Light emitting device capable of adjusting intensity and curing apparatus employing the same

    公开(公告)号:US12101860B2

    公开(公告)日:2024-09-24

    申请号:US17985670

    申请日:2022-11-11

    Applicant: Jae-hyun Jung

    Inventor: Jae-hyun Jung

    CPC classification number: H05B47/105 G01J1/0407 G01J1/0411 G01J1/42

    Abstract: Disclosed are a light emitting device configured to control the light output of a light emitting unit and a curing apparatus employing the same. The disclosed light emitting device may comprise: a main body having a window; a light source installed in the main body, for generating light of a predetermined wavelength and irradiating the generated light to the outside of the main body through the window; a photodetector installed in the main body, for receiving part of the light irradiated from the light source and monitoring the intensity of the light source; a light path converting unit installed between the light source and the photodetector, for transferring the part of the light irradiated from the light source to the photodetector; and an intensity adjusting unit for adjusting the intensity of the light source based on the signal detected from the photodetector.

    Photon number resolving superconducting detector

    公开(公告)号:US11988554B2

    公开(公告)日:2024-05-21

    申请号:US18103413

    申请日:2023-01-30

    CPC classification number: G01J1/44 G01J1/0407 G01J2001/4446

    Abstract: A method of resolving a number of photons received by a photon detector includes optically coupling a waveguide to a superconducting wire having alternating narrow and wide portions; electrically coupling the superconducting wire to a current source; and electrically coupling an electrical contact in parallel with the superconducting wire. The electrical contact has a resistance less than a resistance of the superconducting wire while at least one narrow portion of the superconducting wire is in a non-superconducting state. The method includes providing to the superconducting wire, from the current source, a current configured to maintain the superconducting wire in a superconducting state in the absence of incident photons; receiving one or more photons via the waveguide; measuring an electrical property of the superconducting wire, proportional to a number of photons incident on the superconducting wire; and determining the number of received photons based on the electrical property.

    SINGLE GRAB OVERLAY MEASUREMENT OF TALL TARGETS

    公开(公告)号:US20240159585A1

    公开(公告)日:2024-05-16

    申请号:US17986592

    申请日:2022-11-14

    CPC classification number: G01J1/0407 G03F7/70316

    Abstract: An overlay metrology system may include an objective lens, illumination optics to illuminate an overlay target including a first grating with a first pitch on a first sample layer and a second grating with a second pitch on a second sample layer, where the first and second sample layers are separated by a layer separation distance greater than a depth of field of the objective lens. The system may further include collection optics with a radially-varying defocus distribution to compensate for the layer separation distance such that the first and second gratings are simultaneously in focus on the detector.

    Pupil division multiplexed imaging systems

    公开(公告)号:US11892349B1

    公开(公告)日:2024-02-06

    申请号:US17489079

    申请日:2021-09-29

    CPC classification number: G01J1/0407 G01J1/42

    Abstract: The present disclosure provides an imaging optical system. In one aspect, the imaging optical system includes, among other things, a segmented light redirecting element configured to redirect the at least two portions of said electromagnetic radiation into substantially different directions and a segmented light separating element configured to substantially separate electromagnetic radiation into at least two portions.

    Laser measurement apparatus having a removable and replaceable beam dump

    公开(公告)号:US11874163B2

    公开(公告)日:2024-01-16

    申请号:US17576059

    申请日:2022-01-14

    CPC classification number: G01J1/4257 G01J1/0271 G01J1/0403 G01J1/0407

    Abstract: The present application discloses an apparatus configured to measure characteristics of high power beams of laser energy used in material processing. In one embodiment, the apparatus includes a housing having a first compartment and a second compartment separated from each other to reduce the transfer of thermal energy between them. Optical modules having optical sensors configured to measure characteristics of the high power beam are mounted in the first compartment. An optical window operative to allow a significant portion of the beam to propagate therethrough is mounted in an intermediate housing member separating the first and second compartments. A removable and replaceable beam dump configured to absorb most of the high power beam is positioned in the second compartment. The removability/replaceability of the beam dump enables operation of the apparatus without active cooling of the beam dump assembly, simplifying the apparatus and protecting the optical sensors in the first compartment.

    Electronic device
    9.
    发明授权

    公开(公告)号:US11768105B2

    公开(公告)日:2023-09-26

    申请号:US17585895

    申请日:2022-01-27

    CPC classification number: G01J1/4204 G01J1/0407

    Abstract: The disclosure relates to an electronic device. The electronic device includes: a shell, a display panel, the display panel or the shell including a light-transmitting area, an ambient light sensor, an infrared transmitter and a light guiding piece. The light guiding piece includes a light incident end and a light emitting end, the light incident end being configured to face the light-transmitting area, and the light emitting end being configured to face the ambient light sensor and the infrared transmitter.

Patent Agency Ranking