公开(公告)号：US10969421B2

公开(公告)日：2021-04-06

申请号：US16147657

申请日：2018-09-29

Applicant: Keysight Technologies, Inc.

Inventor： Keith F. Anderson ,  Alex Grichener

IPC: G01R31/28 ,  G01R27/28 ,  H04B17/29 ,  H04B17/00 ,  G01R27/06

Abstract: A test instrument, including an embedded VNA circuit, for testing a DUT. The test instrument includes a first receiver for receiving an incident RF signal through a first coupling device; a second receiver for receiving a reflected RF signal through a second coupling device; a test port for connecting to an interconnect, which is connectable to a calibration device in a calibrating stage, during which the interconnect is characterized, and to the DUT in a testing stage, during which at least one parameter of the DUT is tested; an RF source for generating the incident RF signal during the calibrating stage; and a processing unit programmed to determine S-parameters of the interconnect based on the incident RF signal and the reflected RF signal, the S-parameters compensating for error introduced by the interconnect when testing the at least one parameter of the DUT in the testing stage.

公开(公告)号：US20190064236A1

公开(公告)日：2019-02-28

申请号：US15690934

申请日：2017-08-30

Applicant: Keysight Technologies, Inc.

Inventor： Jan Verspecht ,  Keith F. Anderson ,  Joel P. Dunsmore

IPC: G01R23/20 ,  G01R27/28 ,  H04B17/00 ,  H04B17/29 ,  H04L27/26

Abstract: Nonlinear distortion of a device under test (DUT) is detected by obtaining measurements of a multi-tone input signal from a signal generator to a DUT, to obtain a measured multi-tone input signal. Measurements are also obtained of a multi-tone output signal from the DUT that is generated based on the multi-tone input signal, to obtain a measured multi-tone output signal. A correlated part of the measured multi-tone output signal that is correlated with the measured multi-tone input signal is determined insofar as the correlated part corresponds to a frequency response function of the DUT.

公开(公告)号：US20220260662A1

公开(公告)日：2022-08-18

申请号：US17733515

申请日：2022-04-29

Applicant: Keysight Technologies, Inc.

Inventor： Keith F. Anderson ,  Alex Grichener

IPC: G01R35/00 ,  G01R27/28 ,  H04B17/21

Abstract: A method is provided for calibrating a test system, including first and second test instruments. The method includes connecting a first test port of the first test instrument to a second test port of the second test instrument; generating a first RF signal using a first RF source of the first test instrument while a second RF source of the second test instrument is turned off; measuring first phase of the first RF signal at the first test port using first incident and reflected signals; generating a second RF signal using a second RF source of the second test instrument while the first RF source; measuring second phase of the second RF signal at the first test port using the second incident signal and reflected signals; determining a phase difference between the first and second phases; and adjusting the first and/or second RF source to remove the determined phase difference.

公开(公告)号：US09735900B2

公开(公告)日：2017-08-15

申请号：US14883490

申请日：2015-10-14

Applicant: Keysight Technologies, Inc.

Inventor： Gregory D. VanWiggeren ,  Keith F. Anderson ,  Nilesh R. Gheewala

IPC: H04B17/00 ,  H04B17/15 ,  H04B17/21

CPC classification number: H04B17/15 ,  H04B17/0085 ,  H04B17/21 ,  H04L5/00

Abstract: Network analysis employs a band-limited multi-tone test signal having a tunable center frequency to test a device under test (DUT). A hybrid network analyzer includes a test signal source to provide the band-limited multi-tone test signal, and a local oscillator (LO) source to provide a tunable LO signal configured to track the tunable center frequency of the band-limited multi-tone test signal. The hybrid network analyzer further includes a receiver to convert into an intermediate frequency (IF) signal using the tunable LO signal one or both of the band-limited multi-tone test signal and a response signal from a device under test (DUT) produced in response to the band-limited multi-tone test signal. The test signal source is further configured to provide a tunable single-tone test signal and a broadband multi-tone test signal to test the DUT in various modes.

