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公开(公告)号：US20220239071A1
公开(公告)日：2022-07-28
申请号：US17156970
申请日：2021-01-25
Applicant: MELLANOX TECHNOLOGIES TLV LTD.
Inventor： Tali Septon , Itshak Kalifa , Elad Mentovich , Matan Galanty , Yaakov Gridish , Hanan Shumacher , Vadim Balakhovski , Juan Jose Vegas Olmos
Abstract: A method and system for large scale Vertical-Cavity Surface-Emitting Laser (VCSEL) binning from wafers to be compatible with a Clock-Data Recovery Unit (CDRU) and/or a VCSEL driver are provided. An illustrative method of binning is provided that includes: for at least a portion of VCSELs on a wafer, measuring a set of representative parameters of the VCSELs, of predetermined DC or small-signal values, and sorting the measured VCSELs into clusters according to the measured set of representative parameters of the VCSELs; further sorting the clusters into sub-groups that comply with specifications of the VCSEL driver; and providing a feedback signal to the CDRU for equalizing control signals provided to the VCSEL driver.
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公开(公告)号：US20220239056A1
公开(公告)日：2022-07-28
申请号：US17156902
申请日：2021-01-25
Applicant: MELLANOX TECHNOLOGIES TLV LTD.
Inventor： Tali Septon , Itshak Kalifa , Elad Mentovich , Matan Galanty , Yaakov Gridish , Hanan Shumacher , Vadim Balakhovski , Juan Jose Vegas Olmos
IPC: H01S5/00
Abstract: A method and system for analyzing Vertical-Cavity Surface-Emitting Lasers (VCSELs) on a wafer are provided. An illustrative method of is provided that includes: applying a stimulus to each of the plurality of VCSELs on the wafer; measuring, for each of the plurality of VCSELs, two or more VCSEL parameters responsive to the stimulus; correlating the measured two or more VCSEL parameters to define a value of a common performance characteristic; and identifying clusters of VCSELs having similar values of the common performance characteristic. The clusters of VCSELs may be determined to collectively meet or not meet an optical performance requirement defined for the VCSELs on the wafer.
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