Testing integrated circuits and integrated power transistors
    1.
    发明授权
    Testing integrated circuits and integrated power transistors 有权
    测试集成电路和集成功率晶体管

    公开(公告)号:US06759856B2

    公开(公告)日:2004-07-06

    申请号:US10461844

    申请日:2003-06-12

    IPC分类号: H01L2166

    CPC分类号: G01R31/40

    摘要: A switching regulator that has first, second, third and fourth terminals, a first power transistor disposed between the first terminal and a first node, a second power transistor disposed between the first node and a second node, a filter including a capacitor and an inductor, and a controller. The first power transistor is partitioned into a plurality of individually-addressable first transistor segments. The second node couples the second and fourth terminals. The second power transistor is partitioned into a plurality of individually-addressable second transistor segments. The inductor is disposed between the first node and the third terminal, and the capacitor is disposed between the third and fourth terminals. The controller is operable in a plurality of modes including a normal mode in which the controller opens and closes all of the first transistor segments and all of the second transistor segments, and a test mode in which the controller opens and closes less than all of the first transistor segments and all of the second transistor segments.

    摘要翻译: 一种具有第一,第二,第三和第四端子的开关调节器,设置在第一端子和第一节点之间的第一功率晶体管,设置在第一节点和第二节点之间的第二功率晶体管,包括电容器和电感器的滤波器 ,和控制器。 第一功率晶体管被划分成多个可单独寻址的第一晶体管段。 第二节点耦合第二和第四终端。 第二功率晶体管被划分成多个单独寻址的第二晶体管段。 电感器设置在第一节点和第三终端之间,电容器设置在第三和第四终端之间。 控制器可以在多种模式中操作,包括其中控制器打开和关闭所有第一晶体管段和所有第二晶体管段的正常模式,以及控制器打开和关闭小于全部的测试模式 第一晶体管段和所有第二晶体管段。

    Testing integrated circuits with integrated power transistors
    2.
    发明授权
    Testing integrated circuits with integrated power transistors 有权
    用集成功率晶体管测试集成电路

    公开(公告)号:US06603326B1

    公开(公告)日:2003-08-05

    申请号:US09766231

    申请日:2001-01-19

    IPC分类号: G01R3140

    CPC分类号: G01R31/40

    摘要: A switching regulator that has first, second, third and fourth terminals, a first power transistor disposed between the first terminal and a first node, a second power transistor disposed between the first node and a second node, a filter including a capacitor and an inductor, and a controller. The first power transistor is partitioned into a plurality of individually-addressable first transistor segments. The second node couples the second and fourth terminals. The second power transistor is partitioned into a plurality of individually-addressable second transistor segments. The inductor is disposed between the first node and the third terminal, and the capacitor is disposed between the third and fourth terminals. The controller is operable in a plurality of modes including a normal mode in which the controller opens and closes all of the first transistor segments and all of the second transistor segments, and a test mode in which the controller opens and closes less than all of the first transistor segments and all of the second transistor segments.

    摘要翻译: 一种具有第一,第二,第三和第四端子的开关调节器,设置在第一端子和第一节点之间的第一功率晶体管,设置在第一节点和第二节点之间的第二功率晶体管,包括电容器和电感器的滤波器 ,和控制器。 第一功率晶体管被划分成多个可单独寻址的第一晶体管段。 第二节点耦合第二和第四终端。 第二功率晶体管被划分成多个单独寻址的第二晶体管段。 电感器设置在第一节点和第三终端之间,电容器设置在第三和第四终端之间。 控制器可以在多种模式中操作,包括其中控制器打开和关闭所有第一晶体管段和所有第二晶体管段的正常模式,以及控制器打开和关闭小于全部的测试模式 第一晶体管段和所有第二晶体管段。

    METHOD AND APPARATUS FOR USING CEPSTRUM AND WAVELET BASED ALGORITHMS FOR WALL THICKNESS MEASUREMENT
    4.
    发明申请
    METHOD AND APPARATUS FOR USING CEPSTRUM AND WAVELET BASED ALGORITHMS FOR WALL THICKNESS MEASUREMENT 有权
    使用基于CEPSTRUM和WAVELET的算法进行厚度测量的方法和装置

    公开(公告)号:US20130247673A1

    公开(公告)日:2013-09-26

    申请号:US13583253

    申请日:2011-03-09

    IPC分类号: G01B17/02

    CPC分类号: G01B17/02

    摘要: New techniques are provided for measuring the thickness of a pipe wall using ultrasonic reflections. The apparatus includes a signal processor that receives a signal containing information about ultrasonic pulses injected into a pipe wall; and determines a pipe wall thickness measurement based at least partly on decomposing the signal received in order to identify either peaks using a cepstrum analysis or repeated spacing using a wavelet analysis. The wavelet analysis includes dividing data in the signal received into a specific frequency component and a defined temporal component in order to detect correct pulses where multiple reflections are caused by irregularities in the pipe wall surface being measured. The cepstrum analysis includes processing repeating pulses in the signal in order to detect correct pulses where multiple reflections are caused by irregularities in the pipe wall surface being measured.

