公开(公告)号：US20210072168A1

公开(公告)日：2021-03-11

申请号：US17011411

申请日：2020-09-03

Applicant: MITUTOYO CORPORATION

Inventor： Seiji SASAKI ,  Nobuyuki NAKAZAWA ,  Hisayoshi SAKAI ,  Masato KON ,  Hidemitsu ASANO

IPC: G01N23/046 ,  G06T7/00

Abstract: A measurement X-ray CT apparatus calibrates a geometrical positional relationship between a focus of an X-ray source, an X-ray detector, and a rotation center of a rotating table in advance. The measurement X-ray CT apparatus then obtains projection images by irradiating the object to be measured with X-rays to perform a CT scan, and generates a three-dimensional image of the object to be measured by CT reconstruction of the projection images. The measurement X-ray CT apparatus further includes a reference frame that is made of a material and has a structure less susceptible to environmental changes, and sensors that are located on the reference frame and intended to successively obtain calibration values of the geometrical positional relationship between the focus of the X-ray source and the X-ray detector during the CT scan. The calibration values are used as parameters of the CT reconstruction.