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公开(公告)号：US11326953B2
公开(公告)日：2022-05-10
申请号：US17051842
申请日：2019-04-15
Applicant: Konica Minolta, Inc.
Inventor： Takashi Kawasaki
Abstract: An optical characteristic measurement device has a measurement opening, includes a first optical measurement unit and a second optical measurement unit that measure different optical characteristics with different geometries with respect to a measurement target facing the measurement opening, and further includes a processing unit that corrects a measurement value obtained in the second optical measurement unit based on a measurement value obtained in the first optical measurement unit. The first optical measurement unit includes an illumination optical system that illuminates the measurement target facing the measurement opening, a first light receiving optical system that collects light reflected by the measurement target, and a first light receiving unit that receives light collected by the first light receiving optical system and outputs the light as a measurement signal, and has a diffuse reflection surface that diffuses and reflects incident light to the illumination optical system or the first light receiving optical system. The second optical measurement unit includes a light projecting optical system that projects light from a direction inclined by a predetermined angle with respect to a normal line of a measurement surface of the measurement target facing the measurement opening, a second light receiving optical system that collects light reflected by the measurement target in a regular reflection direction, and a second light receiving unit that receives light collected by the second light receiving optical system and outputs the light as a measurement signal.
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2.发明授权公开(公告)号：US11307093B2
公开(公告)日：2022-04-19
申请号：US16986884
申请日：2020-08-06
Applicant: KONICA MINOLTA INC.
Inventor： Yoshiroh Nagai , Toshio Kawano , Takashi Kawasaki
Abstract: Creating a model calibrating spectral apparatus having an optical system that converts light to be measured into a spectrum, and a light-receiving sensor including a plurality of sensors that outputs signals, the sensors include sensors that output signals indicating respective energy amounts of a plurality of wavelength components. The model shows where a linear function of an indicator indicating a mechanical error in the spectral apparatus, expresses deviation of an indicator indicating spectral sensitivity of the sensor from the indicator indicating the reference spectral sensitivity of the sensor. The method comprises: a) acquiring reference spectral sensitivity; b) acquiring an indicator indicating the reference spectral sensitivity of the sensor acquired at a); and c) creating the model where the linear function of the mechanical error indicator expresses deviation of the spectral sensitivity indicator from the indicator indicating the reference spectral sensitivity of the sensor, acquired at b).
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公开(公告)号：US11054308B2
公开(公告)日：2021-07-06
申请号：US16616151
申请日：2018-04-24
Applicant: Konica Minolta, Inc.
Inventor： Takashi Kawasaki , Hidehiko Fujii , Katsutoshi Tsurutani
Abstract: Observation light can be applied to a position for measurement without providing large space in a spectrophotometer, and the position for measurement can be easily known. A slit is disposed at a position optically conjugate with the position for measurement in the spectrophotometer. Light from an object to be measured passes through the slit, travels along a measurement optical path, and is subject to wavelength dispersion by a wavelength dispersing element. An observation light source is retracted outside the measurement optical path at the time of measuring a spectral spectrum. At the time of observing the position for measurement, the observation light source is inserted into the measurement optical path, and emits observation light toward the slit. Alternatively, light from an object to be measured passes through the slit, and is diffracted by a grating. The observation light source is disposed on an optical path of zeroth light. The observation light source emits observation light toward the grating at the time of observing the position for measurement.
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Patent Agency Ranking
4.发明授权公开(公告)号：US10768048B2
公开(公告)日：2020-09-08
申请号：US15746216
申请日：2016-07-06
Applicant: KONICA MINOLTA INC.
Inventor： Yoshiroh Nagai , Toshio Kawano , Takashi Kawasaki
Abstract: Spectral apparatus includes sensors that output signals indicating the respective energy amounts of a plurality of wavelength components. For each of the sensors, its reference spectral sensitivity is acquired, and an indicator indicating the reference spectral sensitivity of the sensor, is acquired. The deviation of an indicator indicating the spectral sensitivity of the sensor from the indicator indicating the reference spectral sensitivity of the sensor, is expressed by a linear function of an indicator indicating a mechanical error in the spectral apparatus. The indicator indicating the mechanical error in the spectral apparatus, is acquired to adapt a spectral sensitivity set of sensors to a signal set output by the sensors. For each of the sensors, the deviation of the indicator indicating the spectral sensitivity of the sensor from the indicator indicating the reference spectral sensitivity of the sensor, is acquired, so that the spectral sensitivity of the sensor is acquired.