    摘要翻译: 提供了用于使用超声波反射来测量管壁的厚度的新技术。 该装置包括信号处理器,其接收包含注入到管壁中的关于超声脉冲的信息的信号; 并且至少部分地基于分解所接收的信号来确定管壁厚度测量,以便使用小波分析使用倒谱分析或重复间隔来识别峰。 小波分析包括将接收到的信号中的数据划分成特定频率分量和定义的时间分量,以便检测正在测量的管壁表面中的不规则性导致多次反射的正确脉冲。 倒谱分析包括处理信号中的重复脉冲,以便检测正在测量的管壁表面中由不规则性引起多次反射的脉冲。

    FLOW AND PIPE MANAGEMENT USING VELOCITY PROFILE MEASUREMENT AND/OR PIPE WALL THICKNESS AND WEAR MONITORING
    6.
    发明申请
    FLOW AND PIPE MANAGEMENT USING VELOCITY PROFILE MEASUREMENT AND/OR PIPE WALL THICKNESS AND WEAR MONITORING 有权
    流量和管道管理使用速度曲线测量和/或管壁厚度和磨损监测

    公开(公告)号:US20110056298A1

    公开(公告)日:2011-03-10

    申请号:US12922261

    申请日:2009-03-16

    IPC分类号: G01N29/04

    摘要: The present invention provides new techniques for non-invasive and real-time measurement of the velocity profile of slurry flow in horizontal pipes, as well as the measurement and trending of pipe wear on slurry lines. In the first case, this information can be used to determine the approach and onset of solid deposition on the bottom of the pipe. Having this information in real time can enable operation at lower velocities or higher solids concentration or both while avoiding solids deposition or plugging and their associated operational costs. In the second case, the present invention uses a permanently or semi-permanently installed ring of conformable ultrasonic transducers clamped onto the outside of the pipe. These transducers are used to measure the thickness of the pipe under their respective locations.

    摘要翻译: 本发明提供了用于非侵入式和实时测量水平管道中浆料流速度分布的新技术,以及浆料管线上管道磨损的测量和趋势。 在第一种情况下,该信息可用于确定管道底部固体沉积的方法和开始。 实时获得这些信息可以使运行速度更低,固体浓度更高,同时避免固体沉积或堵塞及其相关的运营成本。 在第二种情况下,本发明使用永久地或半永久地安装的适配超声波换能器的环夹在管的外部。 这些传感器用于测量管道在各自位置下的厚度。

    APPARATUS AND METHOD FOR MEASURING A FLUID FLOW PARAMETER WITHIN AN INTERNAL PASSAGE OF AN ELONGATED BODY
    7.
    发明申请
    APPARATUS AND METHOD FOR MEASURING A FLUID FLOW PARAMETER WITHIN AN INTERNAL PASSAGE OF AN ELONGATED BODY 审中-公开
    测量流体流动参数的装置和方法

    公开(公告)号:US20100251829A1

    公开(公告)日:2010-10-07

    申请号:US12817842

    申请日:2010-06-17

    申请人: Michael A. Davis

    发明人: Michael A. Davis

    IPC分类号: G01F1/66

    摘要: A method and apparatus for measuring at least one parameter of a fluid flowing through an internal passage of an elongated body is provided. The internal passage is disposed between a first wall and a second wall, and the first wall and the second wall each include an interior surface and an exterior surface. The method includes the steps of providing an array of at least two ultrasonic sensor units, operating the sensor units to transmit ultrasonic signals at one or more frequencies substantially coincident with at least one frequency at which the transmitted ultrasonic signals resonate within the first wall, receiving the ultrasonic signals with the sensor units, and processing the received ultrasonic signals to measure the at least one parameter of fluid flow within the internal passage.

    摘要翻译: 提供一种用于测量流过细长体的内部通道的流体的至少一个参数的方法和装置。 内部通道设置在第一壁和第二壁之间,并且第一壁和第二壁各自包括内表面和外表面。 所述方法包括以下步骤:提供至少两个超声波传感器单元的阵列,操作所述传感器单元以一个或多个频率发射超声波信号,所述超声波信号基本上与所述发射的超声波信号在所述第一壁内谐振的至少一个频率重合,接收 所述超声波信号与所述传感器单元相关联,并且处理所接收的超声波信号以测量所述内部通道内的流体流动的所述至少一个参数。

    Data management and processing system for large enterprise model and method therefor
    8.
    发明授权
    Data management and processing system for large enterprise model and method therefor 有权
    大型企业数据管理与处理系统模型及方法

    公开(公告)号:US07424481B2

    公开(公告)日:2008-09-09

    申请号:US11048949

    申请日:2005-02-01

    IPC分类号: G06F17/40

    摘要: A computer system performs data processing using a data organizer which parses a primary set of data into predefined sets of data components according to one or more enterprise models. The sets of data components from the data organizer are respectively stored in multiple data sources. The data components may be stored as a binary file or hierarchical file. A plurality of data processing systems execute the enterprise models. A task manager controls which enterprise model executes on each data processing system. The data processing systems access the data components from the data sources which correspond the executing enterprise model. The data components are sent over dedicated communication channels to the data processing systems. Each data processing system may have a data interface, which is configured to receive data from different sources and convert the data into a standard format.

