公开(公告)号：US20170160310A1

公开(公告)日：2017-06-08

申请号：US15429117

申请日：2017-02-09

申请人： Keyssa, Inc.

发明人： Roger Isaac ,  Bhupendra Sarhad ,  Gary Davis McCormack ,  Ian A. Kyles ,  Frederick George Weiss ,  Christopher Scott Sansom

IPC分类号： G01R1/04 ,  G01R1/24 ,  G01R31/28

CPC分类号： G01R1/045 ,  G01R1/24 ,  G01R31/2822 ,  G01R31/2834 ,  G01R31/2889 ,  G01R31/3025

摘要： A test fixture has a flexible plastic cable that acts as a waveguide. The Device-Under-Test (DUT) is a small transceiver and antenna that operate in the Extremely High-Frequency (EHF) band of 30-300 GHz. The size of the DUT transceiver is very small, limiting the power of emitted electromagnetic radiation so that close-proximity communication is used. The envelope for reception may only extend for about a centimeter from the DUT transceiver, about the same size as the test socket. A slot is formed in the test socket very near to the antenna. The slot receives one end of the plastic waveguide. The slot extends into the envelope by the DUT transceiver so that close-proximity radiation is captured by the plastic waveguide. The waveguide has a high relative permittivity and reflective metalized walls so that the radiation may be carried to a receiver that is outside the envelope.

公开(公告)号：US09588173B2

公开(公告)日：2017-03-07

申请号：US14108708

申请日：2013-12-17

申请人： Keyssa, Inc.

发明人： Roger Isaac ,  Bhupendra Sarhad ,  Gary Davis McCormack ,  Ian A. Kyles ,  Frederick George Weiss ,  Christopher Scott Sansom

IPC分类号： G01R31/28 ,  G01R1/24 ,  G01R1/04 ,  G01R31/302

CPC分类号： G01R1/045 ,  G01R1/24 ,  G01R31/2822 ,  G01R31/2834 ,  G01R31/2889 ,  G01R31/3025

摘要： A test fixture has a flexible plastic cable that acts as a waveguide. The Device-Under-Test (DUT) is a small transceiver and antenna that operate in the Extremely High-Frequency (EHF) band of 30-300 GHz. The size of the DUT transceiver is very small, limiting the power of emitted electromagnetic radiation so that close-proximity communication is used. The envelope for reception may only extend for about a centimeter from the DUT transceiver, about the same size as the test socket. A slot is formed in the test socket very near to the antenna. The slot receives one end of the plastic waveguide. The slot extends into the envelope by the DUT transceiver so that close-proximity radiation is captured by the plastic waveguide. The waveguide has a high relative permittivity and reflective metalized walls so that the radiation may be carried to a receiver that is outside the envelope.

摘要翻译： 测试夹具具有用作波导的柔性塑料电缆。 被测设备（DUT）是一种小型收发器和天线，工作在30-300 GHz的极高频（EHF）频段。 DUT收发器的尺寸非常小，限制发射的电磁辐射的功率，以便使用近距离通信。 用于接收的信封可能距离DUT收发器只能延伸约一厘米，大约与测试插座相同。 在测试插座中非常靠近天线形成一个插槽。 槽接收塑料波导的一端。 插槽通过DUT收发器延伸到信封中，使得近距离辐射被塑料波导捕获。 波导具有高的相对介电常数和反射金属化壁，使得辐射可以被携带到在信封外部的接收器。

公开(公告)号：US10031160B2

公开(公告)日：2018-07-24

申请号：US15729292

申请日：2017-10-10

申请人： Keyssa, Inc.

发明人： Roger Isaac ,  Bhupendra Sarhad ,  Gary Davis McCormack ,  Ian A. Kyles ,  Frederick George Weiss ,  Christopher Scott Sansom

IPC分类号： G01R1/04 ,  G01R1/24 ,  G01R31/28

摘要： A test fixture has a flexible plastic cable that acts as a waveguide. The Device-Under-Test (DUT) is a small transceiver and antenna that operate in the Extremely High-Frequency (EHF) band of 30-300 GHz. The size of the DUT transceiver is very small, limiting the power of emitted electromagnetic radiation so that close-proximity communication is used. The envelope for reception may only extend for about a centimeter from the DUT transceiver, about the same size as the test socket. A slot is formed in the test socket very near to the antenna. The slot receives one end of the plastic waveguide. The slot extends into the envelope by the DUT transceiver so that close-proximity radiation is captured by the plastic waveguide. The waveguide has a high relative permittivity and reflective metalized walls so that the radiation may be carried to a receiver that is outside the envelope.

