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公开(公告)号：US20190353802A1
公开(公告)日：2019-11-21
申请号：US16474110
申请日：2017-12-24
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor： HEIDRUN STEINHAUSER , ONNO JAN WIMMERS , PETER LEX ALVING , MATTHIAS SIMON
IPC: G01T1/20
Abstract: An X-ray detector (100) and an X-ray imaging apparatus (500) with such X-ray detector (100) are provided. The X-ray detector (100) comprises at least three scintillator layers (102a-e) for converting X-ray radiation into scintillator light (110), and at least two sensor arrays (104a, 104b), each comprising a plurality of photosensitive pixels (108a, 108b) aranged on a bendable substrate (106a, 106b) for receiving scintillator light (110) emitted by at least one of the scintillator layers (102a-e). Therein, a number of the scintillator layers (102a-e) is larger than a number of the sensor arrays (104a, 104b). The at least three scintillator layers (102a-e) and the at least two sensor arrays (104a, 104b) are arranged on top of each other, wherein at least one of the sensor arrays (104b) is arranged between at least two of the scintillator layers (102a-e), such that said at least two scintillator layers (102a-e) are optically coupled to said at least one sensor array (104b) at two opposite sides (103a, 103b) of said at least one sensor array (104b). Further, said at least one sensor (104b) array is configured to receive light emitted by said at least two scintillator layers (102a-e).
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公开(公告)号：US20180277608A1
公开(公告)日：2018-09-27
申请号：US15760645
申请日：2016-09-16
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor： HERBERT LIFKA , JOANNA MARIA ELISABETH BAKEN , REINDER COEHOORN , PAULUS ALBERTUS VAN HAL , HERFRIED KARL WIECZOREK , HELGA HUMMEL , CORNELIS REINDER RONDA , MATTHIAS SIMON
CPC classification number: H01L27/308 , G01T1/2018 , G01T1/2023 , G01T1/24 , G01T1/241 , H01L51/0003 , H01L51/0077 , H01L51/4273 , H01L51/441
Abstract: The invention relates to a method for producing a radiation detector used to detect ionizing radiation including a first inorganic-organic halide Perovskite material (24) as a direct converter material and/or as a scintillator material in a detector layer and to a radiation detector comprising a detector layer (24) produced by means of the steps of the method. In order to provide an approach for producing a thick layer (e.g. above 10 μιη) of Perovskite material suitable for a radiation detector, it is proposed to grow the material selectively on a seeding layer (23), yielding in a thick polycrystalline layer. One suitable seeding layer (23) to grow lead Perovskite material is made of a bromide Perovskite material.
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公开(公告)号：US20220365230A1
公开(公告)日：2022-11-17
申请号：US17780500
申请日：2020-12-02
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor： ROGER STEADMAN BOOKER , WALTER RUETTEN , MATTHIAS SIMON
IPC: G01T1/20
Abstract: The present invention relates to an X-ray detector (10) comprising two or more scintillator layers, comprising: a first scintillator layer (20); a second scintillator layer (30); a first photodiode array (40); a second photodiode array (50); and at least one light emitting layer (60). The first scintillator layer is configured to absorb X-rays from an X-ray pulse and emit light. The first photodiode array is positioned adjacent to the first scintillators layer. The first photodiode array is configured to detect at least some of the light emitted by the first scintillator layer. The second scintillator layer is configured to absorb X-rays from the X-ray pulse and emit light. The second photodiode array is positioned adjacent to the second scintillator layer. The second photodiode array is configured to detect at least some of the light emitted by the second scintillator layer. The at least one light emitting layer is 10 configured to emit radiation such that at least some of the emitted radiation irradiates the first photodiode array and at least some of the emitted radiation irradiates the second photodiode array.
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公开(公告)号：US20200064496A1
公开(公告)日：2020-02-27
申请号：US16609768
申请日：2018-04-24
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor： CHRISTOPH HERRMANN , ROGER STEADMAN BOOKER , JAKOB WIJNAND MULDER , MATTHIAS SIMON , JACQUES JULES VAN OEKEL
Abstract: A detector includes a first detection layer (1141) and a second detector layer (1142). The first and second detection layers include a first and second scintillator (204, 7041) (216, 7042), a first and second active photosensing region (210, 7081) (220, 7082), a first portion (206, 7261) of a first substrate (208, 7061), and a second portion (218, 7262) of a second substrate (208, 7062). An imaging system (100) includes a radiation source (110), a radiation sensitive detector array (108) comprising a plurality of multi-layer detectors (112), and a reconstructor (118) configured to reconstruct an output of the detector array and produces an image. The detector array includes a first detection layer and a second detector layer with a first and second scintillator, a first and second active photosensing region, a first portion of a first substrate, and a second portion of a second substrate.