    摘要翻译: 计算机系统使用数据管理器执行数据处理,数据管理器根据一个或多个企业模型将主要数据集合解析为预定义的数据组集合。 来自数据管理器的数据组件集合分别存储在多个数据源中。 数据组件可以存储为二进制文件或分层文件。 多个数据处理系统执行企业模型。 任务管理器控制在每个数据处理系统上执行哪个企业模型。 数据处理系统从对应于执行企业模型的数据源访问数据组件。 数据组件通过专用通信信道发送到数据处理系统。 每个数据处理系统可以具有数据接口,其被配置为从不同的源接收数据并将数据转换成标准格式。

    Method and apparatus for determining a quality metric of a measurement of a fluid parameter
    9.
    发明授权
    Method and apparatus for determining a quality metric of a measurement of a fluid parameter 有权
    用于确定流体参数的测量的质量度量的方法和装置

    公开(公告)号:US07379828B2

    公开(公告)日:2008-05-27

    申请号:US11642007

    申请日:2006-12-19

    IPC分类号: G01F23/00 G06F19/00

    摘要: An apparatus for measuring a parameter of a fluid passing through a pipe includes a spatial array of at least two sensors disposed at different axial locations along the pipe. Each of the sensors provides a signal indicative of unsteady pressure within the pipe at a corresponding axial location of the pipe. A signal processor constructs at least a portion of a k-ω plot using the signals and detects at least one ridge in the k-ω plot. A slope of the at least one ridge is indicative of the parameter of the fluid. The signal processor determines a quality metric by comparing an accumulated energy (power) of k-ω pairs along the at least one ridge with an accumulated energy (power) of k-ω pairs along at least one ray extending in the k-ω plot. The quality metric is indicative of a quality of the at least one ridge.

    摘要翻译: 用于测量通过管道的流体的参数的装置包括设置在沿着管道的不同轴向位置处的至少两个传感器的空间阵列。 每个传感器提供在管道的相应轴向位置处指示管内不稳定压力的信号。 信号处理器使用该信号构建k-ω图的至少一部分并且检测k-ω图中的至少一个脊。 至少一个脊的斜率表示流体的参数。 所述信号处理器通过将沿着所述至少一个脊的k-ω对的累积能量(功率)与沿k-Ω图中延伸的至少一条光线的k-ω对的累积能量(功率)进行比较来确定质量度量 。 质量度量表示至少一个脊的质量。

    Optical system featuring chirped Bragg grating etalon for providing precise reference wavelengths
    10.
    发明授权
    Optical system featuring chirped Bragg grating etalon for providing precise reference wavelengths 有权
    具有啁啾Bragg光栅标准具的光学系统,用于提供精确的参考波长

    公开(公告)号:US07180601B1

    公开(公告)日:2007-02-20

    申请号:US09703823

    申请日:2000-11-01

    IPC分类号: G01B9/02

    摘要: An optical system has a broadband source and a chirped Bragg grating etalon. In operation, the broadband source provides a broadband optical signal. The chirped Bragg grating etalon responds to the broadband optical signal, for providing a chirped Bragg grating etalon optical signal having a precise set of the optical reference signals. The chirped Bragg grating etalon may include a pair of chirped Bragg gratings. The precise set of the optical reference signals is determined by the spacing of the chirped Bragg gratings of the chirped Bragg grating etalon. The precise set of the optical reference signals includes a series of peaks covering most of a source spectral width of the broad optical source signal with the power at the beginning and end of the spectrum passed unaffected by the chirped Bragg grating etalon due to the limited bandwidth thereof.

    摘要翻译: 光学系统具有宽带源和啁啾布拉格光栅标准具。 在操作中,宽带源提供宽带光信号。 啁啾的布拉格光栅标准具响应宽带光信号,用于提供具有精确的一组光参考信号的啁啾布拉格光栅标准具光信号。 啁啾的布拉格光栅标准具可以包括一对啁啾的布拉格光栅。 光学参考信号的精确集合由啁啾布拉格光栅标准具的啁啾布拉格光栅的间隔确定。 光学参考信号的精确集合包括覆盖宽光源信号的大部分源光谱宽度的一系列峰值,其中光谱开始和结束处的功率不受啁啾布拉格光栅标准具的影响,由于有限的带宽 其中。