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1.发明申请ERROR DETECTION OR CORRECTION OF A PORTION OF A CODEWORD IN A MEMORY DEVICE 审中-公开错误检测或校正存储器件中的编码器的一部分公开(公告)号：US20130326304A1
公开(公告)日：2013-12-05
申请号：US13959308
申请日：2013-08-05
Applicant: MICRON TECHNOLOGY, INC.
Inventor： Christopher Bueb , Sean Eilbert
IPC: H03M13/29
CPC classification number: H03M13/29 , H03M13/093
Abstract: Example embodiments described herein may relate error detection and correction on a portion of a codeword in a memory device.
Abstract translation: 这里描述的示例性实施例可以涉及存储器件中的码字的一部分上的错误检测和校正。
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