 ,  H01L2924/0002 ,  H01L2924/00

摘要： A test system may include multiple test stations. Electronic devices may be tested using the test system. Each test station may include a test unit such as a radio-frequency tester that can make wireless and wired radio-frequency signal measurements on devices under test. The test stations may be configured to perform pass-fail testing on devices under test during manufacturing. One or more selected devices under test that have passed the pass-fail tests may be retested using the test stations. Multiple tests may be performed at a given test station using the same selected device under test. Gathered test data may be analyzed to determine whether the test stations have sufficient accuracy and precision or need to be recalibrated or taken offline.

摘要翻译： 测试系统可以包括多个测试站。 电子设备可以使用测试系统进行测试。 每个测试台可以包括诸如射频测试仪的测试单元，其可以对被测设备进行无线和有线射频信号测量。 测试站可以被配置为在制造期间对被测设备执行通过失败测试。 可以使用测试台重新测试一个或多个被测试的已通过通过失败测试的设备。 可以在给定的测试台使用相同的所选择的被测设备进行多个测试。 可以分析收集的测试数据，以确定测试站是否具有足够的精度和精度，或者需要重新校准或脱机。

公开(公告)号：US20110270561A1

公开(公告)日：2011-11-03

申请号：US12769602

申请日：2010-04-28

申请人： Justin Gregg ,  Tomoki Takeya ,  Adil Syed

发明人： Justin Gregg ,  Tomoki Takeya ,  Adil Syed

IPC分类号： G06F19/00 ,  G01D18/00

CPC分类号： H01L22/20 ,  G01R31/2894 ,  G01R31/3025 ,  G01R35/005 ,  H01L2924/0002 ,  H01L2924/00

摘要： A test system may include multiple test stations. Electronic devices may be tested using the test system. Each test station may include a test unit such as a radio-frequency tester that can make wireless and wired radio-frequency signal measurements on devices under test. The test stations may be configured to perform pass-fail testing on devices under test during manufacturing. One or more selected devices under test that have passed the pass-fail tests may be retested using the test stations. Multiple tests may be performed at a given test station using the same selected device under test. Gathered test data may be analyzed to determine whether the test stations have sufficient accuracy and precision or need to be recalibrated or taken offline.

摘要翻译： 测试系统可以包括多个测试站。 电子设备可以使用测试系统进行测试。 每个测试台可以包括诸如射频测试仪的测试单元，其可以对被测设备进行无线和有线射频信号测量。 测试站可以被配置为在制造期间对被测设备执行通过失败测试。 可以使用测试台重新测试一个或多个被测试的已通过通过失败测试的设备。 可以在给定的测试台使用相同的所选择的被测设备进行多个测试。 可以分析收集的测试数据，以确定测试站是否具有足够的精度和精度，或者需要重新校准或脱机。

公开(公告)号：US20120221277A1

公开(公告)日：2012-08-30

申请号：US13035026

申请日：2011-02-25

申请人： Justin Gregg ,  Tomoki Takeya ,  David A. Donovan

发明人： Justin Gregg ,  Tomoki Takeya ,  David A. Donovan

IPC分类号： G06F19/00

CPC分类号： H04B17/11 ,  H04B17/104 ,  H04B17/21 ,  H04B17/318

摘要： Calibration equipment for calibrating multiple test stations in a test system is provided. Each test station may include a test unit, a test chamber with an over-the-air antenna, and a radio-frequency (RF) cable that connects the test unit to the test chamber. Reference devices under test (DUTs) may be used to calibrate uplink and downlink path loss (e.g., OTA path loss, RF cable path loss, and variations of the test unit) associated with each test station. The reference DUTs may calibrate each test station at desired frequencies to generate a path loss table. Once calibrated, the test chambers may be used during production testing to test factory DUTs. During production testing, the transmit/receive power efficiency of each factory DUT may be calculated based on values in the path loss table to determine whether a particular production DUT is a passing or failing DUT according to pass/fail criteria.

摘要翻译： 提供了用于在测试系统中校准多个测试站的校准设备。 每个测试台可以包括测试单元，具有空中天线的测试室和将测试单元连接到测试室的射频（RF）电缆。 被测试的参考设备（DUT）可用于校准与每个测试站相关联的上行链路和下行链路路径损耗（例如，OTA路径损耗，RF电缆路径损耗和测试单元的变化）。 参考DUT可以以期望的频率校准每个测试站以产生路径损耗表。 一旦校准，在生产测试期间可以使用测试室来测试工厂的DUT。 在生产测试期间，可以基于路径损耗表中的值来计算每个工厂DUT的发射/接收功率效率，以根据通过/失败标准确定特定生产DUT是否是通过或失败的DUT。

