公开(公告)号：US20060210141A1

公开(公告)日：2006-09-21

申请号：US11376285

申请日：2006-03-15

申请人： Kazuto Kojitani ,  Atsushi Shimizu ,  Hiroshi Tasaki

发明人： Kazuto Kojitani ,  Atsushi Shimizu ,  Hiroshi Tasaki

IPC分类号： G06K9/46 ,  G06K9/00

CPC分类号： G06K9/6269

摘要： An inspection method and an inspection apparatus are disclosed, wherein the appropriate inspection can be conducted in accordance with the situation change of a nonconforming product from an initial stage, an adjust stage and a stable stage. The conformity/nonconformity is discriminated according to a MTS model and a one class SVM model based on the normal data obtained from a conforming product. The conformity/nonconformity is discriminated by both the MTS and the one class SVM in an adjust stage where a sufficient amount of sample data cannot be acquired or the shape of the conforming product distribution in the feature space and the shape of the normal area are unstable, and only by the MTS in a stable stage where a sufficient amount of sample data can be acquired and the shape of the conforming product distribution and the shape of the normal area are stable.

摘要翻译： 公开了一种检查方法和检查装置，其中可以根据不合格产品从初始阶段，调整阶段和稳定阶段的状况变化进行适当的检查。 根据从符合产品获得的正常数据，根据MTS模型和一类SVM模型来区分一致性/不符合性。 在不能获得足够数量的样本数据或特征空间中的一致性产品分布的形状和正常区域的形状不稳定的调整阶段中，MTS和一个SVM两者都可以区分一致/不符合 ，并且仅在能够获取足够量的样本数据并且符合产品分布的形状和正常区域的形状稳定的稳定阶段中的MTS。

公开(公告)号：US20070265743A1

公开(公告)日：2007-11-15

申请号：US11801417

申请日：2007-05-09

申请人： Kazuto Kojitani ,  Hiroshi Tasaki ,  Hiroshi Nakajima ,  Seiko Ito

发明人： Kazuto Kojitani ,  Hiroshi Tasaki ,  Hiroshi Nakajima ,  Seiko Ito

IPC分类号： G01M17/00

CPC分类号： G06K9/6268 ,  G06K9/6284 ,  G06T7/0004 ,  G06T2207/30108

摘要： An inspection apparatus includes a discrimination function determination unit which determines whether or not a discrimination function forms an area including a discrimination sample. The discrimination function is used in non-parametric one-class discrimination. The discrimination sample is discriminated into a class as a single area in an input space where learning samples are plotted.

摘要翻译： 一种检查装置，包括判断功能确定单元，其确定鉴别功能是否形成包括鉴别样本的区域。 鉴别功能用于非参数一类鉴别。 鉴别样本被识别为在绘制学习样本的输入空间中的单个区域。

公开(公告)号：US07860620B2

公开(公告)日：2010-12-28

申请号：US11801417

申请日：2007-05-09

申请人： Kazuto Kojitani ,  Hiroshi Tasaki ,  Hiroshi Nakajima ,  Seiko Ito

发明人： Kazuto Kojitani ,  Hiroshi Tasaki ,  Hiroshi Nakajima ,  Seiko Ito

IPC分类号： G01M17/00

CPC分类号： G06K9/6268 ,  G06K9/6284 ,  G06T7/0004 ,  G06T2207/30108

摘要： An inspection apparatus includes a discrimination function determination unit which determines whether or not a discrimination function forms an area including a discrimination sample. The discrimination function is used in non-parametric one-class discrimination. The discrimination sample is discriminated into a class as a single area in an input space where learning samples are plotted.

