公开(公告)号：US06259531B1

公开(公告)日：2001-07-10

申请号：US09333043

申请日：1999-06-15

申请人： Makoto Takamiya ,  Hidejiro Kadowaki ,  Kou Ishizuka ,  Yasushi Kaneda

发明人： Makoto Takamiya ,  Hidejiro Kadowaki ,  Kou Ishizuka ,  Yasushi Kaneda

IPC分类号： G01B902

CPC分类号： G01S17/58 ,  G01D5/34707 ,  G01P3/366

摘要： An apparatus for detecting the displacement information of an object has a light source, a diffraction grating for diffracting a light beam from the light source so that the light beam diffracted by the diffraction grating is incident on the object, and a photodetector for detecting the light from the object caused upon the incidence of the light beam thereon by the diffraction grating. Information regarding the relative displacement to the object along a predetermined direction is detected on the basis of a light detection signal from the photodetector. The diffraction grating is formed so that the light beam applied to the object may be condensed on the object in a direction in which the relative displacement to the object cannot be detected by the signal from the photodetector.

摘要翻译： 用于检测物体的位移信息的装置具有光源，用于衍射来自光源的光束的衍射光栅，使得被衍射光栅衍射的光束入射到物体上，以及用于检测光的光电检测器 由衍射光栅在其上的光束的入射引起的物体。 基于来自光电检测器的光检测信号来检测关于沿着预定方向到物体的相对位移的信息。 衍射光栅被形成为使得施加到物体的光束可以在物体上沿着与来自光电检测器的信号不能检测到物体的相对位移的方向上会聚在物体上。

公开(公告)号：US6005667A

公开(公告)日：1999-12-21

申请号：US897548

申请日：1997-07-21

申请人： Makoto Takamiya ,  Kou Ishizuka

发明人： Makoto Takamiya ,  Kou Ishizuka

IPC分类号： G01D5/38 ,  G11B5/55 ,  G11B5/596 ,  G01B9/02

CPC分类号： G11B5/5526 ,  G01D5/38 ,  G11B5/59605 ,  G11B5/59677

摘要： This invention relates to an apparatus for optically measuring the relative displacement of an object with a diffraction grating, and the apparatus has a light projection system for spot-projecting a light beam onto the diffraction grating and light detection means for receiving an interference light beam obtained by multiplexing diffracted light beams of different orders from the spot projection position on the diffraction grating in a state in which the wavefronts of the diffracted light beams are matched with each other. The relative displacement of the object is measured upon light reception of the light detection means.

摘要翻译： 本发明涉及一种用于光学测量物体与衍射光栅的相对位移的装置，该装置具有用于将光束点投影到衍射光栅上的光投影系统和用于接收获得的干涉光束的光检测装置 通过在衍射光束的波前彼此匹配的状态下将不同阶数的衍射光束与衍射光栅上的点投影位置进行多路复用。 在光检测装置的光接收时测量物体的相对位移。

公开(公告)号：US06631047B2

公开(公告)日：2003-10-07

申请号：US09156491

申请日：1998-09-18

申请人： Kou Ishizuka ,  Hidejiro Kadowaki ,  Naoki Kawamata ,  Hiroyuki Hagiwara ,  Makoto Takamiya ,  Shigeki Kato ,  Hiroyuki Shiomi

发明人： Kou Ishizuka ,  Hidejiro Kadowaki ,  Naoki Kawamata ,  Hiroyuki Hagiwara ,  Makoto Takamiya ,  Shigeki Kato ,  Hiroyuki Shiomi

IPC分类号： G11B5596

CPC分类号： G11B5/59677

摘要： An apparatus having a first system for forming a composite light beam of two light beams to be made to interfere with each other, a splitting member for amplitude-splitting the composite light beam into three or more split light beams in the same area, and a second system for obtaining interference light beams of different phases from the plurality of split light beams. Also, an apparatus for effecting information recording on a hard disc drive device comprising an (i) optical system for splitting a light beam into two light beams, causing one of the two light beams to be condensed and reflected by the side of an arm for a recording reading head in the hard disc drive device, and superposing the condensed and reflected light beam on the other light beam to thereby obtain a composite light beam, (ii) a splitting member for amplitude-splitting the composite light beam into three or more split light beams in the same area, (iii) an optical member for obtaining interference light beams of different phases from the plurality of split light beams, (iv) light receiving elements for detecting respective ones of the interference light beams of different phases, (v) a control system for effecting the positioning of the arm on the basis of the result of the detection by each of the light receiving elements, and (vi) a signal writing-in system for writing a signal into a hard disc through the recording reading head each time the arm is positioned.

