公开(公告)号：US20180202984A1

公开(公告)日：2018-07-19

申请号：US15405903

申请日：2017-01-13

Applicant: The United State of America, as represented by the Secretary of the Department of the Interior

Inventor： Karl B. Haase ,  Ward E. Sanford

IPC: G01N33/00 ,  G01N21/61 ,  G01N19/00

CPC classification number: G01N33/004 ,  G01N21/3504 ,  G01N33/0006 ,  G01N2201/0227

Abstract: The dissolved gas sensor system includes a dissolved gas sensor partially located within a housing and partially extending through the housing lid. The sensor is created by affixing a selectively permeable membrane to a dissolved gas transducer with a waterproof polymer. This forms a membrane cavity between the membrane, polymer, and transducer. The membrane cavity allows the transducer to detect whatever gas or gases can pass through the selectively permeable membrane. These readings pass to a controller located within the housing body that can receive and process data, and store the data in a removable data storage for later retrieval by a user. The controller can also regulate overall power consumption of the system to increase the operating life of the system.

公开(公告)号：US20180180540A1

公开(公告)日：2018-06-28

申请号：US15902010

申请日：2018-02-22

Applicant: FENWAL CONTROLS OF JAPAN, LTD.

Inventor： Masao Iguchi ,  Tadayuki Shibuya ,  Kanji Numao ,  Shintaro Masumoto

IPC: G01N21/53

CPC classification number: G01N21/53 ,  G01N2201/0227 ,  G08B17/10 ,  G08B17/107

Abstract: A photoelectric smoke sensor includes a housing having a circuit accommodation chamber, an inflow chamber provided in the housing, a light emitting portion provided in the inflow chamber, and a light receiving portion provided in the inflow chamber. The light emitting portion includes a first light and a first support portion surrounding the first light guide. The light receiving portion includes a second light guide and guiding the light to the light receiving element and a second support portion surrounding the second light guide. The first support portion and the second support portion are configured to prevent escape of a flame from the circuit accommodation chamber to the inflow chamber.

公开(公告)号：US20170284929A1

公开(公告)日：2017-10-05

申请号：US15477329

申请日：2017-04-03

Applicant: HORIBA, Ltd.

Inventor： Takeshi AKAMATSU ,  Yoshiyuki NAKAJIMA

IPC: G01N21/03 ,  G01N33/00 ,  G01N21/3504

CPC classification number: G01N21/0303 ,  G01N21/031 ,  G01N21/3504 ,  G01N33/0037 ,  G01N33/004 ,  G01N2021/3595 ,  G01N2201/0227 ,  G01N2201/0636 ,  Y02A50/245

Abstract: This invention is a multiple reflection type cell that makes it possible to reduce a dead space resulting from a position adjusting mechanism and to adjust the light to a desired optical path length without complicating a structure. The multiple reflection type cell comprises a cell body where a cell chamber is formed, two or more reflecting members that are mounted on the cell body and whose reflecting surfaces locate in the cell chamber, and a position adjusting mechanism that adjusts a position of the reflecting member relative to the cell body. The cell body has a mounting part that communicates the cell chamber and the outside and on which the reflecting members are mounted. A seal member that seals a gap between the cell chamber and the outside of the cell body is arranged between the reflecting member mounted on the mounting part and the cell body so that the gap between the cell chamber and the outsider of the cell body is sealed by the seal member.

公开(公告)号：US20170227468A1

公开(公告)日：2017-08-10

申请号：US15499244

申请日：2017-04-27

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Katsumi SHIBAYAMA ,  Masashi ITO ,  Takafumi YOKINO ,  Masaki HIROSE ,  Anna YOSHIDA ,  Kazuto OFUJI ,  Yoshihiro MARUYAMA

IPC: G01N21/65 ,  G01J3/02 ,  G01J3/44

CPC classification number: G01N21/658 ,  B82Y40/00 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/12 ,  G01J3/44 ,  G01J3/4412 ,  G01N2201/02 ,  G01N2201/0227 ,  G01N2201/06113

Abstract: A SERS unit comprises a substrate; an optical function part formed on the substrate, for generating surface-enhanced Raman scattering; and a package containing the optical function part in an inert space and configured to irreversibly expose the space.

