公开(公告)号：US09735900B2

公开(公告)日：2017-08-15

申请号：US14883490

申请日：2015-10-14

Applicant: Keysight Technologies, Inc.

Inventor： Gregory D. VanWiggeren ,  Keith F. Anderson ,  Nilesh R. Gheewala

IPC: H04B17/00 ,  H04B17/15 ,  H04B17/21

CPC classification number: H04B17/15 ,  H04B17/0085 ,  H04B17/21 ,  H04L5/00

Abstract: Network analysis employs a band-limited multi-tone test signal having a tunable center frequency to test a device under test (DUT). A hybrid network analyzer includes a test signal source to provide the band-limited multi-tone test signal, and a local oscillator (LO) source to provide a tunable LO signal configured to track the tunable center frequency of the band-limited multi-tone test signal. The hybrid network analyzer further includes a receiver to convert into an intermediate frequency (IF) signal using the tunable LO signal one or both of the band-limited multi-tone test signal and a response signal from a device under test (DUT) produced in response to the band-limited multi-tone test signal. The test signal source is further configured to provide a tunable single-tone test signal and a broadband multi-tone test signal to test the DUT in various modes.

公开(公告)号：US20170111127A1

公开(公告)日：2017-04-20

申请号：US14883490

申请日：2015-10-14

Applicant: Keysight Technologies, Inc.

Inventor： Gregory D. VanWiggeren ,  Keith F. Anderson ,  Nilesh R. Gheewala

IPC: H04B17/15 ,  H04B17/00

CPC classification number: H04B17/15 ,  H04B17/0085 ,  H04B17/21 ,  H04L5/00

Abstract: Network analysis employs a band-limited multi-tone test signal having a tunable center frequency to test a device under test (DUT). A hybrid network analyzer includes a test signal source to provide the band-limited multi-tone test signal, and a local oscillator (LO) source to provide a tunable LO signal configured to track the tunable center frequency of the band-limited multi-tone test signal. The hybrid network analyzer further includes a receiver to convert into an intermediate frequency (IF) signal using the tunable LO signal one or both of the band-limited multi-tone test signal and a response signal from a device under test (DUT) produced in response to the band-limited multi-tone test signal. The test signal source is further configured to provide a tunable single-tone test signal and a broadband multi-tone test signal to test the DUT in various modes.