公开(公告)号：US20180120244A1

公开(公告)日：2018-05-03

申请号：US15560895

申请日：2016-04-14

Applicant: KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY

Inventor： Laszlo VARGA ,  Bonbien VARGA ,  Victor CALO

IPC: G01N23/207

CPC classification number: G01N23/207 ,  G01N2223/0566 ,  G01N2223/413

Abstract: Various examples are provided for x-ray imaging of the microstructure of materials. In one example, a system for non-destructive material testing includes an x-ray source configured to generate a beam spot on a test item; a grid detector configured to receive x-rays diffracted from the test object; and a computing device configured to determine a microstructure image based at least in part upon a diffraction pattern of the x-rays diffracted from the test object. In another example, a method for determining a microstructure of a material includes illuminating a beam spot on the material with a beam of incident x-rays; detecting, with a grid detector, x-rays diffracted from the material; and determining, by a computing device, a microstructure image based at least in part upon a diffraction pattern of the x-rays diffracted from the material.