公开(公告)号：US09520954B1

公开(公告)日：2016-12-13

申请号：US15009309

申请日：2016-01-28

Applicant: Keysight Technologies, Inc.

Inventor： Jan Verspecht ,  Keith F. Anderson

IPC: H04B17/00 ,  H04B1/16 ,  H04B17/20 ,  H04B1/26 ,  H04L7/00

CPC classification number: H04B17/20 ,  H04B1/26 ,  H04B17/0085

Abstract: A system and method supply a test signal having a first tone at a first RF frequency and a second tone at a second RF frequency to a frequency converter; provide a local oscillator (LO) signal to the frequency converter, wherein an IF output signal of the frequency converter is supplied to an input of an intermediate frequency (IF) filter, in response to which the IF filter provides a filtered IF output signal; for each of N>1 different LO frequencies, measure the filtered IF output signal at a pair of IF frequencies corresponding to differences between the first and second RF frequencies and the LO frequency, where the measurements of the filtered IF output signal measure time-invariant phase; and ascertain N−1 values of phase dispersion D of the IF filter at N−1 corresponding IF frequencies from the N measurements of the filtered IF output signal at the N different LO frequencies.

Abstract translation: 系统和方法将具有第一RF频率的第一音调和第二RF频率的第二音调的测试信号提供给频率转换器; 向所述变频器提供本地振荡器（LO）信号，其中所述频率转换器的IF输出信号被提供给中频（IF）滤波器的输入，响应于所述IF滤波器提供经滤波的IF输出信号; 对于N≥1个不同的LO频率中的每一个，对于与第一和第二RF频率之间的差对应的一对IF频率和LO频率来测量经滤波的IF输出信号，其中滤波的IF输出信号的测量测量时不变 相; 并且从N个不同LO频率处的滤波后的IF输出信号的N个测量值确定在N-1个对应的IF频率处的IF滤波器的相位色散D的N-1个值。

公开(公告)号：US20240175959A1

公开(公告)日：2024-05-30

申请号：US18432131

申请日：2024-02-05

Applicant: Keysight Technologies, Inc.

Inventor： Keith F. Anderson ,  Alex Grichener

IPC: G01R35/00 ,  G01R27/28 ,  H04B17/21

CPC classification number: G01R35/00 ,  G01R27/28 ,  H04B17/21

Abstract: A method is provided for determining source match of a test system including an RF source, a vector network analyzer (VNA) and a test port. The method includes connecting a first calibration standard to the test port; generating an RF signal using the RF source, and applying the RF signal to the first calibration standard; measuring a first incident signal of the RF signal at a first receiver of the test system, and measuring a first reflected signal at a second receiver of the test system; connecting a second calibration standard to the test port; measuring a second incident signal of the RF signal at the first receiver of the test system, and measuring a second reflected signal at the second receiver of the test system; and determining the source match of the test system using the first incident and reflected signals and the second incident and reflected signals.

公开(公告)号：US11353536B2

公开(公告)日：2022-06-07

申请号：US16544416

申请日：2019-08-19

Applicant: Keysight Technologies, Inc.

Inventor： Keith F. Anderson ,  Alex Grichener

IPC: G01R35/00 ,  G01R27/28 ,  H04B17/21

Abstract: A method is provided for calibrating a test system, including an RF source combined with a VNA connected to or embedded in a test instrument. The method includes connecting to a power meter at the test port; generating an RF signal at an RF source as an incident signal, and providing the incident signal to the power meter through the test port; measuring a forward power wave of the incident signal using a first receiver; measuring a reverse power wave of a reflected signal using a second receiver; measuring output power at the test port using the power meter; and calculating magnitude errors of the first receiver and the second receiver using the measured forward power wave, the measured reverse power wave, and the measured output power by the power meter, and determining magnitude error correction terms of the forward and reverse power waves to remove the magnitude errors.