摘要翻译： 一种具有第一系统的装置，用于形成要彼此干涉的两个光束的复合光束，用于将复合光束分解成同一区域中的三个或更多个分束光束的分束构件，以及 用于从多个分裂光束获得不同相位的干涉光束的第二系统。 另外，一种用于在硬盘驱动装置上进行信息记录的装置，包括：（i）用于将光束分成两束光束的光学系统，使得两个光束中的一个被臂的侧面冷凝和反射， 在所述硬盘驱动装置中的记录读取头，并且将所述聚光反射光束重叠在所述另一光束上，从而获得复合光束;（ii）用于将所述复合光束分解为三个以上的分割部件 在相同的区域中分割光束，（iii）用于从多个分裂光束获得不同相位的干涉光束的光学部件，（iv）用于检测不同相位的干涉光束的各个的光接收元件（ v）用于根据每个光接收元件的检测结果来实现臂的定位的控制系统，以及（vi）用于写入信号的信号写入系统 每当手臂定位时，通过记录读取头进入硬盘。

公开(公告)号：US6151185A

公开(公告)日：2000-11-21

申请号：US923528

申请日：1997-09-04

申请人： Kou Ishizuka ,  Hidejiro Kadowaki ,  Makoto Takamiya

发明人： Kou Ishizuka ,  Hidejiro Kadowaki ,  Makoto Takamiya

IPC分类号： G11B5/596 ,  G11B5/55 ,  G01B11/00

CPC分类号： G11B5/59627 ,  G11B5/59633

摘要： An apparatus for detecting position change information of an object includes a contact member for contacting the object, and a detecting unit for obtaining position change information of the object by detecting a change in force applied from the object to the contact member.

摘要翻译： 一种用于检测物体的位置变化信息的装置包括用于接触物体的接触构件和用于通过检测从物体施加到接触构件的力的变化来获得物体的位置变化信息的检测单元。

公开(公告)号：US5742391A

公开(公告)日：1998-04-21

申请号：US579347

申请日：1995-12-27

申请人： Yasushi Kaneda ,  Kou Ishizuka ,  Kenji Hisamoto

发明人： Yasushi Kaneda ,  Kou Ishizuka ,  Kenji Hisamoto

IPC分类号： G01D5/30 ,  G01B11/00 ,  G01D5/36 ,  G01D5/38 ,  G01B9/02

CPC分类号： G01D5/38

摘要： An optical type sensor has a light emitting element, a light receiving element, at least one optical element acting on a light beam emitted from the light emitting element, in an optical path till the light beam enters the light receiving element, and a spacer member disposed to define a spacing between the light emitting element and/or the light receiving element and the at least one optical element, the spacer member having a structure for being mounted to other member.

摘要翻译： 光学型传感器具有发光元件，光接收元件，至少一个作用在从发光元件发射的光束上的光学元件，直到光束进入光接收元件的光路中，以及间隔元件 设置成限定发光元件和/或光接收元件与至少一个光学元件之间的间隔，间隔元件具有用于安装到其它元件的结构。

公开(公告)号：US06831267B2

公开(公告)日：2004-12-14

申请号：US09780433

申请日：2001-02-12

申请人： Kou Ishizuka

发明人： Kou Ishizuka

IPC分类号： H01J314

CPC分类号： G01D5/38

摘要： A light beam emitted from a semiconductor-laser light source is projected onto a diffraction-grating scale after passing through a collimator lens, a beam splitter and a central portion of an annular reflection grating. Two diffracted light beams reflected from the diffraction-grating scale are projected onto the annular reflection grating. The annular reflection grating diffracts the light beams projected onto all portions thereon to a substantially original direction to be projected onto and diffracted from the same position on the diffraction-grating scale. The diffracted light beams are superposed and the resultant light beam is returned to the beam splitter. The light beam is guided by the beam splitter in a direction different from the semiconductor-laser light source, and is detected by a photosensor as an interference light beam. Even if the oscillation wavelength of the semiconductor-laser light source changes, for example, due to a change in the temperature environment, to change the diffraction angles of the diffracted light beams, the light beams are diffracted with original diffraction angles by the annular reflection grating, the position of rediffraction by the diffraction-grating scale and the state of emitted light beams are invariable. Hence, the state of interference is stable.

