公开(公告)号：US07561482B2

公开(公告)日：2009-07-14

申请号：US11470945

申请日：2006-09-07

申请人： Loc Tu ,  Wangang Tsai

发明人： Loc Tu ,  Wangang Tsai

IPC分类号： G11C29/00 ,  G11C7/00

CPC分类号： G11C29/76 ,  G11C29/82

摘要： A method and apparatus provide an improved identification and isolation of defective blocks in non-volatile memory devices having a plurality of user accessible blocks of non-volatile storage elements where each block also has an associated defective block latch. The method provides for sensing each defective block latch to determine whether the defective block latch was set due to a defect, and storing, in temporary on chip memory, address data corresponding to each set latch. The method further involves retrieving the address data and disabling defective blocks based upon the address data. A non-volatile memory device is also described having a controller which senses the defective block latches, stores address data for each block having a set latch, and subsequently retrieves the stored address data to set the defective block latches based upon the address data.

摘要翻译： 方法和装置提供了具有多个非易失性存储元件的多个用户可访问块的非易失性存储器件中的缺陷块的改进的识别和隔离，其中每个块还具有相关联的缺陷块锁存器。 该方法提供了感测每个缺陷块锁存器以确定由于缺陷而是否设置了缺陷块锁存器，并且在临时片上存储器中存储与每个锁存器对应的地址数据。 该方法还包括基于地址数据检索地址数据和禁用缺陷块。 还描述了一种非易失性存储器件，其具有感测缺陷块锁存器的控制器，存储具有设置锁存器的每个块的地址数据，并且随后检索存储的地址数据，以基于地址数据设置缺陷块锁存器。

公开(公告)号：US20080062761A1

公开(公告)日：2008-03-13

申请号：US11470945

申请日：2006-09-07

申请人： Loc Tu ,  Wangang Tsai

发明人： Loc Tu ,  Wangang Tsai

IPC分类号： G11C29/04

CPC分类号： G11C29/76 ,  G11C29/82

摘要： A method and apparatus provide an improved identification and isolation of defective blocks in non-volatile memory devices having a plurality of user accessible blocks of non-volatile storage elements where each block also has an associated defective block latch. The method provides for sensing each defective block latch to determine whether the defective block latch was set due to a defect, and storing, in temporary on chip memory, address data corresponding to each set latch. The method further involves retrieving the address data and disabling defective blocks based upon the address data. A non-volatile memory device is also described having a controller which senses the defective block latches, stores address data for each block having a set latch, and subsequently retrieves the stored address data to set the defective block latches based upon the address data.

摘要翻译： 方法和装置提供了具有多个非易失性存储元件的多个用户可访问块的非易失性存储器件中的缺陷块的改进的识别和隔离，其中每个块还具有相关联的缺陷块锁存器。 该方法提供了感测每个缺陷块锁存器以确定由于缺陷而是否设置了缺陷块锁存器，并且在临时片上存储器中存储与每个锁存器对应的地址数据。 该方法还包括基于地址数据检索地址数据和禁用缺陷块。 还描述了一种非易失性存储器件，其具有感测缺陷块锁存器的控制器，存储具有设置锁存器的每个块的地址数据，并且随后检索存储的地址数据，以基于地址数据设置缺陷块锁存器。