Surface defect inspection device and method

    公开(公告)号:US10768118B2

    公开(公告)日:2020-09-08

    申请号:US16616011

    申请日:2018-04-06

    Abstract: According to a surface defect inspection device and a surface defect inspection method according to the present invention, an inspection face of an inspection object is irradiated with illumination light, and a defect at the inspection face is detected, based on an image including the inspection face captured. According to the surface defect inspection device and the surface defect inspection method, the illumination light is emitted with formation of at least one set of a light region and a dark region, and a range of a defect detection image region for the detection of the defect, to be set to the image capturing the inspection face irradiated with the illumination light in the light region, is adjusted in accordance with a previously defined degree of visibility for orange peel, at the detection of the defect at the inspection face.

    Colorimetry device and colorimetry method

    公开(公告)号:US10578491B2

    公开(公告)日:2020-03-03

    申请号:US15558450

    申请日:2016-03-28

    Abstract: In a colorimetry device and a colorimetry method of the present invention, reference chart definition information including at least reference chart identification information about a reference color chart and patch position definition information indicating a position of each of plurality of patches in the reference color chart is stored, and whether the obtained color chart is matched with the reference color chart is determined based on the reference chart identification information. When the obtained color chart is determined to be matched with the reference color chart, a position of a colorimetry unit with respect to the color chart is relatively moved to the position of each of the plurality of patches in the color chart based on the reference chart definition information, and the colorimetry unit measures the color of each of the plurality of patches.

    Spectroscopic Analysis System and Method
    3.
    发明申请
    Spectroscopic Analysis System and Method 审中-公开
    光谱分析系统与方法

    公开(公告)号:US20160131526A1

    公开(公告)日:2016-05-12

    申请号:US14896591

    申请日:2014-05-21

    Abstract: In a spectroscopic analysis system and a spectroscopic analysis method of the present invention, in determining a content percentage of a component contained in a measurement object based on a measurement object spectrum, one or more calibration curves for obtaining the content percentage of the component contained in the measurement object are selected out of a plurality of calibration curves generated based on reference spectra corresponding to a plurality of sections, into which a content percentage of each of a plurality of components is divided, and classified according to the sections using the measurement object spectrum and the reference spectra.

    Abstract translation: 在本发明的光谱分析系统和光谱分析方法中,在基于测量对象光谱确定测量对象中包含的成分的含量百分比时,获得包含在测量对象光谱中的成分的含量百分比的一个或多个校准曲线 从基于与多个部分对应的参考光谱生成的多个校准曲线中选择测量对象,将多个分量中的每一个的内容百分比分割成多个部分,并根据使用测量对象光谱的部分进行分类 和参考光谱。

    Colorimeter device and colorimetery method

    公开(公告)号:US10254168B2

    公开(公告)日:2019-04-09

    申请号:US15526196

    申请日:2015-11-04

    Inventor: Koji Harada

    Abstract: A colorimetric device and a colorimetric method according to the present invention extract a chart region candidate, which is a candidate for a chart region, from an image of a color chart, obtain an evaluation value of this chart region candidate, determine whether or not the chart region candidate is the chart region based on this obtained evaluation value, obtain each position of a plurality of patches for the chart region candidate determined as the chart region as a result of the determination and colorimetrically measure each of the patches at each obtained position of the plurality of the patches.

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