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    MEASUREMENT X-RAY CT APPARATUS
    1.
    发明申请
    MEASUREMENT X-RAY CT APPARATUS 有权

    公开(公告)号：US20210072168A1

    公开(公告)日：2021-03-11

    申请号：US17011411

    申请日：2020-09-03

    Applicant: MITUTOYO CORPORATION

    Inventor： Seiji SASAKI ,  Nobuyuki NAKAZAWA ,  Hisayoshi SAKAI ,  Masato KON ,  Hidemitsu ASANO

    IPC: G01N23/046 ,  G06T7/00

    Abstract: A measurement X-ray CT apparatus calibrates a geometrical positional relationship between a focus of an X-ray source, an X-ray detector, and a rotation center of a rotating table in advance. The measurement X-ray CT apparatus then obtains projection images by irradiating the object to be measured with X-rays to perform a CT scan, and generates a three-dimensional image of the object to be measured by CT reconstruction of the projection images. The measurement X-ray CT apparatus further includes a reference frame that is made of a material and has a structure less susceptible to environmental changes, and sensors that are located on the reference frame and intended to successively obtain calibration values of the geometrical positional relationship between the focus of the X-ray source and the X-ray detector during the CT scan. The calibration values are used as parameters of the CT reconstruction.

    METHOD AND APPARATUS FOR GENERATING MEASUREMENT PLAN FOR MEASURING X-RAY CT
    2.
    发明申请
    METHOD AND APPARATUS FOR GENERATING MEASUREMENT PLAN FOR MEASURING X-RAY CT 审中-公开

    公开(公告)号：US20190287274A1

    公开(公告)日：2019-09-19

    申请号：US16299513

    申请日：2019-03-12

    Applicant: MITUTOYO CORPORATION

    Inventor： Kozo ARIGA ,  Gyokubu CHO ,  Hidemitsu ASANO ,  Masato KON

    IPC: G06T11/00 ,  G01N23/046

    Abstract: When generating a measurement plan for measuring X-ray CT that performs X-ray irradiation while rotating a test object, and in doing so acquires projection image data, reconstructs volume data from the projection image data, and measures a targeted measurement location in the volume data, the present invention calculates required measurement accuracy and a measurement field of view range based on tolerance information included in CAD data of the test object and a measurement location on the test object defined by a measurement operator ahead of time, and automatically generates, from this information, an optimized measurement plan that minimizes the number of measurements.

    X-RAY CT MEASURING APPARATUS AND CALIBRATION METHOD THEREOF
    4.
    发明申请
    X-RAY CT MEASURING APPARATUS AND CALIBRATION METHOD THEREOF 审中-公开

    公开(公告)号：US20190223826A1

    公开(公告)日：2019-07-25

    申请号：US16250201

    申请日：2019-01-17

    Applicant: MITUTOYO CORPORATION

    Inventor： Hidemitsu ASANO ,  Masato KON

    IPC: A61B6/00 ,  A61B6/03 ,  G01T7/00 ,  G01N23/046

    Abstract: An X-ray CT measuring apparatus configured to emit an X-ray from an X-ray source while rotating a subject arranged on a rotary table, and obtain a tomographic image of the subject by reconstructing projection images, includes an X-ray fluctuation calibration jig arranged in an X-ray field of view, a detection unit configured to detect fluctuations in an X-ray focal position by using an X-ray projected image of the X-ray fluctuation calibration jig, and a correction unit configured to correct an X-ray projection image of the subject by using the detected fluctuations in the X-ray focal position.