公开(公告)号：US20140199778A1

公开(公告)日：2014-07-17

申请号：US14239330

申请日：2011-09-30

Applicant: Wei Wu ,  Zhiyong Li ,  Ansoon Kim ,  Min Hu ,  Michael Josef Stuke

Inventor： Wei Wu ,  Zhiyong Li ,  Ansoon Kim ,  Min Hu ,  Michael Josef Stuke

IPC: G01N31/22

CPC classification number: G01N31/22 ,  B01L3/5085 ,  B01L3/50853 ,  B01L2200/141 ,  B01L2300/0636 ,  B01L2300/069 ,  B01L2300/0819 ,  B82Y15/00 ,  G01N21/648 ,  G01N21/658 ,  G01N2201/0227 ,  G01N2201/023 ,  Y10T436/25

Abstract: Devices to detect a substance and methods of producing such a device are disclosed. An example device to detect a substance includes a housing defining an externally accessible chamber and a seal to enclose at least a portion of the chamber. The example device also includes a substrate includes nanoparticles positioned within the chamber. The nanoparticles to react to the substance when exposed thereto. The example device also includes a non-analytic solution within the chamber to protect the nanoparticles from premature exposure.

Abstract translation: 公开了检测物质的装置和制造这种装置的方法。 用于检测物质的示例性装置包括限定外部可触及室的壳体和用于封闭室的至少一部分的密封件。 该示例性装置还包括基底，其包括位于腔室内的纳米颗粒。 纳米颗粒暴露于物质时与物质反应。 该示例性装置还包括室内的非分析溶液以保护纳米颗粒免于过早曝光。

公开(公告)号：US20070127118A1

公开(公告)日：2007-06-07

申请号：US11670376

申请日：2007-02-01

Applicant: David Nilson ,  Brad Rice ,  Tamara Troy

Inventor： David Nilson ,  Brad Rice ,  Tamara Troy

IPC: G02B21/06

CPC classification number: G01N21/6456 ,  A01K1/031 ,  A61M16/104 ,  A61M16/18 ,  A61M16/202 ,  A61M2016/0039 ,  G01N2021/1787 ,  G01N2021/6463 ,  G01N2021/6471 ,  G01N2021/6484 ,  G01N2201/0227 ,  G01N2201/0826

Abstract: A macroscopic fluorescence illumination assembly is provided for use with an imaging apparatus with a light-tight imaging compartment. The imaging apparatus includes an interior wall defining a view port extending into the imaging compartment to enable viewing of a specimen contained therein. The illumination assembly includes a specimen support surface facing toward the view port of the imaging apparatus. The support surface defines a window portion that enables the passage of light there through. The window portion is selectively sized and dimensioned such that the specimen, when supported atop the support surface, can be positioned and seated over the window portion in a manner forming a light-tight seal substantially there between.

Abstract translation: 提供了一种宏观荧光照明组件，用于与具有不透光成像室的成像装置一起使用。 该成像设备包括限定了一个视图端口的内壁，该视图端口延伸到成像室中以使得能够观察其中容纳的样本。 照明组件包括面向成像设备的视口的样本支撑表面。 支撑表面限定了能够使光通过的窗口部分。 窗口部分被选择性地定尺寸和尺寸使得当被支撑在支撑表面上方时，样本可以以基本上在其之间形成不透光密封的方式被定位和安置在窗口部分上。

