METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, METHOD OF MANAGING PARTS, AND RECORDING MEDIUM

    公开(公告)号:US20190390333A1

    公开(公告)日:2019-12-26

    申请号:US16451507

    申请日:2019-06-25

    Abstract: There is provided a technique that includes executing a process recipe for processing a substrate; and executing a correction recipe for checking a characteristic value of a supply valve installed at a process gas supply line, wherein the act of executing the correction recipe comprises: supplying an inert gas into the process gas supply line for a certain period of time in a state where an adjusting valve that is installed at an exhaust portion of a process furnace and adjusts an internal pressure of the process furnace is fully opened; detecting a pressure value in a supply pipe provided with the supply valve while supplying the inert gas into the process gas supply line in the state where the adjusting valve is fully opened; and calculating the characteristic value of the supply valve based on the detected pressure value.

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