X-ray inspection system
    1.
    发明授权
    X-ray inspection system 有权
    X光检查系统

    公开(公告)号:US07356117B2

    公开(公告)日:2008-04-08

    申请号:US11020038

    申请日:2004-12-23

    IPC分类号: G01N23/04

    摘要: The X-ray inspection system 10 comprises an X-ray electron conversion face 42 for converting an entered X-ray image transmitted through the measurement object into an electronic image, an output fluorescent face 46 for emitting fluorescence when an electronic image is entered, and deflecting means 44 which is installed between the X-ray electron conversion face 42 and output fluorescent face 46, wherein the electronic image which was entered and converted at the X-ray electron conversion face 42 is converged into a predetermined area on the output fluorescent face 46 by the deflecting means 44 so as to make the X-ray fluoroscopic image of the moving measurement object stand still on the output fluorescent face 46. By this, the image of the measurement object can be captured during the time when the X-ray fluorescence image is standing still, so sensitivity can be secured while increasing the resolution.

    摘要翻译: X射线检查系统10包括用于将通过测量对象传输的输入的X射线图像转换为电子图像的X射线电子转换面42,用于在输入电子图像时发射荧光的输出荧光面46,以及 偏转装置44安装在X射线电子转换面42和输出荧光面46之间,其中在X射线电子转换面42处进入和转换的电子图像会聚到输出荧光面上的预定区域 以使得移动测量对象的X射线透视图像仍然停留在输出荧光面46上。 由此,可以在X射线荧光图像静止的时间期间捕获测量对象的图像,因此可以在提高分辨率的同时确保灵敏度。

    X-ray inspection system
    2.
    发明申请
    X-ray inspection system 有权
    X光检查系统

    公开(公告)号:US20050100130A1

    公开(公告)日:2005-05-12

    申请号:US11020038

    申请日:2004-12-23

    摘要: The X-ray inspection system 10 comprises an X-ray electron conversion face 42 for converting an entered X-ray image transmitted through the measurement object into an electronic image, an output fluorescent face 46 for emitting fluorescence when an electronic image is entered, and deflecting means 44 which is installed between the X-ray electron conversion face 42 and output fluorescent face 46, wherein the electronic image which was entered and converted at the X-ray electron conversion face 42 is converged into a predetermined area on the output fluorescent face 46 by the deflecting means 44 so as to make the X-ray fluoroscopic image of the moving measurement object stand still on the output fluorescent face 46. By this, the image of the measurement object can be captured during the time when the X-ray fluorescence image is standing still, so sensitivity can be secured while increasing the resolution.

    摘要翻译: X射线检查系统10包括用于将通过测量对象传输的输入的X射线图像转换为电子图像的X射线电子转换面42,用于在输入电子图像时发射荧光的输出荧光面46,以及 偏转装置44安装在X射线电子转换面42和输出荧光面46之间,其中在X射线电子转换面42处进入和转换的电子图像会聚到输出荧光面上的预定区域 以使得移动测量对象的X射线透视图像仍然停留在输出荧光面46上。 由此,可以在X射线荧光图像静止的时间期间捕获测量对象的图像,因此可以在提高分辨率的同时确保灵敏度。

    X-ray inspection system
    3.
    发明授权
    X-ray inspection system 有权
    X光检查系统

    公开(公告)号:US06876722B2

    公开(公告)日:2005-04-05

    申请号:US10257004

    申请日:2001-04-06

    IPC分类号: G01N23/04 G01N23/223

    摘要: The X-ray inspection system 10 comprises an X-ray electron conversion face 42 for converting an entered X-ray image transmitted through the measurement object into an electronic image, an output fluorescent face 46 for emitting fluorescence when an electronic image is entered, and deflecting means 44 which is installed between the X-ray electron conversion face 42 and output fluorescent face 46, wherein the electronic image which was entered and converted at the X-ray electron conversion face 42 is converged into a predetermined area on the output fluorescent face 46 by the deflecting means 44 so as to make the X-ray fluoroscopic image of the moving measurement object stand still on the output fluorescent face 46. By this, the image of the measurement object can be captured during the time when the X-ray fluorescence image is standing still, so sensitivity can be secured while increasing the resolution.

    摘要翻译: X射线检查系统10包括用于将通过测量对象传输的输入的X射线图像转换为电子图像的X射线电子转换面42,用于在输入电子图像时发射荧光的输出荧光面46,以及 偏转装置44安装在X射线电子转换面42和输出荧光面46之间,其中在X射线电子转换面42处进入和转换的电子图像会聚到输出荧光面上的预定区域 以使得移动测量对象的X射线荧光透视图像静止在输出荧光面46上。由此,可以在X射线的时间期间捕获测量对象的图像 荧光图像静止不动,因此可以在提高分辨率的同时确保敏感度。