公开(公告)号：US20120075220A1

公开(公告)日：2012-03-29

申请号：US13241061

申请日：2011-09-22

申请人： Yoshikazu MATSUI ,  Naoki SUMI ,  Kazuyuki HASHIMOTO

发明人： Yoshikazu MATSUI ,  Naoki SUMI ,  Kazuyuki HASHIMOTO

IPC分类号： G06F3/041

CPC分类号： G06F3/044 ,  G06F3/0416

摘要： An input detection device including: a reading part reading touch inputs from an input interface of a touch sensor by scanning every above two electrode lines which are adjacent on the scanning sequence from an end of the input interface to the opposite end, and acquiring a difference between detection data obtained from a half of the above two electrode lines which are successive and from the other half of the above two electrode lines which are successive; and a calculation part integrating the differences for the entire input interface to obtain touch information, wherein if an integration result obtained in the case where the above two lines stretches over the scanning finish end and the scanning start end is not satisfied with a predetermined value, the calculation part resets the detection data obtained from the electrode line located at the scanning finish end to be the predetermined value.

摘要翻译： 一种输入检测装置，包括：读取部，从所述输入接口的一端到相对端扫描从扫描序列相邻的上述两条电极线，从触摸传感器的输入接口读取触摸输入， 在从连续的上述两个电极线的一半和从上述连续的两个电极线的另一半获得的检测数据之间; 以及积分整个输入界面的差异以获得触摸信息的计算部分，其中如果在上述两条线在扫描结束端和扫描开始端之间延伸的情况下获得的积分结果不满足预定值， 计算部分将从位于扫描完成端的电极线获得的检测数据重置为预定值。

公开(公告)号：US20120044204A1

公开(公告)日：2012-02-23

申请号：US13212167

申请日：2011-08-17

申请人： Kazuyuki HASHIMOTO ,  Naoki Sumi ,  Yoshikazu Matsui

发明人： Kazuyuki HASHIMOTO ,  Naoki Sumi ,  Yoshikazu Matsui

IPC分类号： G06F3/045

CPC分类号： G06F3/044 ,  G06F3/0416 ,  G06F2203/04104

摘要： The invention provides an input detection method, wherein when multiple touch points are input a touch sensor 30 detects touch points 41, 42 individually. The detection method includes: scanning a first electrode line, and if a plurality of touch areas 43, 45 sandwiching a non-touch area 44 are detected, labeling the plurality of touch areas 43, 45 sequentially; determining the location of the non-touch area as a separation area in the case where the non-touch area between the labels is within a predetermined spacing; when a second electrode line next to the first electrode line where a separation area is detected is scanned, handling the area on the second electrode line corresponding to the separation area on the first electrode line as a separation area; and practicing the above steps for every electrode line and detecting the labels.

摘要翻译： 本发明提供一种输入检测方法，其中当输入多个触摸点时，触摸传感器30分别检测触摸点41,42。 检测方法包括：扫描第一电极线，并且如果检测到夹持非接触区域44的多个触摸区域43,44，则顺序地标记多个触摸区域43,45; 在标签之间的非接触区域处于预定间隔内的情况下，确定非接触区域的位置为分离区域; 当扫描与检测分离区域的第一电极线相邻的第二电极线时，处理与第一电极线上的分离区域对应的第二电极线上的区域作为分离区域; 并对每条电极线执行上述步骤并检测标签。

公开(公告)号：US20130113711A1

公开(公告)日：2013-05-09

申请号：US13288518

申请日：2011-11-03

申请人： Kai-Chi NIEN ,  Kazuyuki HASHIMOTO ,  Chia-Lin LIU

发明人： Kai-Chi NIEN ,  Kazuyuki HASHIMOTO ,  Chia-Lin LIU

IPC分类号： G06F3/041

CPC分类号： G06F3/044 ,  H05K9/0067

摘要： A touch panel and an electronic device are provided. The touch panel includes a sensing electrode array, a touch controller, and an electrostatic discharge (ESD) protection circuit. The sensing electrode array is arranged in two dimensional array of n rows and m columns for generating a sensing signal in response to a touch on the touch panel. The touch controller is operationally connected to the sensing electrode array for receiving the sensing signal and identifying the touch on the touch screen. The ESD protection circuit includes ESD protection units each being electrically connected to a corresponding row or column of the sensing electrode array and the touch controller for electrostatic discharge protection.