摘要翻译： 从半导体激光光源射出的光束经过准直透镜，分束器和环形反射光栅的中心部分投影到衍射光栅刻度上。 从衍射光栅标尺反射的两个衍射光束被投射到环形反射光栅上。 环形反射光栅将投影到其上的所有部分上的光束衍射到基本上原始的方向上，以投影到衍射光栅标尺上的相同位置并衍射。 衍射光束被重叠，所得到的光束返回到分束器。 光束由分束器沿与半导体激光光源不同的方向引导，并被光电传感器检测为干涉光束。 即使半导体激光光源的振荡波长例如由于温度环境的变化而变化，为了改变衍射光束的衍射角，光束以原始的衍射角被环形反射衍射 光栅，通过衍射光栅标度的再衍射位置和发射光束的状态是不变的。 因此，干扰状态是稳定的。

公开(公告)号：US5067813A

公开(公告)日：1991-11-26

申请号：US334197

申请日：1989-04-06

申请人： Kou Ishizuka ,  Tetsuharu Nishimura ,  Masaaki Tsukiji ,  Satoshi Ishii

发明人： Kou Ishizuka ,  Tetsuharu Nishimura ,  Masaaki Tsukiji ,  Satoshi Ishii

IPC分类号： G01D5/34 ,  G01D5/38

CPC分类号： G01D5/344 ,  G01D5/38

摘要： Disclosed is an optical apparatus which can be used for measuring displacement of an object. The apparatus includes an optical system for forming a linearly polarized beam whose polarization direction changes, a reflecting surface for reflecting the beam and for directing the beam in a predetermined direction, a photoelectric converter for photoelectrically converting a reflected beam directed in the predetermined direction, a polarizing device, arranged in an optical path of the reflected beam, for directing only a P-polarized beam or an S-polarized beam of the reflected beam toward the photoelectric converter.

摘要翻译： 公开了一种可用于测量物体的位移的光学装置。 该装置包括用于形成偏振方向变化的线性偏振光束的光学系统，用于反射光束并用于沿预定方向引导光束的反射表面，用于光电转换沿预定方向指向的反射光束的光电转换器， 偏振装置，布置在反射光束的光路中，用于仅将反射光束的P偏振光束或S偏振光束引向光电转换器。

公开(公告)号：US06999179B2

公开(公告)日：2006-02-14

申请号：US10915348

申请日：2004-08-11

申请人： Kou Ishizuka

发明人： Kou Ishizuka

IPC分类号： G01B9/02 ,  G01D5/34

CPC分类号： G01D5/38

摘要： A light beam emitted from a semiconductor-laser light source is projected onto a diffraction-grating scale after passing through a collimator lens, a beam splitter and a central portion of an annular reflection grating. Two diffracted light beams reflected from the diffraction-grating scale are projected onto the annular reflection grating. The annular reflection grating diffracts the light beams projected onto all portions thereon to a substantially original direction to be projected onto and diffracted from the same position on the diffraction-grating scale. The diffracted light beams are superposed and the resultant light beam is returned to the beam splitter. The light beam is guided by the beam splitter in a direction different from the semiconductor-laser light source, and is detected by a photosensor as an interference light beam. Even if the oscillation wavelength of the semiconductor-laser light source changes, for example, due to a change in the temperature environment, to change the diffraction angles of the diffracted light beams, the light beams are diffracted with original diffraction angles by the annular reflection grating, the position of rediffraction by the diffraction-grating scale and the state of emitted light beams are invariable. Hence, the state of interference is stable.