摘要翻译： 一种检查装置，包括判断功能确定单元，其确定鉴别功能是否形成包括鉴别样本的区域。 鉴别功能用于非参数一类鉴别。 鉴别样本被识别为在绘制学习样本的输入空间中的单个区域。

公开(公告)号：US08224605B2

公开(公告)日：2012-07-17

申请号：US11433702

申请日：2006-05-12

申请人： Hiroshi Tasaki ,  Kazuto Kojitani

发明人： Hiroshi Tasaki ,  Kazuto Kojitani

IPC分类号： G01N37/00 ,  G06F19/00

CPC分类号： G05B19/41875 ,  G05B2219/32186 ,  G05B2219/32197 ,  H05K13/083 ,  Y02P90/22

摘要： An information processing device stores an extracted feature of each inspection item of the process inspection, and a determination result of a final inspection in a memory device, calculates a separation degree between a distribution of features of products which were determined as good products at the final inspection and a distribution of features of products which were determined as defective products at the final inspection for every inspection item or every combination of inspection items based on data of the products stored in the memory device, selects an inspection item whose inspection standard is to be reset from the inspection items or the combinations of the inspection items based on a value of the separation degree. Thus providing a method of appropriately setting an inspection standard for detecting a defect sign during process inspection. Further a process inspection device and inspection standard setting device which implements the same.

摘要翻译： 信息处理装置将处理检查中的每个检查项目的提取特征以及最终检查的确定结果存储在存储装置中，计算在最终确定为良品的产品的特征分布之间的分离度 根据存储在存储装置中的产品的数据，在每次检查项目或每个检验项目组合的最终检查中确定为缺陷产品的特征的检查和分配，选择检验标准为 基于分离度的值从检查项目或检查项目的组合重置。 因此，提供了一种在处理检查中适当地设定用于检测缺陷符号的检查标准的方法。 另外，实施该过程检查装置和检查标准设定装置。

公开(公告)号：US20080219544A1

公开(公告)日：2008-09-11

申请号：US12044494

申请日：2008-03-07

申请人： Hiroshi Tasaki ,  Yoshifumi Hasegawa ,  Kazuto Kojitani ,  Satoshi Ohtani ,  Takuma Kawai

发明人： Hiroshi Tasaki ,  Yoshifumi Hasegawa ,  Kazuto Kojitani ,  Satoshi Ohtani ,  Takuma Kawai

IPC分类号： G06K9/20

CPC分类号： G06Q10/06 ,  G05B19/41875 ,  H05K13/083 ,  Y02P90/22

摘要： A factor estimating support device supports estimation of factor from a result generated in a production system. In the factor estimating support device, material/environment history data and test history data acquired from the production system, and the causality structure data indicating causality between the plurality of variables are stored in the storage unit, where when determined that the final quality characteristic is abnormal in the final quality abnormal detecting part, determination is made on whether each variable other than the final quality characteristic is abnormal in the variable abnormality detecting part, and the determination result is reflected on a visible image in which the causality structure data is visualized in the visible image creating part.

摘要翻译： 估计支持设备的因素支持从生产系统中生成的结果中估计因子。 在因子估计支持装置中，从生产系统获得的材料/环境历史数据和测试历史数据以及表示多个变量之间的因果关系的因果结构数据被存储在存储单元中，其中当确定最终质量特性为 在最终质量异常检测部中异常，判定可变异常检测部中的最终质量特性以外的各变量是否异常，并且将判定结果反映在可视图像中，其中因果关系结构数据被可视化 可见图像创建部分。

公开(公告)号：US20060271226A1

公开(公告)日：2006-11-30

申请号：US11433702

申请日：2006-05-12

申请人： Hiroshi Tasaki ,  Kazuto Kojitani

发明人： Hiroshi Tasaki ,  Kazuto Kojitani

IPC分类号： G06F19/00

CPC分类号： G05B19/41875 ,  G05B2219/32186 ,  G05B2219/32197 ,  H05K13/083 ,  Y02P90/22

摘要： An information processing device stores an extracted feature of each inspection item of the process inspection, and a determination result of a final inspection in a memory device, calculates a separation degree between a distribution of features of products which were determined as good products at the final inspection and a distribution of features of products which were determined as defective products at the final inspection for every inspection item or every combination of inspection items based on data of the products stored in the memory device, selects an inspection item whose inspection standard is to be reset from the inspection items or the combinations of the inspection items based on a value of the separation degree. Thus providing a method of appropriately setting an inspection standard for detecting a defect sign during process inspection. Further a process inspection device and inspection standard setting device which implements the same.

