CALIBRATION METHOD FOR X-RAY MEASURING DEVICE

    公开(公告)号:US20210404976A1

    公开(公告)日:2021-12-30

    申请号:US17360304

    申请日:2021-06-28

    Abstract: A calibration method for an X-ray measuring device includes mounting a calibration tool on a rotating table, identifying centroid positions from an output of an X-ray image detector, calculating projection transformation matrixes from the centroid positions and known relative positional intervals, repeating to identify the centroid positions from the output of the X-ray image detector and to calculate the projection transformation matrixes from the centroid positions and known relative positional intervals while the rotating table is rotated twice or more by a predetermined angle, and calculating a rotation center position of the rotating table on the basis of the projection transformation matrixes. The calibration method thereby allows easy calculation of the rotation center position of the rotating table on which an object to be measured is mounted in a rotatable manner, with the simple process.

    AUTOMATIC MEASURING SYSTEMS AND CONTROL METHOD FOR AUTOMATIC MEASURING SYSTEMS

    公开(公告)号:US20240346694A1

    公开(公告)日:2024-10-17

    申请号:US18631483

    申请日:2024-04-10

    Abstract: An automatic measuring system includes a measuring sensor tool that detects a surface of an object to be measured to measure a dimension or a shape of the object to be measured, a moving mechanism that relatively moves the measuring sensor tool with respect to the object to be measured, and an observation camera that images the object to be measured. A position and an orientation (posture) of a point to be measured are acquired from image data obtained by imaging the object to be measured by the observation camera, the measuring sensor tool is caused by the moving mechanism to approach the point to be measured, taking into account a position and posture offset between the observation camera and the measuring sensor tool, and a measurement value of the point to be measured is acquired by the measuring sensor tool.

    AUTOMATIC MEASURING SYSTEM AND CONTROL METHOD FOR AUTOMATIC MEASURING SYSTEM

    公开(公告)号:US20240345116A1

    公开(公告)日:2024-10-17

    申请号:US18630618

    申请日:2024-04-09

    CPC classification number: G01N35/0099 G01B3/008 G01B5/12 G01N35/00584

    Abstract: There is provided an automatic measuring system that can automate measurement and a control method for automatic measurement. An automatic measuring system includes a measuring sensor tool that detects a surface of an object to be measured with a probe to measure a dimension or a shape of the object to be measured, and a multi-axis moving mechanism that relatively moves the measuring sensor tool with respect to the object to be measured. The measuring sensor tool includes a cover part to protect the probe. In an approaching step in which the moving mechanism causes the measuring sensor tool to approach a point to be measured of the object to be measured, the cover part accommodates the probe inside the cover part. After the approaching step is completed, the probe is exposed from the cover part to detect the surface of the object to be measured.

    MEASUREMENT X-RAY CT APPARATUS
    4.
    发明申请

    公开(公告)号:US20210072168A1

    公开(公告)日:2021-03-11

    申请号:US17011411

    申请日:2020-09-03

    Abstract: A measurement X-ray CT apparatus calibrates a geometrical positional relationship between a focus of an X-ray source, an X-ray detector, and a rotation center of a rotating table in advance. The measurement X-ray CT apparatus then obtains projection images by irradiating the object to be measured with X-rays to perform a CT scan, and generates a three-dimensional image of the object to be measured by CT reconstruction of the projection images. The measurement X-ray CT apparatus further includes a reference frame that is made of a material and has a structure less susceptible to environmental changes, and sensors that are located on the reference frame and intended to successively obtain calibration values of the geometrical positional relationship between the focus of the X-ray source and the X-ray detector during the CT scan. The calibration values are used as parameters of the CT reconstruction.

    CALIBRATION METHOD OF X-RAY MEASURING DEVICE

    公开(公告)号:US20210072022A1

    公开(公告)日:2021-03-11

    申请号:US17014308

    申请日:2020-09-08

    Abstract: A calibration method of an X-ray measuring device includes: a front-stage feature position calculation step of parallelly moving spheres disposed in N places a plurality of times, and identifying centroid positions ImPos(1 to Q)_Dis(1 to M)_Sphr_(1 to N) of projected images of the spheres in the N places; an individual matrix calculation step of calculating an individual projection matrix PPj (j=1 to Q) for each of the spheres; an individual position calculation step of calculating moving positions Xb of the spheres on the basis of the individual projection matrix PPj (j=1 to Q); a coordinate integration step of calculating specific relative position intervals X(1 to N) of the spheres; a rear-stage feature position calculation step; a transformation matrix calculation step of calculating a projective transformation matrix Hk (k=1 to Q); a rotation detection step; a position calculation step; and a center position calculation step.

    CALIBRATION METHOD OF X-RAY MEASURING DEVICE

    公开(公告)号:US20210068777A1

    公开(公告)日:2021-03-11

    申请号:US17015618

    申请日:2020-09-09

    Abstract: A calibration method of an X-ray measuring device includes: mounting a calibration tool on a rotating table; a moving position acquisition step of parallelly moving a position of an j-th sphere with respect to a position of a first sphere, irradiating the calibration tool with an X-ray, and acquiring, form an output of an X-ray image detector, a moving position Mj where the magnitude of a differential position Erj of a centroid position ImDisjh_Sphr_j of a projected image of the j(2≤j≤N)-th sphere with respect to a centroid position ImDis1_Sphr_1 of a projected image of the first sphere becomes equal to or less than a specified value Vx; a relative position calculation step of performing the moving position acquisition step on the remaining spheres a feature position calculation step; a transformation matrix calculation step; a rotation detection step; a position calculation step; and a center position calculation step.

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