摘要翻译： 提供触摸面板和电子设备。 触摸面板包括感测电极阵列，触摸控制器和静电放电（ESD）保护电路。 感测电极阵列被布置成n行和m列的二维阵列，以响应于触摸面板上的触摸而产生感测信号。 触摸控制器可操作地连接到感测电极阵列，用于接收感测信号并识别触摸屏上的触摸。 ESD保护电路包括ESD保护单元，每个ESD保护单元电连接到感测电极阵列的相应行或列，以及用于静电放电保护的触摸控制器。

公开(公告)号：US20120076476A1

公开(公告)日：2012-03-29

申请号：US13109169

申请日：2011-05-17

申请人： Tatsufumi KUSUDA ,  Kazuyuki HASHIMOTO

发明人： Tatsufumi KUSUDA ,  Kazuyuki HASHIMOTO

IPC分类号： F27D11/12

CPC分类号： F27B17/0025 ,  F27D11/12 ,  H01L21/67115 ,  H01L21/6719 ,  H01L21/67248 ,  H01L21/68792

摘要： A photodiode excellent in responsivity receives flashes of light emitted from flash lamps in the process of heating a semiconductor wafer by irradiation with flashes of light, and the waveform of the intensity of the flashes of light versus time is acquired using voltage data obtained from an output from the photodiode. Then, a temperature calculating part performs a heat conduction simulation using the acquired data to calculate the temperature of the semiconductor wafer irradiated with the flashes of light from the flash lamps. The temperature of the semiconductor wafer is computed using data corresponding to the intensity of the flashes of light obtained from the output from the photodiode. This allows the determination of the surface temperature of the semiconductor wafer irradiated with the flashes of light, irrespective of the waveform of the emission intensity of the flash lamps.

摘要翻译： 响应性优异的光电二极管在通过照射闪光而加热半导体晶片的过程中接收从闪光灯发出的光的闪光，并且使用从输出获得的电压数据获取光的闪光强度的波形 从光电二极管。 然后，温度计算部使用获取的数据进行热传导模拟，以计算从闪光灯照射的闪光的半导体晶片的温度。 使用与从光电二极管的输出获得的闪光的强度对应的数据来计算半导体晶片的温度。 这允许确定用闪光灯照射的半导体晶片的表面温度，而与闪光灯的发射强度的波形无关。

公开(公告)号：US20120288970A1

公开(公告)日：2012-11-15

申请号：US13468408

申请日：2012-05-10

申请人： Kazuyuki HASHIMOTO ,  Tatsufumi KUSUDA

发明人： Kazuyuki HASHIMOTO ,  Tatsufumi KUSUDA

IPC分类号： H01L21/66 ,  F27D11/00 ,  H01L21/324

CPC分类号： H01L21/67115 ,  F27B17/0025 ,  G01J5/0007 ,  G01J5/026 ,  H01L2924/13055 ,  H01L2924/13091 ,  H01L2924/00

摘要： After flash irradiation on a semiconductor wafer is started and then the temperatures of front and back surfaces of the semiconductor wafer become equal to each other, the temperature of the back surface of the semiconductor wafer, which has a known emissivity, is measured with a radiation thermometer. The emissivity of the front surface of the semiconductor wafer is calculated based on the intensity of radiated light from a black body having an equal temperature to the temperature of the back surface thereof, and the intensity of radiated light actually radiated from the front surface of the semiconductor wafer. Then, the temperature of the front surface of the semiconductor wafer heated by the flash irradiation is calculated based on the calculated emissivity and the intensity of the radiated light from the front surface of the semiconductor wafer that has been measured after the flash irradiation is started.