摘要翻译： 信息处理装置将处理检查中的每个检查项目的提取特征以及最终检查的确定结果存储在存储装置中，计算在最终确定为良品的产品的特征分布之间的分离度 根据存储在存储装置中的产品的数据，在每次检查项目或每个检验项目组合的最终检查中确定为缺陷产品的特征的检查和分配，选择检验标准为 基于分离度的值从检查项目或检查项目的组合重置。 因此，提供了一种在处理检查中适当地设定用于检测缺陷符号的检查标准的方法。 另外，实施该过程检查装置和检查标准设定装置。

公开(公告)号：US08421803B2

公开(公告)日：2013-04-16

申请号：US12692012

申请日：2010-01-22

申请人： Kazuto Kojitani ,  Keiji Otaka ,  Hiroyuki Mori

发明人： Kazuto Kojitani ,  Keiji Otaka ,  Hiroyuki Mori

IPC分类号： G06T11/20

CPC分类号： H05K13/083 ,  H05K13/0815

摘要： This invention facilitates monitoring operation for checking whether or not quality of a substrate deteriorates as well as operation for identifying a cause of deterioration in quality. Identification information of constituent elements related to measurement target sections (pads) on a component-mounted substrate is arranged into hierarchal structure data. A first axis is arranged with the measurement target sections associated with this arrangement. A second axis is arranged with information (identification information of lots and squeegees) representing production conditions of the substrates according to an order of the substrates being processed. A two-dimensional area defined by the first axis and the second axis is set. A color map is generated, in which measured data of the measurement target sections on the substrates are arranged in colors at corresponding positions within the two-dimensional area. Specifically, in the respective measured data, values in a preferable range is displayed in white, values larger than the preferable range is displayed in red-like color, and values smaller than the preferable range is displayed in blue-like color.

摘要翻译： 本发明便于检查基板的质量劣化以及用于确定质量劣化的原因的操作的监视操作。 与组件安装基板上的测量目标部分（焊盘）相关的构成元件的识别信息被布置成层次结构数据。 第一轴被布置成与测量目标部分相关联。 第二轴被布置有根据正在处理的基板的顺序的表示基板的生产条件的信息（批次和刮板的识别信息）。 设置由第一轴和第二轴限定的二维区域。 产生颜色图，其中基板上的测量目标部分的测量数据在二维区域内的对应位置处以颜色排列。 具体地，在各测量数据中，优​​选范围中的值以白色显示，大于优选范围的值以红色显示，并且小于优选范围的值以蓝色显示。

公开(公告)号：US20060161391A1

公开(公告)日：2006-07-20

申请号：US11248025

申请日：2005-10-11

申请人： Hironori Inaba ,  Kazuto Kojitani ,  Yuji Hirayama

发明人： Hironori Inaba ,  Kazuto Kojitani ,  Yuji Hirayama

IPC分类号： G21C17/00 ,  G06F11/30

CPC分类号： G06F11/2257 ,  G07C5/0808

摘要： A device that is capable of easily determining discrimination knowledge suitable for recognizing a normal/abnormal state of an object to be inspected in an inspecting and diagnosing apparatus is provided with: a parameter-retrieving unit that retrieves various parameter sets used for calculating feature amounts, a feature-amount operation unit that calculates a plurality of feature amounts based upon the respective parameter sets that have been retrieved by the retrieving unit in association with learning data that includes given normal data and abnormal data, a primary evaluation unit that outputs the effectiveness of each of the parameter sets as evaluated values based upon the results of the operation of the feature amounts calculated by the feature-amount operation unit, an optimal solution candidate output unit that, based upon the results of the primary evaluation found by the primary evaluation unit, outputs the results of a plurality of parameter sets having a high primary evaluated value as a plurality of optimal solution candidates, a discrimination knowledge forming unit that forms a plurality of discrimination knowledge based upon the optimal solution candidates output from the optimal solution candidate output unit, a secondary evaluation unit that evaluates on each of the discrimination knowledge that have been formed in the discrimination knowledge forming unit and an optimal solution output unit that, based upon the results of the secondary evaluation, outputs the discrimination knowledge having a high evaluated value as an optimal solution.

