公开(公告)号：US11693042B2

公开(公告)日：2023-07-04

申请号：US17472746

申请日：2021-09-13

申请人： King Yuan Electronics Co., Ltd.

发明人： Pin-Yan Tsai ,  Kuang-Che Cheng

IPC分类号： G01R31/26 ,  G01R31/28 ,  G01R31/308

CPC分类号： G01R31/26 ,  G01R31/2886 ,  G01R31/308

摘要： An image test system includes a test assembly and an image capture card. The test assembly is provided for obtaining a test signal from a test object, and includes an interface conversion circuit for converting signal transmission form of the test signal. The image capture card is provided for obtaining the test signal from the test assembly, and obtaining an image data from the test signal. The image test system further includes a test signal clock generation circuit for obtaining a test signal clock from the test signal, or the image capture card further includes a pair of clock input pins for obtaining the test signal clock directly from the test object.

公开(公告)号：US11300611B2

公开(公告)日：2022-04-12

申请号：US16826334

申请日：2020-03-23

申请人： King Yuan Electronics Co., Ltd.

发明人： Pin-Yan Tsai ,  Po-Kuan Sung ,  Kuang-Che Cheng ,  Hung-Chan Lin

IPC分类号： G01R31/28 ,  G01R31/311

摘要： An image test system includes a test assembly and an image capture card. The test assembly is provided for capturing test signals from test objects, and incudes a first transmission interface, a second transmission interface, and an interface conversion circuit. The interface conversion circuit is connected with the first transmission interface, and converts signal transmission forms of the test signals. The second transmission interface is connected with the interface conversion circuit. Besides, the image capture card is provided for connecting with the second transmission interface, and captures image data from the test signals.