Enhancing Memory Yield Through Memory Subsystem Repair
    1.
    发明申请
    Enhancing Memory Yield Through Memory Subsystem Repair 审中-公开
    通过内存子系统修复提高内存收益

    公开(公告)号:US20140169113A1

    公开(公告)日:2014-06-19

    申请号:US13910582

    申请日:2013-06-05

    CPC classification number: G11C29/82 G11C29/814

    Abstract: A memory system and a memory repair method for the memory system are disclosed. The method includes the steps of: organizing at least one repair block to serve as a shared repair resource for the plurality of memory blocks in the tiled memory; identifying a defective memory unit among the plurality of memory blocks in the tiled memory; identifying a replacement unit in the repair block for replacement of the defective memory unit; retrieving a set of memory blocks from the plurality of memory blocks in the tiled memory in response to a data access request, wherein the set of memory blocks retrieved containing the defective memory unit; retrieving the replacement unit from the repair block in response to the data access request; and replacing the defective memory unit in the set of memory blocks with the replacement unit.

    Abstract translation: 公开了一种用于存储器系统的存储器系统和存储器修复方法。 该方法包括以下步骤:组织至少一个修复块以用作平铺存储器中的多个存储器块的共享修复资源; 识别所述平铺存储器中的所述多个存储器块中的有缺陷的存储器单元; 识别所述修理块中的替换单元以更换所述有缺陷的存储器单元; 响应于数据访问请求从所述平铺存储器中的所述多个存储器块中检索一组存储器块,其中所述包含所述有缺陷的存储器单元的所述存储器块集合; 响应于数据访问请求从修复块检索替换单元; 并用更换单元替换该组存储器块中的有缺陷的存储器单元。

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