公开(公告)号：US20220234301A1

公开(公告)日：2022-07-28

申请号：US17412265

申请日：2021-08-26

Applicant: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY

Inventor： Byung Chul LEE ,  Dong-Hyun KANG ,  Shinyong SHIM ,  Dong Jun KIM ,  Jin Soo PARK ,  Ki Joo PAHK ,  Hyejeong SEONG

IPC: B29C65/16 ,  B29C65/00 ,  B23K26/362 ,  B05B17/00 ,  B05B1/26

Abstract: A mesh type atomizer according to an embodiment includes a porous thin film having a multi-hole structure, a metal layer covering a remaining area except a nozzle area in which droplets are sprayed through the holes on a surface of the porous thin film, and an ultrasonic transducer to output ultrasonic waves to vibrate the porous thin film. According to an embodiment, it is possible to atomize a liquid into nanometer-level fine particles using the porous thin film including nanometer sized holes. It is possible to precisely adjust the sprayed droplet size by setting the shape, size and cycle of the nozzle in the manufacturing process, and it is possible to selectively increase the strength of the mesh by growing the metal material in the hole of the porous thin film through electroplating.

公开(公告)号：US20230086770A1

公开(公告)日：2023-03-23

申请号：US17273308

申请日：2021-02-01

Applicant: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY

Inventor： Byung Chul LEE ,  Dong-Hyun KANG ,  Shinyong SHIM

IPC: A61B8/00 ,  A61B8/08

Abstract: The present disclosure relates to a method for determining a relative position between arrays of a flexible array device. The flexible array device according to an embodiment includes a plurality of arrays arranged at a predetermined interval in a deformable substrate, and the method includes measuring the first capacitance between adjacent arrays, measuring the second capacitance between the adjacent arrays after deformation of the substrate, and determining a relative position between the adjacent arrays based on the first capacitance measurement value and the second capacitance measurement value. According to an embodiment, the relative position between the arrays may be determined by measuring the capacitance between the adjacent arrays of the plurality of arrays arranged in the deformable substrate and measuring a change in capacitance caused by the deformation (contraction, relaxation, bending) of the substrate.