公开(公告)号：US09887785B1

公开(公告)日：2018-02-06

申请号：US14997084

申请日：2016-01-15

Applicant: Keysight Technologies, Inc.

Inventor： Keith F. Anderson ,  Jean-Pierre Teyssier

IPC: H04B3/46 ,  H04B17/00 ,  H04Q1/20 ,  H04B17/20 ,  H04B1/16 ,  H04B1/00

CPC classification number: H04B17/20 ,  H04B1/0007 ,  H04B1/16 ,  H04B17/0085

Abstract: A receiver and method for using the same to generate phase spectra that are independent of the starting time of the sequence of digital measurements used to generate the phase spectra are disclosed. The receiver includes a first signal port adapted to receive a first test signal that includes a plurality of tones and a first ADC that generates one digital value from the first test signal in response to each clock pulse from an ADC clock. The first receiver also includes a phase clock register that includes a time stamp value that is incremented on each clock pulse from the ADC clock, and a processor that records a sequence of the digital values starting at a first time and the time stamp value at the first time.

公开(公告)号：US09673914B2

公开(公告)日：2017-06-06

申请号：US14824000

申请日：2015-08-11

Applicant: Keysight Technologies, Inc.

Inventor： Troels Studsgaard Nielsen ,  Jan Verspecht ,  Keith F. Anderson

IPC: H04B3/46 ,  H04B17/10 ,  H04L27/10

CPC classification number: H04B17/104 ,  H04B1/06 ,  H04L5/0048 ,  H04L27/10

Abstract: A system and method sequentially measure the amplitude and phase of an output signal of a device under test in each of two or more frequency ranges which together span the output signal spectrum, using a local oscillator (LO) signal whose frequency changes for each measurement. The measured phase of the output signal is adjusted for at least one of the frequency ranges to account for a change of phase in the LO signal from measurement of one frequency range to another frequency range, including applying to the measured phase a phase offset determined by measuring the phase of a pilot tone using the LO signal before and after the frequency of the LO signal changes from measurement of one frequency range to another. The phase-adjusted measurements of the output signal in the two or more frequency ranges are stitched together to determine the amplitude and phase of the output signal across the output signal spectrum.

公开(公告)号：US20170048006A1

公开(公告)日：2017-02-16

申请号：US14824000

申请日：2015-08-11

Applicant: Keysight Technologies, Inc.

Inventor： Troels Studsgaard Nielsen ,  Jan Verspecht ,  Keith F. Anderson

IPC: H04B17/10 ,  H04L27/10

CPC classification number: H04B17/104 ,  H04B1/06 ,  H04L5/0048 ,  H04L27/10

Abstract: A system and method sequentially measure the amplitude and phase of an output signal of a device under test in each of two or more frequency ranges which together span the output signal spectrum, using a local oscillator (LO) signal whose frequency changes for each measurement. The measured phase of the output signal is adjusted for at least one of the frequency ranges to account for a change of phase in the LO signal from measurement of one frequency range to another frequency range, including applying to the measured phase a phase offset determined by measuring the phase of a pilot tone using the LO signal before and after the frequency of the LO signal changes from measurement of one frequency range to another. The phase-adjusted measurements of the output signal in the two or more frequency ranges are stitched together to determine the amplitude and phase of the output signal across the output signal spectrum.

Abstract translation: 系统和方法使用每个测量的频率变化的本地振荡器（LO）信号顺序地测量两个或更多个频率范围中的每一个中的测试装置的输出信号的幅度和相位，该频率范围一起跨​​越输出信号频谱。 对于至少一个频率范围调整输出信号的测量相位，以考虑从一个频率范围的测量到另一个频率范围的LO信号中的相位变化，包括将所测量的相位施加到由 在LO信号的频率从一个频率范围的测量变为另一个频率范围之前和之后，使用LO信号来测量导频音的相位。 将两个或更多个频率范围内的输出信号的相位调整测量结合在一起以确定输出信号频谱上的输出信号的幅度和相位。