公开(公告)号：US20230384152A1

公开(公告)日：2023-11-30

申请号：US18232506

申请日：2023-08-10

Applicant: KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY

Inventor： Jonghwa SHIN ,  Taeyong CHANG ,  Joonkyo JUNG

IPC: G01J1/04 ,  G02B21/00 ,  G01J4/00 ,  G01J9/02

CPC classification number: G01J1/0407 ,  G02B21/0092 ,  G01J4/00 ,  G01J9/02

Abstract: An optical measurement device according to an aspect of the present disclosure includes a universal metasurface on which light is incident, a polarization sensor configured to measure a polarization state of light passing through the universal metasurface, and a controller configured to collect a quantitative differential interference contrast (QDIC) image for the x polarization of incident light that is collected by the polarization sensor, a QDIC image for y polarization, and a quantitative relative phase (QRP) image representing a relative phase difference between the x polarization and y polarization and configured to calculate intensity, a phase or polarization information of the incident light.