摘要翻译： 能够容易地确定在检查和诊断装置中识别待检查对象的正常/异常状态的识别知识的装置具有：检索用于计算特征量的各种参数集的参数检索单元， 功能量操作单元，其基于由检索单元与包括给定的正常数据和异常数据的学习数据相关联地检索到的各个参数集来计算多个特征量;初级评估单元，其输出有效性 基于由所述特征量运算部计算出的特征量的运算结果，将所述参数组作为评价值的最优解候选输出部，基于由所述主评价部求出的所述主评价结果， 输出具有高初级eval的多个参数组的结果 作为多个最优解候选的分数值，基于从最优解候选输出单元输出的最优解候选来形成多个辨别知识的辨别知识形成单元，评估每个鉴别知识的二次评估单元， 已经在辨别知识形成单元中形成了最优解输出单元，其基于二次评估的结果，输出具有高估计值的鉴别知识作为最优解。

公开(公告)号：US08260727B2

公开(公告)日：2012-09-04

申请号：US11695926

申请日：2007-04-03

申请人： Junpei Koga ,  Yasuaki Nakajima ,  Kazuto Kojitani

发明人： Junpei Koga ,  Yasuaki Nakajima ,  Kazuto Kojitani

IPC分类号： G06F15/18

CPC分类号： H05K13/08 ,  G05B23/024

摘要： A factor estimation apparatus which can appropriately estimate a factor without increase in the cost, the factor estimation apparatus includes a characteristic quantity determination unit which determines the characteristic quantity; a user input unit which accepts an input from a user as data for the characteristic quantity determined by the characteristic quantity determination unit; an apparatus-data input unit to which data is inputted from a data obtaining device as the data for the characteristic quantity determined by the characteristic quantity determination unit; an input source defining unit which previously determines that the data for the characteristic quantity is inputted from which one of the user input unit and the apparatus-data input unit; and an estimation unit which estimates the factor using the data inputted from the input unit determined by the input source defining unit.

摘要翻译： 因素估计装置，其能够适当地估计成本而不增加成本，因子估计装置包括确定特征量的特征量确定单元; 用户输入单元，其接收来自用户的输入，作为由特征量确定单元确定的特征量的数据; 设备数据输入单元，从数据获取装置输入数据作为由特征量确定单元确定的特征量的数据; 输入源定义单元，其预先确定用于特征量的数据从用户输入单元和装置数据输入单元中的哪个输入; 以及估计单元，其使用从由输入源定义单元确定的输入单元输入的数据来估计因子。

公开(公告)号：US20100188417A1

公开(公告)日：2010-07-29

申请号：US12692012

申请日：2010-01-22

申请人： Kazuto Kojitani ,  Keiji Otaka ,  Hiroyuki Mori

发明人： Kazuto Kojitani ,  Keiji Otaka ,  Hiroyuki Mori

IPC分类号： G09G5/02

CPC分类号： H05K13/083 ,  H05K13/0815

摘要： This invention facilitates monitoring operation for checking whether or not quality of a substrate deteriorates as well as operation for identifying a cause of deterioration in quality. Identification information of constituent elements related to measurement target sections (pads) on a component-mounted substrate is arranged into hierarchal structure data. A first axis is arranged with the measurement target sections associated with this arrangement. A second axis is arranged with information (identification information of lots and squeegees) representing production conditions of the substrates according to an order of the substrates being processed. A two-dimensional area defined by the first axis and the second axis is set. A color map is generated, in which measured data of the measurement target sections on the substrates are arranged in colors at corresponding positions within the two-dimensional area. Specifically, in the respective measured data, values in a preferable range is displayed in white, values larger than the preferable range is displayed in red-like color, and values smaller than the preferable range is displayed in blue-like color.

摘要翻译： 本发明便于检查基板的质量劣化以及用于确定质量劣化的原因的操作的监视操作。 与组件安装基板上的测量目标部分（焊盘）相关的构成元件的识别信息被布置成层次结构数据。 第一轴被布置成与测量目标部分相关联。 第二轴被布置有根据正在处理的基板的顺序的表示基板的生产条件的信息（批次和刮板的识别信息）。 设置由第一轴和第二轴限定的二维区域。 产生颜色图，其中基板上的测量目标部分的测量数据在二维区域内的对应位置处以颜色排列。 具体地，在各测量数据中，优​​选范围中的值以白色显示，大于优选范围的值以红色显示，并且小于优选范围的值以蓝色显示。