中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

6 records (took 0.011 seconds)

    Coordinate measuring machine and coordinate measuring program
    1.
    发明授权
    Coordinate measuring machine and coordinate measuring program 有权

    公开(公告)号：US11274945B2

    公开(公告)日：2022-03-15

    申请号：US16885922

    申请日：2020-05-28

    Applicant: MITUTOYO CORPORATION

    Inventor： Yo Terashita ,  Seiko Kunihiro ,  Hiroshi Kamitani ,  Mitsuru Fukuda

    IPC: G01D5/34 ,  G01D5/347

    Abstract: A coordinate measuring machine including a surface plate; a probe moving body; an INC pattern and ABS pattern along a moving direction of the probe moving body; an INC detector that outputs a plurality of waveform signals in accordance with the moving amount based on the INC pattern; an ABS detector that outputs an absolute position signal of the probe moving body based on the ABS pattern in response to a request signal; and a control device that has a INC counting portion that counts the waveform signals outputted by the INC detector; a position information obtaining portion that reads a counted value at a timing when a work is detected by a probe; and a presetting portion that emits the request signal to the ABS detector to obtain the absolute position signal, and presets the counting portion to this absolute position signal.

    Measurement device and measurement system
    2.
    发明授权
    Measurement device and measurement system 有权

    公开(公告)号：US10830568B2

    公开(公告)日：2020-11-10

    申请号：US16148326

    申请日：2018-10-01

    Applicant: MITUTOYO CORPORATION

    Inventor： Yuuto Karasawa ,  Mitsuru Fukuda ,  Kazumi Mizukami

    IPC: G01B5/008 ,  G01B21/04

    Abstract: An object of the present invention is to provide a measurement device and a measurement system which make it possible to obtain various pieces of driving information and realize accurate analysis of an operation state.A measurement device according to an embodiment comprises: a main body which comprises a probe having a gauge head which can be moved, in a relative manner, relative to an object to be measured, and a move mechanism for moving the gauge head; and a control section which controls driving of the move mechanism, and comprises a generation section for generating driving information of the main body, in association with identification information of the probe, in response to driving of the move mechanism, and a recording section for recording the driving information.

    Measuring apparatus and support mechanism of columnar work piece
    5.
    发明授权
    Measuring apparatus and support mechanism of columnar work piece 有权

    公开(公告)号：US10807206B2

    公开(公告)日：2020-10-20

    申请号：US15590283

    申请日：2017-05-09

    Applicant: MITUTOYO CORPORATION

    Inventor： Mitsuru Fukuda ,  Noritsugu Ono ,  Hirotada Anzai

    IPC: B23Q3/00 ,  G01B5/008 ,  B23Q3/06 ,  G01B21/02 ,  G01B21/04

    Abstract: Measuring apparatus includes an upper support supporting a first end of a columnar work piece in an axis direction, a lower support supporting a second end of the work piece in the axis direction, a probe measuring the work piece supported by the upper support and lower support, a rotary table coupled to the lower support and capable of rotating centered in the axis direction, and a post provided to the rotary table and mounting a first position determiner and a second position determiner so as to be switchable, the first and second position determiner determining a position of the work piece with respect to the rotary table. When a first columnar work piece as the work piece is supported by the upper support and lower support, the first position determiner is mounted to the post to determine a position by contacting the first work piece.

Patent Agency Ranking