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公开(公告)号：US20210207954A1
公开(公告)日：2021-07-08
申请号：US17212219
申请日：2021-03-25
发明人： Seung-Jun LEE , Kwangill KOH , Moon-Young JEON , Sang-Kyu YUN , Hong-Min KIM , Jung HUR
IPC分类号： G01B11/25 , G01B11/245 , H04N5/247
摘要： Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.
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公开(公告)号：US20220260503A1
公开(公告)日：2022-08-18
申请号：US17735521
申请日：2022-05-03
发明人： Chan Kwon LEE , Moon Young JEON , Jung HUR , Deok Hwa HONG , Eun Ha JO
摘要： An inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.
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3.发明申请公开(公告)号：US20130314757A1
公开(公告)日：2013-11-28
申请号：US13900365
申请日：2013-05-22
发明人： Jang Il SER , Jung HUR , Moon-Young JEON , Hong-Min KIM , Sang-Kyu YUN , Jong-Kyu HONG
CPC分类号： G02B26/105 , F21V13/12
摘要： A wavelength-changeable laser apparatus including a laser light source, a collimating lens, a diffraction grating, and a mirror is shown. The laser light source provides a laser light. The collimating lens collects the laser light provided from the laser light source and providing a light that is substantially parallel. The diffraction grating diffracts the light provided from the collimating lens. The mirror reflects the light provided from the diffraction grating back to the diffraction grating, a rotation axis rotatable within a predetermined range of a tuning angle being set therein so that a wavelength of the laser light is changed in a mode hopping form, the minor rotating based on the rotation axis serving as a pivot point. Therefore, a wavelength change speed may be increased and a stability of wavelength change may be improved.
摘要翻译： 示出了包括激光光源，准直透镜，衍射光栅和反射镜的波长可变激光装置。 激光源提供激光。 准直透镜收集从激光光源提供的激光并提供基本平行的光。 衍射光栅衍射由准直透镜提供的光。 反射镜将从衍射光栅提供的光反射回衍射光栅，可在其中设置调谐角的预定范围内旋转的旋转轴，使得激光的波长以模式跳跃形式改变，小转动 基于作为枢轴点的旋转轴。 因此，可以增加波长变化速度，并且可以提高波长变化的稳定性。
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公开(公告)号：US20240060908A1
公开(公告)日：2024-02-22
申请号：US18499784
申请日：2023-11-01
发明人： Chan Kwon LEE , Moon Young JEON , Jung HUR , Deok Hwa HONG , Eun Ha JO
CPC分类号： G01N21/9501 , G01N21/4738
摘要： An inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.
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公开(公告)号：US20190265025A1
公开(公告)日：2019-08-29
申请号：US16343532
申请日：2017-10-23
发明人： Jung HUR , Woo Jae CHOI
摘要： Disclosed are a pattern light irradiating device and an inspection apparatus using the same. The pattern light irradiating device includes first and second pattern light sources installed on a frame having a plurality of through-holes. Each of the through-holes is formed along a single optical axis. The first pattern light source is configured to irradiate first pattern light having a fixed pitch. The second pattern light source is configured to irradiate second pattern light having a variable pitch.
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公开(公告)号：US20210254966A1
公开(公告)日：2021-08-19
申请号：US16764706
申请日：2018-11-15
发明人： Jung HUR , Woo Jae CHOI
摘要： An inspection apparatus for inspecting the appearance of an inspection target object is provided. The inspection apparatus according to one embodiment of the present disclosure includes a support part configured to hold an inspection target object such that a side surface of the inspection target object faces a predetermined direction, a light source configured to irradiate light toward the inspection target object, a diffusion reflector configured to diffusely reflect at least a part of the irradiated light to irradiate the reflected light to the side surface of the inspection target object, and at least one inspection part configured to inspect the inspection target object by receiving the light reflected from the inspection target object and the diffusion reflector.
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公开(公告)号：US20210102903A1
公开(公告)日：2021-04-08
申请号：US17123901
申请日：2020-12-16
发明人： Chan Kwon LEE , Moon Young JEON , Jung HUR , Deok Hwa HONG , Eun Ha JO
摘要： The present disclosure proposes an inspection apparatus. The inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.
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公开(公告)号：US20190293413A1
公开(公告)日：2019-09-26
申请号：US15929142
申请日：2019-06-12
发明人： Seung-Jun LEE , Kwangill KOH , Moon-Young JEON , Sang-Kyu YUN , Hong-Min KIM , Jung HUR
IPC分类号： G01B11/25 , H04N5/247 , G01B11/245
摘要： Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.
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公开(公告)号：US20140354804A1
公开(公告)日：2014-12-04
申请号：US14463269
申请日：2014-08-19
发明人： Seung-Jun LEE , Kwang-Ill KHO , Moon-Young JEON , Sang-Kyu YUN , Hong-Min KIM , Jung HUR
CPC分类号： G01B11/2513 , G01B11/245 , G02B27/40 , H04N5/247
摘要： Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.
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