    EDGE DETECTION BIAS CORRECTION VALUE CALCULATION METHOD, EDGE DETECTION BIAS CORRECTION METHOD, AND EDGE DETECTION BIAS CORRECTING PROGRAM
    7.
    发明申请
    EDGE DETECTION BIAS CORRECTION VALUE CALCULATION METHOD, EDGE DETECTION BIAS CORRECTION METHOD, AND EDGE DETECTION BIAS CORRECTING PROGRAM 审中-公开
    边缘检测偏差校正值计算方法，边缘检测偏差校正方法和边缘检测偏差校正程序

    公开(公告)号：US20160295207A1

    公开(公告)日：2016-10-06

    申请号：US15085027

    申请日：2016-03-30

    Applicant: MITUTOYO CORPORATION

    Inventor： Hiroyuki YOSHIDA ,  Akira TAKADA ,  Makoto KAIEDA ,  Gyokubu CHO ,  Koichi KOMATSU ,  Hidemitsu ASANO ,  Takashi HANAMURA ,  Takuho MAEDA ,  Isao TOKUHARA

    IPC: H04N17/00 ,  G06T7/00

    CPC classification number: G06T7/0085 ,  G01B11/022 ,  H04N5/142

    Abstract: A distance in a scanning direction between a first set of edges which face each other and exhibit an opposite change between light and dark is measured by an image measuring machine, and a bias correction value is calculated based on a difference between a measured value and a true value. Using the bias correction value, detection point correction values, which are correction values in various directions of edge detection points detected by a scan of a measured object using the image measuring machine, are calculated; a correction amount used in correction of the edge detection points is specified based on the detection point correction value in each direction; and the edge detection points are corrected using the correction amount.

    Abstract translation: 通过图像测量机测量第一组边缘彼此面对并且在暗和暗之间呈现相反变化的扫描方向上的距离，并且基于测量值和 真实价值。 使用偏置校正值，计算作为通过使用图像测量机的被测对象的扫描检测出的边缘检测点的各个方向的校正值的检测点校正值; 基于各方向的检测点校正值来指定用于边缘检测点的校正的校正量; 并且使用校正量校正边缘检测点。

    CALIBRATION METHOD AND APPARATUS FOR MEASUREMENT X-RAY CT APPARATUS, MEASUREMENT METHOD AND APPARATUS USING THE SAME, AND MEASUREMENT X-RAY CT APPARATUS
    8.
    发明申请
    CALIBRATION METHOD AND APPARATUS FOR MEASUREMENT X-RAY CT APPARATUS, MEASUREMENT METHOD AND APPARATUS USING THE SAME, AND MEASUREMENT X-RAY CT APPARATUS 有权

    公开(公告)号：US20210085279A1

    公开(公告)日：2021-03-25

    申请号：US17024061

    申请日：2020-09-17

    Applicant: MITUTOYO CORPORATION

    Inventor： Hidemitsu ASANO ,  Masato KON

    IPC: A61B6/00 ,  A61B6/04 ,  A61B6/03

    Abstract: Volume data is generated by performing a CT scan with a spherical calibration jig having known dimensions in contact with an object. A profile of the surface shape of the object in the volume data is obtained, and a boundary surface of the spherical calibration jig is calculated from the center coordinates of the spherical calibration jig. A correction value for adjusting a boundary surface of the object determined from the gradient of the profile to the boundary surface of the spherical calibration jig is determined, and the boundary surface of the object is corrected by using the correction value. The shape of the object is determined by using the corrected boundary surface. The precision of measurement X-ray CT can thus be increased by accurately detecting the boundary surface of the object.

    MEASURING X-RAY CT APPARATUS AND PRODUCTION WORK PIECE MEASUREMENT METHOD
    9.
    发明申请
    MEASURING X-RAY CT APPARATUS AND PRODUCTION WORK PIECE MEASUREMENT METHOD 审中-公开

    公开(公告)号：US20190277780A1

    公开(公告)日：2019-09-12

    申请号：US16291699

    申请日：2019-03-04

    Applicant: MITUTOYO CORPORATION

    Inventor： Hidemitsu ASANO ,  Masato KON

    IPC: G01N23/083 ,  G01N23/046

    Abstract: When measuring a mass-produced work piece using a measuring X-ray CT apparatus, which is configured to emit X-rays while rotating a work piece that is arranged on a rotary table and to reconstruct a projection image thereof to generate volume data of the work piece, the present invention assigns values to volume data for a predetermined work piece and stores the same as master data; obtains volume data for a mass-produced work piece under identical conditions to the predetermined work piece; measures the volume data and obtains an X-ray CT measured value for the mass-produced work piece; and corrects the X-ray CT measured value for the mass-produced work piece using the master data.

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