公开(公告)号：US20240037728A1

公开(公告)日：2024-02-01

申请号：US18361054

申请日：2023-07-28

Applicant: Konica Minolta, Inc.

Inventor： Yoshihito SOUMA

IPC: G06T7/00 ,  G06T15/06 ,  G06T15/50 ,  G06V10/60 ,  G06V10/774 ,  G06V20/70

CPC classification number: G06T7/0008 ,  G06T15/06 ,  G06T15/50 ,  G06V10/60 ,  G06V10/774 ,  G06V20/70

Abstract: A system for generating training image data for supervised machine learning for training a defect classifier to be applied to visual inspection. The system arranges a defect model arbitrarily selected from a storage storing defect models obtained by modeling shapes and optical characteristics of defects and an inspection target surface model arbitrarily selected from a storage storing inspection target surface models obtained by modeling shapes and optical characteristics of inspection target surfaces, in any space in which ray tracing is performed by ray tracing simulation software in which an illumination optical system, an image pickup optical system, and an imaging sensor including a plurality of pixels are modeled. The system further traces a plurality of light rays, calculates illuminance at each of the pixels based on an intensity and a number of light rays entering the pixels, and generates pseudo image data as training image data based on the illuminance.

公开(公告)号：US20250045898A1

公开(公告)日：2025-02-06

申请号：US18719976

申请日：2022-12-09

Applicant: Konica Minolta, Inc.

Inventor： Yoshihito SOUMA

IPC: G06T7/00 ,  G01N21/88 ,  G01N21/94 ,  G06T7/50

Abstract: A surface inspection device (3) includes an image acquisition means (31) of acquiring a plurality of images of an inspected site on a coated surface of a workpiece (100) imaged by an imaging device (2) in a state where a bright and dark pattern of an illumination device (1) that illuminates the inspected site is moved relative to the workpiece (100), a calculation means (32) of calculating a feature representing a surface defect for the plurality of images acquired by the image acquisition means, and an estimation means (33) of estimating a depth from a coated surface of a foreign substance causing the surface defect using change in the feature calculated by the calculation means.