公开(公告)号：US20170077461A1

公开(公告)日：2017-03-16

申请号：US15250283

申请日：2016-08-29

申请人： Kateeva, Inc.

发明人： Christopher Cocca

IPC分类号： H01L51/56 ,  H01L51/00 ,  G06T7/00

CPC分类号： H01L51/56 ,  G06T7/0004 ,  G06T7/0008 ,  G06T7/001 ,  G06T2207/10024 ,  G06T2207/20072 ,  G06T2207/30121 ,  H01L51/0004 ,  H01L51/0031

摘要： This disclosure provides techniques for assessing quality of a deposited film layer of an organic light emitting diode (“OLED”) device. An image is captured and filtered to identify a deposited layer that is to be analyzed. Image data representing this layer can be optionally converted to brightness (grayscale) data. A gradient function is then applied to emphasize discontinuities in the deposited layer. Discontinuities are then compared to one or more thresholds and used to ascertain quality of the deposited layer, with optional remedial measures then being applied. The disclosed techniques can be applied in situ, to quickly identify potential defects such as delamination before ensuing manufacturing steps are applied. In optional embodiments, remedial measures can be taken dependent on whether defects are determined to exist.

摘要翻译： 本公开提供了用于评估有机发光二极管（“OLED”）器件的沉积膜层的质量的技术。 拍摄和过滤图像以识别待分析的沉积层。 可以将代表该层的图像数据转换为亮度（灰度）数据。 然后应用梯度函数来强调沉积层中的不连续性。 然后将不连续性与一个或多个阈值进行比较，并用于确定沉积层的质量，然后应用可选的补救措施。 所公开的技术可以原位应用，以便在应用制造步骤之前快速识别潜在的缺陷，例如分层。 在可选实施例中，可以取决于是否确定缺陷是否存在补救措施。

公开(公告)号：US10886504B2

公开(公告)日：2021-01-05

申请号：US16425915

申请日：2019-05-29

申请人： Kateeva, Inc.

发明人： Christopher Cocca

IPC分类号： H01L51/56 ,  G06T7/00 ,  H01L51/00

摘要： This disclosure provides techniques for assessing quality of a deposited film layer of an organic light emitting diode (“OLED”) device. An image is captured and filtered to identify a deposited layer that is to be analyzed. Image data representing this layer can be optionally converted to brightness (grayscale) data. A gradient function is then applied to emphasize discontinuities in the deposited layer. Discontinuities are then compared to one or more thresholds and used to ascertain quality of the deposited layer, with optional remedial measures then being applied. The disclosed techniques can be applied in situ, to quickly identify potential defects such as delamination before ensuing manufacturing steps are applied. In optional embodiments, remedial measures can be taken dependent on whether defects are determined to exist.

公开(公告)号：US10347872B2

公开(公告)日：2019-07-09

申请号：US15709320

申请日：2017-09-19

申请人： Kateeva, Inc.

发明人： Christopher Cocca

IPC分类号： G06T7/00 ,  H01L51/00 ,  H01L51/56

摘要： This disclosure provides techniques for assessing quality of a deposited film layer of an organic light emitting diode (“OLED”) device. An image is captured and filtered to identify a deposited layer that is to be analyzed. Image data representing this layer can be optionally converted to brightness (grayscale) data. A gradient function is then applied to emphasize discontinuities in the deposited layer. Discontinuities are then compared to one or more thresholds and used to ascertain quality of the deposited layer, with optional remedial measures then being applied. The disclosed techniques can be applied in situ, to quickly identify potential defects such as delamination before ensuing manufacturing steps are applied. In optional embodiments, remedial measures can be taken dependent on whether defects are determined to exist.

公开(公告)号：US09812672B2

公开(公告)日：2017-11-07

申请号：US15250283

申请日：2016-08-29

申请人： Kateeva, Inc.

发明人： Christopher Cocca

IPC分类号： G06T7/00 ,  H01L51/56 ,  H01L51/00

CPC分类号： H01L51/56 ,  G06T7/0004 ,  G06T7/0008 ,  G06T7/001 ,  G06T2207/10024 ,  G06T2207/20072 ,  G06T2207/30121 ,  H01L51/0004 ,  H01L51/0031

摘要： This disclosure provides techniques for assessing quality of a deposited film layer of an organic light emitting diode (“OLED”) device. An image is captured and filtered to identify a deposited layer that is to be analyzed. Image data representing this layer can be optionally converted to brightness (grayscale) data. A gradient function is then applied to emphasize discontinuities in the deposited layer. Discontinuities are then compared to one or more thresholds and used to ascertain quality of the deposited layer, with optional remedial measures then being applied. The disclosed techniques can be applied in situ, to quickly identify potential defects such as delamination before ensuing manufacturing steps are applied. In optional embodiments, remedial measures can be taken dependent on whether defects are determined to exist.

公开(公告)号：US09443299B2

公开(公告)日：2016-09-13

申请号：US14180015

申请日：2014-02-13

申请人： Kateeva, Inc.