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Patent Agency Ranking
公开(公告)号：US20190304616A1
公开(公告)日：2019-10-03
申请号：US16307675
申请日：2017-06-08
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor： THOMAS KOEHLER , ROGER STEADMAN BOOKER , MATTHIAS SIMON , WALTER RUETTEN , HERFRIED KARL WIECZOREK
IPC: G21K1/02 , G01N23/041 , A61B6/00
Abstract: The invention relates to an analyzing grid for phase contrast imaging and/or dark-field imaging, a detector arrangement for phase contrast imaging and/or dark-field imaging comprising such analyzing grid, an X-ray imaging system comprising such detector arrangement, a method for manufacturing such analyzing grid, a computer program element for controlling such analyzing grid or detector arrangement for performing such method and a computer readable medium having stored such computer program element. The analyzing grid comprises a number of X-ray converting gratings. The X-ray converting gratings are configured to convert incident X-ray radiation into light or charge. The number of X-ray converting gratings comprises at least a first X-ray converting grating and a second X-ray converting grating. Further, the X-ray converting gratings each comprise an array of grating bars, wherein the grating bars within each X-ray converting grating are arranged mutually displaced from each other in a direction perpendicular to the incident X-ray radiation by a specific displacement pitch. Further, the grating bars of the first X-ray converting grating are arranged mutually displaced from the grating bars of the second X-ray converting grating in the direction perpendicular to the incident X-ray radiation by the displacement pitch divided by the number of X-ray converting gratings.
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公开(公告)号：US20180024253A1
公开(公告)日：2018-01-25
申请号：US15550418
申请日：2016-02-03
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor： JOHANNES WILHELMUS MARIA JACOBS , WALTER RUETTEN , MATTHIAS SIMON
CPC classification number: G01T1/1603 , A61B5/0024 , A61B5/0035 , A61B5/0075 , A61B5/0077 , A61B6/4417 , A61B6/563 , A61B8/4416 , A61B2562/0204 , A61B2562/0219 , A61B2562/0223 , A61B2562/12
Abstract: The present invention relates to medical imaging, and in particular a medical imaging detector. In order to improve and facilitate the collection of information, e.g. for medical diagnosis, a medical imaging detector is provided that comprises a first sensor arrangement (12) and a second sensor arrangement (14). The first sensor arrangement is configured to provide a first type of image data belonging to a first imaging modality. The second sensor arrangement is configured to provide a second type of image data belonging to a second imaging modality. The first imaging modality is an X-ray imaging modality, while the second imaging modality is a non-X-ray imaging modality. The first sensor arrangement comprises one or a plurality of first sensor segments (16) arranged within a first circumferential line (18) defining a first imaging area (20). The second sensor arrangement comprises one or a plurality of second sensor segments (22) arranged within a second circumferential line (24) defining a second imaging area (26). The first imaging area and the second imaging area at least partly overlap.
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公开(公告)号：US20250131558A1
公开(公告)日：2025-04-24
申请号：US18719231
申请日：2022-12-06
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor： MATTHIAS SIMON , BERND MENSER , WALTER RUETTEN , KLAUS JÜRGEN ENGEL , DIRK SCHAEFER , AXEL THRAN
Abstract: System (S-SYS) and related method for determining a material density map for a target material. The system (S-SYS) may receive spectral data representable in a two-dimensional data space. The spectral data may include measurements acquired by a spectral imaging apparatus of an object in a three-dimensional image domain of the spectral imaging apparatus. The system determines clusters in the data space, one indicative of the target material, the target material cluster, and clusters indicative auxiliary materials, the auxiliary material clusters. The system may determine a mutual geometrical constellation of the clusters. The system determines the material density map based on the geometrical constellation so determined.
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公开(公告)号：US20230117579A1
公开(公告)日：2023-04-20
申请号：US17642413
申请日：2021-07-05
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor： ROGER STEADMAN BOOKER , WALTER RUETTEN , MATTHIAS SIMON
IPC: A61B6/00
Abstract: System (SYS) for supporting X-ray imaging and related methods. The system (SYS) comprises a machine learning module (MLM), a logic (LG) configured to compute output correction information for adjusting an imaging geometry of an X-ray imaging apparatus to achieve a target imaging geometry. A modulator (MOD,L-MOD, H-MOD, S-MOD) is the system is configured to provide a user instruction for imaging geometry adjustment. The user instruction is modulated based on the output correction information. The machine learning module was previously trained on training data including a specific user's responses to previous instructions.
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公开(公告)号：US20210041582A1
公开(公告)日：2021-02-11
申请号：US16965942
申请日：2019-01-28
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor： MATTHIAS SIMON , HANNS-INGO MAACK
Abstract: Typically, a dual layer multi-spectral X-ray detector is capable of providing two points of spectral data about an imaged sample, because the front X-ray detector also acts to filter part of an incident X-ray spectrum before detection by a rear X-ray detector. A pre-filter can be placed in front of the front X-ray detector to enhance the spectral separation. However, the provision of a pre-filter implies that the intensity of the X-ray radiation must be increased to achieve the same signal to noise ratio. The present application concerns a multi-spectral X-ray detector with a front X-ray detector, a rear X-ray detector, and a structured spectral filter placed in-between them. The structured spectral filter has first and second regions configured to sample superpixels of the front X-ray detector, enabling three separate items of spectral information to be obtained per superpixel.
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