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公开(公告)号:US20210272926A1
公开(公告)日:2021-09-02
申请号:US17324977
申请日:2021-05-19
摘要: A bonding tool for bonding a semiconductor element to a substrate on a bonding machine is provided. The bonding tool includes a body portion including a contact region for contacting the semiconductor element during a bonding process on the bonding machine. The bonding tool also includes a standoff extending from the body portion, and configured to contact the substrate during at least a portion of the bonding process.
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公开(公告)号:US11342301B2
公开(公告)日:2022-05-24
申请号:US17324977
申请日:2021-05-19
IPC分类号: H01L23/00 , B23K1/00 , B23K3/08 , B23K1/008 , B23K101/40 , B23K101/42
摘要: A bonding tool for bonding a semiconductor element to a substrate on a bonding machine is provided. The bonding tool includes a body portion including a contact region for contacting the semiconductor element during a bonding process on the bonding machine. The bonding tool also includes a standoff extending from the body portion, and configured to contact the substrate during at least a portion of the bonding process.
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公开(公告)号:US11049839B2
公开(公告)日:2021-06-29
申请号:US16248312
申请日:2019-01-15
IPC分类号: B32B7/00 , H01L23/00 , B23K1/00 , B23K3/08 , B23K1/008 , B23K101/40 , B23K101/42
摘要: A bonding tool for bonding a semiconductor element to a substrate on a bonding machine is provided. The bonding tool includes a body portion including a contact region for contacting the semiconductor element during a bonding process on the bonding machine. The bonding tool also includes a standoff extending from the body portion, and configured to contact the substrate during at least a portion of the bonding process.
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4.
公开(公告)号:US20190229084A1
公开(公告)日:2019-07-25
申请号:US16248312
申请日:2019-01-15
摘要: A bonding tool for bonding a semiconductor element to a substrate on a bonding machine is provided. The bonding tool includes a body portion including a contact region for contacting the semiconductor element during a bonding process on the bonding machine. The bonding tool also includes a standoff extending from the body portion, and configured to contact the substrate during at least a portion of the bonding process.
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