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公开(公告)号：US11914119B2
公开(公告)日：2024-02-27
申请号：US17613344
申请日：2020-02-03
Applicant: Konica Minolta, Inc.
Inventor： Yusuke Hirao , Takashi Kawasaki
Abstract: An ultraviolet optical system includes an objective lens group that captures ultraviolet light for each angle from an ultraviolet light source and forms an intermediate image, and an imaging lens group that re-images the intermediate image. Neither the objective lens group nor the imaging lens group has a cemented surface, and all lenses included in the objective lens group and in the imaging lens group are single lenses that transmit ultraviolet light having a wavelength of 300 nm or shorter. A light distribution measuring apparatus includes the ultraviolet optical system and a sensor, and outputs light distribution of the ultraviolet light source by using a signal obtained by the sensor. The ultraviolet optical system is positioned such that the intermediate image is re-imaged on a light receiving sensor surface, and the sensor has light receiving sensitivity to ultraviolet light having a wavelength of 300 nm or shorter.
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公开(公告)号：US11846544B2
公开(公告)日：2023-12-19
申请号：US17337710
申请日：2021-06-03
Applicant: Konica Minolta, Inc.
Inventor： Takashi Kawasaki , Hidehiko Fujii , Katsutoshi Tsurutani
Abstract: A spectrophotometer having a light-receiving optical system that images light to be measured from a position for measurement and generates imaged light to be measured; a slit formation including a slit that causes the imaged light to be measured to pass and that generates light to be measured, which travels along a measurement optical path; a grating that diffracts the light to be measured, which travels along the measurement optical path, and generates diffracted light; a sensor that receives the diffracted light and outputs a signal representing a spectral spectrum; and an observation light source that is disposed on an optical path of zeroth light among the diffracted light and that emits observation light toward the grating at a time of observing the position for measurement.
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公开(公告)号：US12298240B2
公开(公告)日：2025-05-13
申请号：US18013439
申请日：2021-05-13
Applicant: Konica Minolta, Inc.
Inventor： Takashi Kawasaki , Yoshitaka Teraoka , Takushi Uda , Syogo Mochida , Kenji Konno
IPC: G01N21/47
Abstract: Provided are an optical system for measuring optical characteristics and a device for measuring optical characteristics capable of acquiring a two-dimensional image close to visual observation in addition to measurement of optical characteristics of a measurement target. The optical system for measuring optical characteristics includes a first optical system (11) that captures an infinite conjugate image and a second optical system (12) that captures a conjugate image of a measurement target. The first optical system (11) and the second optical system (12) sharing a first lens group (G1) are arranged on two optical axes separated by an optical element (5) that deflects an optical axis, respectively, and are configured as one measuring optical system. Furthermore, an aperture stop of the second optical system (12) is arranged in the vicinity of an intermediate image. When a distance in an optical axis direction from an image side paraxial focal point of the first lens group (G1) to the aperture stop is represented by Δp, and a focal distance of the first lens group is represented by f1, Δp/f1 satisfies −1.0
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公开(公告)号：US10746650B2
公开(公告)日：2020-08-18
申请号：US16301966
申请日：2017-05-24
Applicant: KONICA MINOLTA, INC.
Inventor： Toshio Kawano , Takashi Kawasaki
Abstract: The reflection characteristic measuring device according to the present invention is a device that includes a diffuse reflecting surface and measures a plurality of mutually different types of reflection characteristics by using a plurality of optical systems having mutually different geometries, which corrects the reflection characteristics to be measured by an error generated when light emitted from an object of measurement is reflected from the diffuse reflecting surface and illuminates the object of measurement. The reflection characteristic measuring device according to the present invention is therefore capable of reducing errors resulting from recursive diffused illumination.
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