公开(公告)号：US08903374B2

公开(公告)日：2014-12-02

申请号：US12128534

申请日：2008-05-28

申请人： Tomoki Takeya ,  Justin Gregg ,  Ruben Caballero

发明人： Tomoki Takeya ,  Justin Gregg ,  Ruben Caballero

IPC分类号： H04B17/00 ,  H04B1/40 ,  H01Q1/24

CPC分类号： H01Q1/243 ,  H04B1/40 ,  H04B17/101 ,  H04B17/12

摘要： A wireless electronic device such as a portable electronic device may contain a baseband module. Power amplifier circuitry in the device may amplify radio-frequency signals for transmission. During calibration measurements, a computer directs the baseband module to generate control signals that adjust the gain of the power amplifier circuitry. The computer may also direct the baseband module to generate a series of modulated or unmodulated test tones at one or more communications channel frequencies. A power sensor may be connected to the output of the power amplifier circuitry using a transmission line path. The computer and power sensor may be used in making power measurements on radio-frequency signals at the output of the power amplifier while power amplifier gain and test tone frequency adjustments are being made. Power amplifier calibration data may be produced and stored in the electronic device based on the power measurements.

摘要翻译： 诸如便携式电子设备的无线电子设备可以包含基带模块。 设备中的功率放大器电路可以放大射频信号进行传输。 在校准测量期间，计算机引导基带模块产生调整功率放大器电路的增益的控制信号。 计算机还可以引导基带模块在一个或多个通信信道频率处产生一系列调制或未调制的测试音调。 功率传感器可以使用传输线路径连接到功率放大器电路的输出端。 在进行功率放大器增益和测试音频率调整时，计算机和功率传感器可用于在功率放大器的输出端对射频信号进行功率测量。 功率放大器校准数据可以基于功率测量产生并存储在电子设备中。

公开(公告)号：US08660812B2

公开(公告)日：2014-02-25

申请号：US13035026

申请日：2011-02-25

申请人： Justin Gregg ,  Tomoki Takeya ,  David A. Donovan

发明人： Justin Gregg ,  Tomoki Takeya ,  David A. Donovan

IPC分类号： G06F19/00

CPC分类号： H04B17/11 ,  H04B17/104 ,  H04B17/21 ,  H04B17/318

摘要： Calibration equipment for calibrating multiple test stations in a test system is provided. Each test station may include a test unit, a test chamber with an over-the-air antenna, and a radio-frequency (RF) cable that connects the test unit to the test chamber. Reference devices under test (DUTs) may be used to calibrate uplink and downlink path loss (e.g., OTA path loss, RF cable path loss, and variations of the test unit) associated with each test station. The reference DUTs may calibrate each test station at desired frequencies to generate a path loss table. Once calibrated, the test chambers may be used during production testing to test factory DUTs. During production testing, the transmit/receive power efficiency of each factory DUT may be calculated based on values in the path loss table to determine whether a particular production DUT is a passing or failing DUT according to pass/fail criteria.

摘要翻译： 提供了用于在测试系统中校准多个测试站的校准设备。 每个测试台可以包括测试单元，具有空中天线的测试室和将测试单元连接到测试室的射频（RF）电缆。 被测试参考设备（DUT）可用于校准与每个测试站相关联的上行链路和下行链路路径损耗（例如，OTA路径损耗，RF电缆路径损耗和测试单元的变化）。 参考DUT可以以期望的频率校准每个测试站以产生路径损耗表。 一旦校准，在生产测试期间可以使用测试室来测试工厂的DUT。 在生产测试期间，可以基于路径损耗表中的值来计算每个工厂DUT的发射/接收功率效率，以根据通过/失败标准确定特定生产DUT是否是通过或失败的DUT。

公开(公告)号：US20100113011A1

公开(公告)日：2010-05-06

申请号：US12266536

申请日：2008-11-06

申请人： Justin Gregg ,  Louie J. Sanguinetti ,  Tomoki Takeya

发明人： Justin Gregg ,  Louie J. Sanguinetti ,  Tomoki Takeya

IPC分类号： H04W24/00

CPC分类号： H04W24/06 ,  H04W4/14 ,  H04W88/02

摘要： Cellular telephones and other wireless electronic devices may be tested using test equipment. The test equipment may include a call box and a test host. During testing, a wireless electronic device may be placed in a test chamber. The test chamber may include an antenna that is connected to the test equipment. The test equipment may use the antenna to communicate wirelessly with the wireless electronic device during testing. The wireless electronic device may communicate with the test equipment using messages that are compliant with cellular telephone communications protocols such as short message service (SMS) messages. These wireless messages may be used to convey test information to the test equipment from the wireless electronic device. These wireless messages may also be used to send control commands to the wireless electronic device during testing and to store test results in the wireless electronic device.

摘要翻译： 蜂窝电话和其他无线电子设备可以使用测试设备进行测试。 测试设备可以包括呼叫箱和测试主机。 在测试期间，无线电子设备可以被放置在测试室中。 测试室可以包括连接到测试设备的天线。 在测试期间，测试设备可以使用天线与无线电子设备进行无线通信。 无线电子设备可以使用符合诸如短消息服务（SMS）消息之类的蜂窝电话通信协议的消息与测试设备进行通信。 这些无线消息可以用于将测试信息从无线电子设备传送到测试设备。 这些无线消息还可用于在测试期间向无线电子设备发送控制命令，并将测试结果存储在无线电子设备中。