公开(公告)号：US20080234965A1

公开(公告)日：2008-09-25

申请号：US11690141

申请日：2007-03-23

申请人： MASARU GOISHI

发明人： MASARU GOISHI

IPC分类号： G06F19/00

CPC分类号： G01R31/31937 ,  G01R31/31922

摘要： A test apparatus for testing a device under test is provided. The test apparatus includes: a timing data output section for outputting timing data to define at least one of a timing of modifying a test signal provided to the device under test and a timing of acquiring an output signal outputted by the device under test; a variable delay circuit for delaying a reference clock pulse of the test apparatus by a delay amount corresponding to designated delay data so as to generate a timing signal having a transition point corresponding to the at least one timing; and a range modification section for modifying the modification amount of the delay data when the timing data are changed by one unit in response to a change of a setting range within which the at least one timing is set.

摘要翻译： 提供了一种用于测试被测设备的测试设备。 测试装置包括：定时数据输出部分，用于输出定时数据，以定义修改提供给被测设备的测试信号的定时和获取被测器件输出的输出信号的定时中的至少一个; 可变延迟电路，用于将测试装置的参考时钟脉冲延迟与指定的延迟数据相对应的延迟量，以产生具有与至少一个定时对应的转变点的定时信号; 以及范围修改部分，用于响应于设定了至少一个定时的设定范围的变化，当定时数据被改变一个单位时，修改延迟数据的修改量。

公开(公告)号：US20080232538A1

公开(公告)日：2008-09-25

申请号：US11688834

申请日：2007-03-20

申请人： MASARU GOISHI

发明人： MASARU GOISHI

IPC分类号： G01F15/06

CPC分类号： G01R31/31932 ,  G01R23/10 ,  G01R31/31922 ,  G01R31/31928

摘要： Provided is a test apparatus for testing a device under test, the test apparatus including: a pattern generator that generates an expected value pattern of an output signal of the device under test; a timing generator that generates a timing signal indicating a timing for acquiring the output signal of the device under test by delaying a reference clock; a comparator that acquires the output signal of the device under test at the timing designated by the timing signal and compares the acquired output signal to the expected value pattern; and a measurement circuit that starts operating at the timing designated by the timing signal and counts a number of pulses of the output signal of the device under test.

摘要翻译： 提供了一种用于测试被测设备的测试设备，该测试设备包括：产生被测设备的输出信号的期望值模式的模式发生器; 定时发生器，其通过延迟参考时钟产生指示用于获取被测器件的输出信号的定时的定时信号; 比较器，在由定时信号指定的定时获取被测器件的输出信号，并将获取的输出信号与期望值模式进行比较; 以及测量电路，其在由定时信号指定的定时开始运行，并对被测器件的输出信号的脉冲数进行计数。

公开(公告)号：US20080234969A1

公开(公告)日：2008-09-25

申请号：US11690140

申请日：2007-03-23

申请人： MASARU GOISHI

发明人： MASARU GOISHI

IPC分类号： G06F19/00

CPC分类号： G06F11/263 ,  G01R31/31928

摘要： There is provided a test apparatus for testing a device under test. The test apparatus includes first and second period generators that respectively generate test period signals indicating test periods for testing the device under test, a plurality of input/output sections that are provided in correspondence with a plurality of terminals of the device under test, wherein each of the plurality of input/output sections, in accordance with a test period supplied thereto, outputs a test signal to a corresponding one of the plurality of terminals and receives an output signal output from the corresponding terminal, and a plurality of selecting sections that are provided in correspondence with the plurality of input/output sections, wherein each of the plurality of selecting sections selects one of the test period signals generated by the first and second period generators so as to be supplied to a corresponding one of the plurality of input/output sections.

摘要翻译： 提供了一种用于测试被测设备的测试装置。 所述测试装置包括分别产生测试周期信号的第一和第二周期发生器，所述测试周期信号指示用于测试被测器件的测试周期;多个输入/输出部分，其与被测器件的多个端子相对应地设置，其中， 所述多个输入/输出部分根据所提供的测试周期将测试信号输出到所述多个终端中的对应的一个终端，并接收从相应的终端输出的输出信号，以及多个选择部分 与所述多个输入/输出部分相对应地设置，其中所述多个选择部分中的每一个选择由所述第一和第二周期发生器产生的测试周期信号中的一个，以被提供给所述多个输入/输出部分中的对应的一个， 输出部分。

公开(公告)号：US20100142383A1

公开(公告)日：2010-06-10

申请号：US12329635

申请日：2008-12-08

申请人： MASARU GOISHI ,  HIROYASU NAKAYAMA ,  MASARU TSUTO

发明人： MASARU GOISHI ,  HIROYASU NAKAYAMA ,  MASARU TSUTO

IPC分类号： H04L12/26

CPC分类号： H04L43/50 ,  G01R31/2834

摘要： Provided is a test apparatus that tests a device under test, comprising an upper sequencer that sequentially designates packets transmitted to and from the device under test, by executing a test program for testing the device under test; a packet data sequence storing section that stores a data sequence included in each of a plurality of types of packets; and a lower sequencer that reads, from the packet data sequence storing section, a data sequence of a packet designated by the upper sequencer and generates a test data sequence used for testing the device under test.

摘要翻译： 提供了一种测试被测设备的测试装置，包括：通过执行用于测试被测设备的测试程序，顺序指定从被测设备发送的分组的上位序器; 分组数据序列存储部，其存储包含在多种类型的分组中的数据序列; 以及从分组数据序列存储部分读取由上位序器指定的分组的数据序列并生成用于测试被测设备的测试数据序列的下定序器。