摘要翻译： 在半导体晶片上的闪光照射开始之后，半导体晶片的前表面和背面的温度变得彼此相等时，具有已知发射率的半导体晶片的背表面的温度用辐射 温度计。 基于来自具有相同温度的黑体与其后表面的温度的辐射光的强度以及从其表面的实际辐射的辐射强度来计算半导体晶片的前表面的发射率 半导体晶片。 然后，基于计算的发射率和在闪光照射开始后测量的半导体晶片的前表面的辐射强度来计算由闪光照射加热的半导体晶片的正面的温度。

公开(公告)号：US20120288261A1

公开(公告)日：2012-11-15

申请号：US13468381

申请日：2012-05-10

申请人： Kazuyuki HASHIMOTO ,  Tatsufumi KUSUDA

发明人： Kazuyuki HASHIMOTO ,  Tatsufumi KUSUDA

IPC分类号： F27D11/12

CPC分类号： F27B17/0025 ,  F27D5/0037 ,  H01L21/67115 ,  H01L21/67248

摘要： A photodetector element for receiving radiated light from a surface of a semiconductor wafer loses a detection function because the intensity of the received light exceeds a detection limit while a flash lamp emits light. Measurement is not performed during the above-mentioned period, and the intensity of the radiated light from the surface of the semiconductor wafer is measured after the flash lamp stops emitting light and the photodetector element restores the detection function. Then, the temperature of the surface of the semiconductor wafer heated by irradiation with a flash of light is calculated based on the measured intensity of the radiated light. Accordingly, even in a case where intense irradiation is performed in an extremely short period of time, such as flash irradiation, the flash of light does not act as ambient light, which enables to obtain the surface temperature of the semiconductor wafer.

摘要翻译： 用于从半导体晶片的表面接收辐射光的光检测器元件由于在闪光灯发光的同时接收光的强度超过检测极限而失去检测功能。 在上述期间不进行测量，在闪光灯停止发光后测量来自半导体晶片表面的辐射光的强度，并且光电检测元件恢复检测功能。 然后，基于测定的照射光的强度，计算通过照射闪光而加热的半导体晶片的表面的温度。 因此，即使在短时间内进行强烈照射的情况下，例如闪光照射，闪光也不会作为环境光，而能够获得半导体晶片的表面温度。

公开(公告)号：US20090231321A1

公开(公告)日：2009-09-17

申请号：US12405412

申请日：2009-03-17

申请人： Fumirou MATSUKI ,  Kazuyuki HASHIMOTO

发明人： Fumirou MATSUKI ,  Kazuyuki HASHIMOTO

IPC分类号： G06F3/038

CPC分类号： G09G3/3611 ,  G09G3/3696 ,  G09G2310/0291

摘要： A source driver circuit of an LCD apparatus with a small occupied area and low power consumption is disclosed. The source driver circuit comprises a reference voltage circuit, a negative voltage driving DAC, a positive voltage driving DAC, an invert amplifier, a non-invert amplifier and a voltage selector. The reference voltage circuit generates a reference voltage. The negative voltage driving DAC divides the display data into negative gradation voltages. The positive voltage driving DAC divides the display data into positive gradation voltages. The invert amplifier works as an analogue buffer for the negative gradation voltages for driving the LCD apparatus and the non-invert amplifier works as an analogue buffer for the positive gradation voltages for driving the LCD apparatus. The voltage selector provides the reference voltage to the positive and negative voltage driving DACs.

摘要翻译： 公开了一种具有小占用面积和低功耗的LCD装置的源极驱动电路。 源极驱动器电路包括参考电压电路，负电压驱动DAC，正电压驱动DAC，反相放大器，非反相放大器和电压选择器。 参考电压电路产生参考电压。 负电压驱动DAC将显示数据划分为负灰度电压。 正电压驱动DAC将显示数据分成正的灰度电压。 反相放大器用作用于驱动LCD装置的负灰度电压的模拟缓冲器，并且非反相放大器用作用于驱动LCD装置的正灰度级电压的模拟缓冲器。 电压选择器为正和负电压驱动DAC提供参考电压。