公开(公告)号：US20050231719A1

公开(公告)日：2005-10-20

申请号：US11151218

申请日：2005-06-13

Applicant: Allan Rosencwaig ,  Lanhua Wei

Inventor： Allan Rosencwaig ,  Lanhua Wei

IPC: G01J4/04 ,  G01N21/21 ,  G01N21/95 ,  H01L21/00 ,  H01L21/306 ,  H01L21/66

CPC classification number: H01L21/02046 ,  G01N21/211 ,  G01N21/9501 ,  G01N2201/0227 ,  G01N2201/023 ,  H01L21/02054 ,  H01L21/67028 ,  H01L21/67115 ,  H01L22/20

Abstract: A method for improving the measurement of semiconductor wafers is disclosed. In the past, the repeatability of measurements was adversely affected due to the unpredictable growth of a layer of contamination over the intentionally deposited dielectric layers. Repeatability can be enhanced by removing this contamination layer prior to measurement. This contamination layer can be effectively removed in a non-destructive fashion by subjecting the wafer to a cleaning step. In one embodiment, the cleaning is performed by exposing the wafer to microwave radiation. Alternatively, the wafer can be cleaned with a radiant heat source. These two cleaning modalities can be used alone or in combination with each other or in combination with other cleaning modalities. The cleaning step may be carried out in air, an inert atmosphere or a vacuum. Once the cleaning has been performed, the wafer can be measured using any number of known optical measurement systems.

Abstract translation: 公开了一种改善半导体晶片测量的方法。 在过去，由于在有意沉积的介电层上的污染层的不可预测的增长，测量的重复性受到不利影响。 在测量之前，通过去除这个污染层可以提高重复性。 通过使晶片进行清洁步骤，可以非破坏性地有效地去除该污染层。 在一个实施例中，通过将晶片暴露于微波辐射来进行清洁。 或者，可以用辐射热源清洁晶片。 这两种清洁方式可以单独使用或彼此组合使用或与其他清洁模式组合使用。 清洁步骤可以在空气，惰性气氛或真空中进行。 一旦执行了清洁，就可以使用任何数量的已知光学测量系统测量晶片。

公开(公告)号：US06843107B2

公开(公告)日：2005-01-18

申请号：US10641545

申请日：2003-08-15

Applicant: John W. Newman ,  Steve Thayer

Inventor： John W. Newman ,  Steve Thayer

IPC: G01M3/38 ,  G01M20060101 ,  G01M3/02 ,  G01M3/26 ,  G01M3/34 ,  G01M3/36 ,  G01N21/88

CPC classification number: G01M3/363 ,  G01N2201/0227 ,  G03H1/0443

Abstract: A system and method for leak testing a plurality of hermetic electronic packages of the type that have an internal chamber that is isolated from ambient conditions by a seal structure is advantageously designed to be able to calculate the leak rate of each individual device in a manner that is independent of structural manufacturing variances that typically exist within a sampling of such devices. The method preferably involves positioning a plurality of the hermetic electronic packages within a test area, and then stimulating the hermetic electronic packages with a modulated input of energy, such as by varying the ambient pressure about the devices. A property such as the physical position of one portion of a lid of each of the hermetic electronic packages is then sensed. The sensed property is one that is known to change as a first function of the modulated input of energy and also as a second function of pressure conditions within the hermetically sealed internal chamber. The first and second functions are linearly independent of each other. By comparing the stimulation of the devices to the sensed property and by discriminating using the two known functions a leak rate is determined for each individual device that is substantially independent of variances, such as differences in lid thickness that may exist between the different devices. Accordingly, an accurate determination of leak rate may be made with a minimum of calibration.

Abstract translation: 用于对具有通过密封结构与环境条件隔离的内部室的多个密封电子封装进行泄漏测试的系统和方法有利地设计成能够以下述方式计算每个单独设备的泄漏率： 独立于通常存在于这种设备的采样内的结构制造差异。 该方法优选地包括将多个密封电子封装定位在测试区域内，然后用调制的能量输入来刺激密封电子封装，例如通过改变围绕器件的环境压力。 然后感测诸如每个密封电子包装件的盖子的一部分的物理位置的属性。 感测的特性是已知的作为调制的能量输入的第一函数而变化的属性，并且还作为密封的内部腔室内的压力条件的第二函数。 第一和第二功能彼此线性独立。 通过将装置的刺激与感测到的属性进行比较，并且通过使用两个已知功能进行区分，确定每个单独装置的泄漏率基本上不依赖于方差，例如可能存在于不同装置之间的盖厚度的差异。 因此，可以用最小的校准来进行泄漏率的精确确定。