摘要翻译： 从半导体激光光源射出的光束经过准直透镜，分束器和环形反射光栅的中心部分投影到衍射光栅刻度上。 从衍射光栅标尺反射的两个衍射光束被投射到环形反射光栅上。 环形反射光栅将投影到其上的所有部分上的光束衍射到基本上原始的方向上，以投射到衍射光栅标尺上的相同位置并衍射。 衍射光束被重叠，所得到的光束返回到分束器。 光束由分束器沿与半导体激光光源不同的方向引导，并被光电传感器检测为干涉光束。 即使半导体激光光源的振荡波长例如由于温度环境的变化而变化，为了改变衍射光束的衍射角，光束以原始的衍射角被环形反射衍射 光栅，通过衍射光栅标度的再衍射位置和发射光束的状态是不变的。 因此，干扰状态是稳定的。

公开(公告)号：US5663794A

公开(公告)日：1997-09-02

申请号：US601694

申请日：1996-02-15

申请人： Kou Ishizuka

发明人： Kou Ishizuka

IPC分类号： F02B75/02 ,  G01B11/00 ,  G01D5/36 ,  G01D5/38 ,  G61B9/02

CPC分类号： G01D5/38 ,  F02B2075/027

摘要： An apparatus for detecting displacement information is disclosed. The apparatus is provided with a scale arranged on the side of an object of which relative displacement information is to be detected, a periodic signal generation diffraction grating formed at a predetermined pitch, and a predetermined data recording portion formed independently of the periodic signal generation and diffraction grating for detecting displacement information, a first detection system for irradiating a light beam onto the periodic signal generation diffraction grating to generate diffracted light, the first detection system forming a periodic signal corresponding to a displacement relative to the scale by detecting interference light of the diffracted light generated by the periodic signal generation diffraction grating, and a second detection system for optically detecting the predetermined data recording portion. The predetermined data recording portion also has a diffraction grating.

摘要翻译： 公开了一种用于检测位移信息的装置。 该装置设置有布置在要检测相对位移信息的对象侧的刻度，以预定间距形成的周期性信号生成衍射光栅和独立于周期性信号产生形成的预定数据记录部分，以及 用于检测位移信息的衍射光栅，用于将光束照射到周期性信号产生衍射光栅上以产生衍射光的第一检测系统，所述第一检测系统通过检测所述衍射光的干涉光来形成对应于相对于标尺的位移的周期信号 由周期信号产生衍射光栅产生的衍射光，以及用于光学检测预定数据记录部分的第二检测系统。 预定数据记录部分也具有衍射光栅。

公开(公告)号：US20050007598A1

公开(公告)日：2005-01-13

申请号：US10915348

申请日：2004-08-11

申请人： Kou Ishizuka

发明人： Kou Ishizuka

IPC分类号： G01D5/38 ,  G02B5/18 ,  G02B5/30 ,  G01B9/02

CPC分类号： G01D5/38

摘要： A light beam emitted from a semiconductor-laser light source is projected onto a diffraction-grating scale after passing through a collimator lens, a beam splitter and a central portion of an annular reflection grating. Two diffracted light beams reflected from the diffraction-grating scale are projected onto the annular reflection grating. The annular reflection grating diffracts the light beams projected onto all portions thereon to a substantially original direction to be projected onto and diffracted from the same position on the diffraction-grating scale. The diffracted light beams are superposed and the resultant light beam is returned to the beam splitter. The light beam is guided by the beam splitter in a direction different from the semiconductor-laser light source, and is detected by a photosensor as an interference light beam. Even if the oscillation wavelength of the semiconductor-laser light source changes, for example, due to a change in the temperature environment, to change the diffraction angles of the diffracted light beams, the light beams are diffracted with original diffraction angles by the annular reflection grating, the position of rediffraction by the diffraction-grating scale and the state of emitted light beams are invariable. Hence, the state of interference is stable.

摘要翻译： 从半导体激光光源射出的光束经过准直透镜，分束器和环形反射光栅的中心部分投影到衍射光栅刻度上。 从衍射光栅标尺反射的两个衍射光束被投射到环形反射光栅上。 环形反射光栅将投影到其上的所有部分上的光束衍射到基本上原始的方向，以投影到衍射光栅标尺上的相同位置并衍射。 衍射光束被重叠，所得到的光束返回到分束器。 光束由分束器沿与半导体激光光源不同的方向引导，并被光电传感器检测为干涉光束。 即使半导体激光光源的振荡波长例如由于温度环境的变化而变化，为了改变衍射光束的衍射角，光束以原始的衍射角被环形反射衍射 光栅，通过衍射光栅标度的再衍射位置和发射光束的状态是不变的。 因此，干扰状态是稳定的。