公开(公告)号：US20180031606A1

公开(公告)日：2018-02-01

申请号：US15729292

申请日：2017-10-10

申请人： Keyssa, Inc.

发明人： Roger Isaac ,  Bhupendra Sarhad ,  Gary Davis McCormack ,  Ian A. Kyles ,  Frederick George Weiss ,  Christopher Scott Sansom

IPC分类号： G01R1/04 ,  G01R1/24 ,  G01R31/28

CPC分类号： G01R1/045 ,  G01R1/24 ,  G01R31/2822 ,  G01R31/2834 ,  G01R31/2889 ,  G01R31/3025

摘要： A test fixture has a flexible plastic cable that acts as a waveguide. The Device-Under-Test (DUT) is a small transceiver and antenna that operate in the Extremely High-Frequency (EHF) band of 30-300 GHz. The size of the DUT transceiver is very small, limiting the power of emitted electromagnetic radiation so that close-proximity communication is used. The envelope for reception may only extend for about a centimeter from the DUT transceiver, about the same size as the test socket. A slot is formed in the test socket very near to the antenna. The slot receives one end of the plastic waveguide. The slot extends into the envelope by the DUT transceiver so that close-proximity radiation is captured by the plastic waveguide. The waveguide has a high relative permittivity and reflective metalized walls so that the radiation may be carried to a receiver that is outside the envelope.

公开(公告)号：US09817025B2

公开(公告)日：2017-11-14

申请号：US15429117

申请日：2017-02-09

申请人： Keyssa, Inc.

发明人： Roger Isaac ,  Bhupendra Sarhad ,  Gary Davis McCormack ,  Ian A. Kyles ,  Frederick George Weiss ,  Christopher Scott Sansom

IPC分类号： G01R1/04 ,  G01R31/28 ,  G01R1/24

CPC分类号： G01R1/045 ,  G01R1/24 ,  G01R31/2822 ,  G01R31/2834 ,  G01R31/2889 ,  G01R31/3025

摘要： A test fixture has a flexible plastic cable that acts as a waveguide. The Device-Under-Test (DUT) is a small transceiver and antenna that operate in the Extremely High-Frequency (EHF) band of 30-300 GHz. The size of the DUT transceiver is very small, limiting the power of emitted electromagnetic radiation so that close-proximity communication is used. The envelope for reception may only extend for about a centimeter from the DUT transceiver, about the same size as the test socket. A slot is formed in the test socket very near to the antenna. The slot receives one end of the plastic waveguide. The slot extends into the envelope by the DUT transceiver so that close-proximity radiation is captured by the plastic waveguide. The waveguide has a high relative permittivity and reflective metalized walls so that the radiation may be carried to a receiver that is outside the envelope.

公开(公告)号：US20170102409A1

公开(公告)日：2017-04-13

申请号：US14880174

申请日：2015-10-09

申请人： Keyssa, Inc.

发明人： Bhupendra Sakerlal Sarhad ,  Christopher Scott Sansom

IPC分类号： G01R1/04 ,  G01R31/28

CPC分类号： G01R1/045 ,  G01R31/045 ,  G01R31/2822 ,  G01R31/303 ,  G01R31/31905

摘要： A test system includes a test socket assembly for capturing low energy electromagnetic emissions from radio frequency (RF) integrated circuits (ICs). The test socket assembly is structured to direct electromagnetic radiation from the device under test (DUT) to a socket port coupled to one end of a waveguide for transmission to a tester. The combination of the materials comprising the socket assembly is selected to more efficiently couple electromagnetic emissions from the DUT into the waveguide. For example, a reflective plane with an adjustable position may be located below the DUT in order to increase coupling of electromagnetic radiation from the DUT into the waveguide.