公开(公告)号：US20040057874A1

公开(公告)日：2004-03-25

申请号：US10253415

申请日：2002-09-25

Applicant: Riken Keiki Co., Ltd

Inventor： Tomoo Ishiguro

IPC: G01N021/17

CPC classification number: G01N21/45 ,  G01N21/031 ,  G01N2201/0227

Abstract: A frame is formed by forming in a base having at least three through-holes 2, 3 and 4 in the same cross section cavities 6 and 7 crossing said through-holes 2 to 5 at a given distance. A cell is formed by sealing an area sandwiched by said two cavities 6 and 7 with translucent sheets 8 and 9. Interference fringes are generated by sending two beams from a light-source element 19 into the cell through as parallel plane mirror 14 and reflecting the beams from the cell to a single spot on the parallel plane mirror 14 through a prism 15.

Abstract translation: 通过在具有至少三个通孔2,3和4的基座中形成框架，所述通孔2,3和4在相同的横截面空腔6和7中以给定距离与所述通孔2至5交叉。 通过用半透明片8和9密封由所述两个空腔6和7夹着的区域来形成电池。通过将来自光源元件19的两束光束通过作为平行平面镜14发射到电池中而产生干涉条纹， 通过棱镜15从单元到平行平面镜14上的单个光点的光束。

公开(公告)号：US20040057043A1

公开(公告)日：2004-03-25

申请号：US10641545

申请日：2003-08-15

Inventor： John W. Newman ,  Steve Thayer

IPC: G01N021/88

CPC classification number: G01M3/363 ,  G01N2201/0227 ,  G03H1/0443

Abstract: A system and method for leak testing a plurality of hermetic electronic devices of the type that have an internal chamber that is isolated from ambient conditions by a seal structure is advantageously designed to be able to calculate the leak rate of each individual device in a manner that is independent of structural manufacturing variances that typically exist within a sampling of such devices. The method preferably involves positioning a plurality of the hermetic electronic devices within a test area, and then stimulating the hermetic electronic devices with a modulated input of energy, such as by varying the ambient pressure about the devices. A property such as the physical position of one portion of a lid of each of the hermetic electronic devices is then sensed. The sensed property is one that is known to change as a first function of the modulated input of energy and also as a second function of pressure conditions within the hermetically sealed internal chamber. The first and second functions are linearly independent of each other. By comparing the stimulation of the devices to the sensed property and by discriminating using the two known functions a leak rate is determined for each individual device that is substantially independent of variances, such as differences in lid thickness that may exist between the different devices. Accordingly, an accurate determination of leak rate may be made with a minimum of calibration.

Abstract translation: 用于泄漏测试多个具有通过密封结构与环境条件隔离的内部室的密封电子设备的系统和方法有利地设计成能够以下列方式计算每个单独设备的泄漏率： 独立于通常存在于这种设备的采样内的结构制造差异。 该方法优选地包括将多个密封电子设备定位在测试区域内，然后利用调制的能量输入来刺激密封电子设备，例如通过改变围绕设备的环境压力。 然后感测诸如每个密封电子设备的盖子的一部分的物理位置的属性。 感测的特性是已知的作为调制的能量输入的第一函数而变化的属性，并且还作为密封的内部腔室内的压力条件的第二函数。 第一和第二功能彼此线性独立。 通过将装置的刺激与感测到的属性进行比较，并且通过使用两个已知功能进行区分，确定每个单独装置的泄漏率基本上不依赖于方差，例如可能存在于不同装置之间的盖厚度的差异。 因此，可以用最小的校准来进行泄漏率的精确确定。