公开(公告)号：US09612196B2

公开(公告)日：2017-04-04

申请号：US15026866

申请日：2014-10-03

Applicant: MASSEY UNIVERSITY

Inventor： Mack Saraswat ,  John Andrew Harrison ,  Ralph Stefan Grand ,  Frazer Kingsley Noble ,  Lutz Robert Gehlen ,  Matthew Alan Woods ,  Sam Bartho

IPC: G01N21/00 ,  G01N21/51 ,  G01N21/59

CPC classification number: G01N21/51 ,  G01N21/49 ,  G01N21/5907 ,  G01N2201/0212 ,  G01N2201/0227

Abstract: The present invention relates to optical measurement devices and systems, and methods of using these systems and devices, and more particularly but not exclusively it relates to a system and apparatus adapted to measure optical properties in-situ.

公开(公告)号：US20160231242A1

公开(公告)日：2016-08-11

申请号：US15026866

申请日：2014-10-03

Applicant: MASSEY UNIVERSITY

Inventor： Mack Saraswat ,  John Andrew Harrison ,  Ralph Stefan Grand ,  Frazer Kingsley Noble ,  Lutz Robert Gehlen ,  Matthew Alan Woods ,  Sam Bartho

IPC: G01N21/51

CPC classification number: G01N21/51 ,  G01N21/49 ,  G01N21/5907 ,  G01N2201/0212 ,  G01N2201/0227

Abstract: The present invention relates to optical measurement devices and systems, and methods of using these systems and devices, and more particularly but not exclusively it relates to a system and apparatus adapted to measure optical properties in-situ.

Abstract translation: 本发明涉及光学测量装置和系统以及使用这些系统和装置的方法，更具体地但并非排他地涉及适于原位测量光学特性的系统和装置。