发明人： Christopher Cocca

IPC分类号： G06T7/00 ,  H01L51/00

CPC分类号： H01L51/56 ,  G06T7/0004 ,  G06T7/0008 ,  G06T7/001 ,  G06T2207/10024 ,  G06T2207/20072 ,  G06T2207/30121 ,  H01L51/0004 ,  H01L51/0031

摘要： This disclosure provides techniques for assessing quality of a deposited film layer of an organic light emitting diode (“OLED”) device. An image is captured and filtered to identify a deposited layer that is to be analyzed. Image data representing this layer can be optionally converted to brightness (grayscale) data. A gradient function is then applied to emphasize discontinuities in the deposited layer. Discontinuities are then compared to one or more thresholds and used to ascertain quality of the deposited layer, with optional remedial measures then being applied. The disclosed techniques can be applied in situ, to quickly identify potential defects such as delamination before ensuing manufacturing steps are applied. In optional embodiments, remedial measures can be taken dependent on whether defects are determined to exist.

摘要翻译： 本公开提供了用于评估有机发光二极管（“OLED”）器件的沉积膜层的质量的技术。 拍摄和过滤图像以识别待分析的沉积层。 可以将代表该层的图像数据转换为亮度（灰度）数据。 然后应用梯度函数来强调沉积层中的不连续性。 然后将不连续性与一个或多个阈值进行比较，并用于确定沉积层的质量，然后应用可选的补救措施。 所公开的技术可以原位应用，以便在应用制造步骤之前快速识别潜在的缺陷，例如分层。 在可选实施例中，可以取决于是否确定缺陷是否存在补救措施。

公开(公告)号：US20140233843A1

公开(公告)日：2014-08-21

申请号：US14180015

申请日：2014-02-13

申请人： Kateeva, Inc.

发明人： Christopher Cocca

IPC分类号： G06T7/00

CPC分类号： H01L51/56 ,  G06T7/0004 ,  G06T7/0008 ,  G06T7/001 ,  G06T2207/10024 ,  G06T2207/20072 ,  G06T2207/30121 ,  H01L51/0004 ,  H01L51/0031

摘要： This disclosure provides techniques for assessing quality of a deposited film layer of an organic light emitting diode (“OLED”) device. An image is captured and filtered to identify a deposited layer that is to be analyzed. Image data representing this layer can be optionally converted to brightness (grayscale) data. A gradient function is then applied to emphasize discontinuities in the deposited layer. Discontinuities are then compared to one or more thresholds and used to ascertain quality of the deposited layer, with optional remedial measures then being applied. The disclosed techniques can be applied in situ, to quickly identify potential defects such as delamination before ensuing manufacturing steps are applied. In optional embodiments, remedial measures can be taken dependent on whether defects are determined to exist.

摘要翻译： 本公开提供了用于评估有机发光二极管（“OLED”）器件的沉积膜层的质量的技术。 拍摄和过滤图像以识别待分析的沉积层。 可以将代表该层的图像数据转换为亮度（灰度）数据。 然后应用梯度函数来强调沉积层中的不连续性。 然后将不连续性与一个或多个阈值进行比较，并用于确定沉积层的质量，然后应用可选的补救措施。 所公开的技术可以原位应用，以便在应用制造步骤之前快速识别潜在的缺陷，例如分层。 在可选实施例中，可以取决于是否确定缺陷是否存在补救措施。

公开(公告)号：US20190280251A1

公开(公告)日：2019-09-12

申请号：US16425915

申请日：2019-05-29

申请人： Kateeva, Inc.

发明人： Christopher Cocca

IPC分类号： H01L51/56 ,  H01L51/00 ,  G06T7/00

摘要： This disclosure provides techniques for assessing quality of a deposited film layer of an organic light emitting diode (“OLED”) device. An image is captured and filtered to identify a deposited layer that is to be analyzed. Image data representing this layer can be optionally converted to brightness (grayscale) data. A gradient function is then applied to emphasize discontinuities in the deposited layer. Discontinuities are then compared to one or more thresholds and used to ascertain quality of the deposited layer, with optional remedial measures then being applied. The disclosed techniques can be applied in situ, to quickly identify potential defects such as delamination before ensuing manufacturing steps are applied. In optional embodiments, remedial measures can be taken dependent on whether defects are determined to exist.

公开(公告)号：US20180366687A1

公开(公告)日：2018-12-20

申请号：US15709320

申请日：2017-09-19

申请人： Kateeva, Inc.

发明人： Christopher Cocca

IPC分类号： H01L51/56 ,  H01L51/00 ,  G06T7/00

CPC分类号： H01L51/56 ,  G06T7/0004 ,  G06T7/0008 ,  G06T7/001 ,  G06T2207/10024 ,  G06T2207/20072 ,  G06T2207/30121 ,  H01L51/0004 ,  H01L51/0031

摘要： This disclosure provides techniques for assessing quality of a deposited film layer of an organic light emitting diode (“OLED”) device. An image is captured and filtered to identify a deposited layer that is to be analyzed. Image data representing this layer can be optionally converted to brightness (grayscale) data. A gradient function is then applied to emphasize discontinuities in the deposited layer. Discontinuities are then compared to one or more thresholds and used to ascertain quality of the deposited layer, with optional remedial measures then being applied. The disclosed techniques can be applied in situ, to quickly identify potential defects such as delamination before ensuing manufacturing steps are applied. In optional embodiments, remedial measures can be taken dependent on whether defects are determined to exist.