公开(公告)号：US20210239860A1

公开(公告)日：2021-08-05

申请号：US17046105

申请日：2019-04-04

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： HEIDRUN STEINHAUSER ,  ONNO JAN WIMMERS

IPC: G01T1/20 ,  G01T1/202 ,  G01N23/04

Abstract: Dual layer detector (XD) for X-ray imaging, comprising at least two light sensitive surfaces (LSS1,LSS2). The dual layer detector further comprises a first scintillator layer (SL, SL1) including at least one scintillator element (SE) capable of converting X-radiation into light, the element having two faces, an ingress face (S1) for admitting X-radiation into the element (SE) and an egress face (S2) distal from the ingress face (S1), wherein the two faces (S1,S2) are arranged shifted relative to each other, so that a longitudinal axis (LAX) of the scintillator element (SE) is inclined relative to a normal (n) of the layer. The scintillator element (SE) has a sidewall (w,w1) extending between the two faces (S1,S2), the scintillator layer (SL) further comprising a second such scintillator element (SE′) having a sidewall (w′,w1′), the second scintillator element (SE′) neighboring the first scintillator element (SE), wherein the sidewall (w,w1) of the first scintillator element (SE) and the sidewall (w′,w1′) of the second scintillator element (SE′) are neighbored and are inclined relative to each other. The dual layer detector (XD) further comprises a second such scintillator layer (SL2). One of the light sensitive surfaces (LSS1,LSS2) is arranged in between the two scintillator layers (SL1, SL2).

公开(公告)号：US20200315559A1

公开(公告)日：2020-10-08

申请号：US16305904

申请日：2017-06-01

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： HEIDRUN STEINHAUSER ,  CHRISTIAAN KOK

IPC: A61B6/00

Abstract: An X-ray imaging apparatus (IA) having a plurality of X-ray sources (sj) comprising an anti-scatter grid (ASG) for X-ray imaging comprising at least two sets (Mj) of linear x-radiation opaque strips (STj). Each of the strips in the at least two sets have a respective longitudinal axis (Li). There are at least two strips from different sets of the at least two sets that have non-parallel longitudinal axes.

公开(公告)号：US20190056517A1

公开(公告)日：2019-02-21

申请号：US16078811

申请日：2017-02-21

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： PETER LEX ALVING ,  HEIDRUN STEINHAUSER ,  HERMAN STEGEHUIS

IPC: G01T1/29 ,  A61B6/00 ,  G01N23/04 ,  G01N23/083 ,  G01T1/20 ,  G01T1/24 ,  H04N5/32 ,  H04N5/3745

Abstract: The present invention relates to an apparatus for imaging an object. It is described to receive (110) by at least a portion of first pixels of a first area (A, A1, A2, A3, A4, A5, A6, A7, A8) of an X-ray detector (20) first radiation emitted by at least one X-ray source (30). The X-ray detector is configured such that X-ray radiation received by a pixel leads to the generation of signal in that pixel. A plurality of first signals representative of corresponding signals on the plurality of first pixels are stored (120) in at least one first plurality of storage nodes associated with the first area. Second radiation emitted by the at least one X-ray source (30) is received (150) by at least a portion of second pixels of a second area (B, B1, B2, B3, B4, B5, B6, B7, B8; C) of the X-ray detector. A plurality of second signals representative of corresponding signals on the plurality of second pixels are stored (190) in at least one second plurality of storage nodes associated with the second area.

公开(公告)号：US20210072412A1

公开(公告)日：2021-03-11

申请号：US16959542

申请日：2018-12-31

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： PETER GEORGE VAN DE HAAR ,  WALTER RUETTEN ,  HEIDRUN STEINHAUSER ,  HERMAN STEGEHUIS ,  ONNO JAN WIMMERS

IPC: G01T1/29 ,  G01T1/20 ,  G01T1/202

Abstract: The present invention relates to a system for X-ray imaging It is explained to position (210) an X-ray detector (10) relative to an X-ray source such that at least a part of a region between the X-ray source and the X-ray detector is an examination region for accommodating an object. The X-ray source and X-ray detector are controlled (220) by a processing unit in order to: operate (230) in a first imaging operation mode; or operate (240) in a second imaging operation mode; or operate (250) in the first imaging mode and in the second imaging mode; or operate (260) in a third imaging operation mode. The detector comprises a first scintillator (20), a second scintillator (30), a first sensor array (40), and a second sensor array (50). The first sensor array is associated with the first scintillator. The first sensor array comprises an array of sensor elements configured to detect optical photons generated in the first scintillator. The second sensor array is associated with the second scintillator. The second sensor array comprises an array of sensor elements configured to detect optical photons generated in the second scintillator. The first scintillator is disposed over the second scintillator such that X-rays emitted from the X-ray source first encounter the first scintillator and then encounter the second scintillator. The first scintillator has a thickness equal to or greater than 0.6 mm. The second scintillator has a thickness equal to or greater than 1.1 mm. In the first imaging operation mode the first scintillator and the first sensor array are configured to provide data useable to generate a low energy X-ray image. In the second imaging operation mode the second scintillator and the second sensor array are configured to provide data useable to generate a high energy X-ray image. In the third imaging operation mode the first scintillator, the first sensor array, the second scintillator and the second sensor array are configured to provide data useable to generate a combined energy X-ray image.

公开(公告)号：US20190353802A1

公开(公告)日：2019-11-21

申请号：US16474110

申请日：2017-12-24

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： HEIDRUN STEINHAUSER ,  ONNO JAN WIMMERS ,  PETER LEX ALVING ,  MATTHIAS SIMON

IPC: G01T1/20

Abstract: An X-ray detector (100) and an X-ray imaging apparatus (500) with such X-ray detector (100) are provided. The X-ray detector (100) comprises at least three scintillator layers (102a-e) for converting X-ray radiation into scintillator light (110), and at least two sensor arrays (104a, 104b), each comprising a plurality of photosensitive pixels (108a, 108b) aranged on a bendable substrate (106a, 106b) for receiving scintillator light (110) emitted by at least one of the scintillator layers (102a-e). Therein, a number of the scintillator layers (102a-e) is larger than a number of the sensor arrays (104a, 104b). The at least three scintillator layers (102a-e) and the at least two sensor arrays (104a, 104b) are arranged on top of each other, wherein at least one of the sensor arrays (104b) is arranged between at least two of the scintillator layers (102a-e), such that said at least two scintillator layers (102a-e) are optically coupled to said at least one sensor array (104b) at two opposite sides (103a, 103b) of said at least one sensor array (104b). Further, said at least one sensor (104b) array is configured to receive light emitted by said at least two scintillator layers (102a-e).