公开(公告)号：US11496218B1

公开(公告)日：2022-11-08

申请号：US17306210

申请日：2021-05-03

Applicant: Mellanox Technologies, Ltd.

Inventor： Elad Mentovich ,  Itshak Kalifa ,  Hanan Shumacher ,  Yoram Zer ,  Yaakov Gridish ,  Eyal Waldman

IPC: H04B10/25 ,  H04B10/60 ,  H04B10/50 ,  H04B10/40 ,  H04B10/43 ,  H04B10/00

Abstract: Optical communication modules and associated methods and computer program products for performing network communication security are provided. An example optical module includes a substrate, a first optoelectronic component supported by the substrate configured for operation with optical signals having a first wavelength, and a second optoelectronic component supported by the substrate configured for operation with optical signals having a second wavelength. The module further includes an optical communication medium defining a first end in optical communication with the first optoelectronic component and the second optoelectronic component and a second end. The module also includes security circuitry operably connected with the first optoelectronic component and the second optoelectronic component. The security circuitry determines the presence of a noncompliant component coupled with the optical communication medium at the second end based upon operation of the second optoelectronic component.

公开(公告)号：US12224550B2

公开(公告)日：2025-02-11

申请号：US17156902

申请日：2021-01-25

Applicant: MELLANOX TECHNOLOGIES, LTD.

Inventor： Tali Septon ,  Itshak Kalifa ,  Elad Mentovich ,  Matan Galanty ,  Yaakov Gridish ,  Hanan Shumacher ,  Vadim Balakhovski ,  Juan Jose Vegas Olmos

IPC: H01S5/00

Abstract: A method and system for analyzing Vertical-Cavity Surface-Emitting Lasers (VCSELs) on a wafer are provided. An illustrative method of is provided that includes: applying a stimulus to each of the plurality of VCSELs on the wafer; measuring, for each of the plurality of VCSELs, two or more VCSEL parameters responsive to the stimulus; correlating the measured two or more VCSEL parameters to define a value of a common performance characteristic; and identifying clusters of VCSELs having similar values of the common performance characteristic. The clusters of VCSELs may be determined to collectively meet or not meet an optical performance requirement defined for the VCSELs on the wafer.

公开(公告)号：US11336374B1

公开(公告)日：2022-05-17

申请号：US17168488

申请日：2021-02-05

Applicant: Mellanox Technologies, Ltd.

Inventor： Yaakov Gridish ,  Lion Bassat ,  Elad Mentovich ,  Dimitrios Kalavrouziotis ,  Hanan Shumacher

IPC: H04B10/40

Abstract: Optical communication modules, optical communication cables, and associated methods of manufacturing are provided. An example optical communication module includes a substrate supporting a first optical transceiver and a second optical transceiver. The first optical transceiver includes a first optical transmitter that generates optical signals having a first wavelength and a first optical receiver that receives optical signals having a second wavelength. The second optical transceiver includes a second optical transmitter that generates optical signals having the second wavelength and a second optical receiver that receives optical signals having the first wavelength. One or more lens assemblies coupled with the respective transceivers may be used to direct optical signal generated by and directed to the respective transceivers.

公开(公告)号：US11955778B2

公开(公告)日：2024-04-09

申请号：US17156970

申请日：2021-01-25

Applicant: MELLANOX TECHNOLOGIES, LTD.

Inventor： Tali Septon ,  Itshak Kalifa ,  Elad Mentovich ,  Matan Galanty ,  Yaakov Gridish ,  Hanan Shumacher ,  Vadim Balakhovski ,  Juan Jose Vegas Olmos

IPC: H01S5/183 ,  H01S5/00 ,  H01S5/026 ,  H01S5/42

CPC classification number: H01S5/423 ,  H01S5/0014 ,  H01S5/0042 ,  H01S5/0261 ,  H01S5/18302

Abstract: A method and system for large scale Vertical-Cavity Surface-Emitting Laser (VCSEL) binning from wafers to be compatible with a Clock-Data Recovery Unit (CDRU) and/or a VCSEL driver are provided. An illustrative method of binning is provided that includes: for at least a portion of VCSELs on a wafer, measuring a set of representative parameters of the VCSELs, of predetermined DC or small-signal values, and sorting the measured VCSELs into clusters according to the measured set of representative parameters of the VCSELs; further sorting the clusters into sub-groups that comply with specifications of the VCSEL driver; and providing a feedback signal to the CDRU for equalizing control signals provided to the VCSEL driver.