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公开(公告)号：US06659812B2
公开(公告)日：2003-12-09
申请号：US10126558
申请日：2002-04-19
IPC分类号： H01R1122
CPC分类号： G01R1/0416 , G01R31/2818
摘要： A surface mount probe point socket has a housing with base and a socket extending from the base. The base has a length and width sufficient for attaching the housing to a circuit trace using an electrically conductive material while adding minimal inductance and capacitance to the circuit trace. The socket has a height and diameter for supporting a measurement probe in the housing while adding minimal inductance and capacitance to the measurement probe. A probe point contact is disposed in the bore of the socket for receiving a probe point disposed in the end of the measurement probe to secure the probe in the housing. Two surface mount probe point sockets may be joined together with an alignment gage and attached to adjacent circuit traces to produce a surface mount probe point socket system for differential measurement probes.
摘要翻译： 表面安装探头点插座具有带底座的壳体和从基座延伸的插座。 基座具有足够的长度和宽度，用于使用导电材料将壳体附接到电路迹线，同时向电路迹线增加最小的电感和电容。 插座具有高度和直径，用于在外壳中支撑测量探头，同时向测量探头增加最小的电感和电容。 探针点触点设置在插座的孔中，用于接收设置在测量探针末端的探针点，以将探头固定在壳体中。 两个表面安装探头点插座可以使用对准量规连接在一起，并连接到相邻的电路迹线，以产生用于差分测量探针的表面安装探头点插座系统。
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2.发明授权公开(公告)号：US07056134B2
公开(公告)日：2006-06-06
申请号：US10856230
申请日：2004-05-27
申请人： Jim L. Martin , Marc A. Gessford , William R. Pooley , William Q. Law , Ira G. Pollock , William A. Hagerup
发明人： Jim L. Martin , Marc A. Gessford , William R. Pooley , William Q. Law , Ira G. Pollock , William A. Hagerup
IPC分类号： G01R31/02
CPC分类号： G01R1/06788 , G01R1/06711 , G01R1/06772
摘要： A attachable/detachable probing tip system (10) has a housing (12) that includes a probing tip mounting member (14) and opposing substantially orthogonal attachment (16, 18) arms extending from the probing tip mounting member. The attachment arms define an inner surface of the probing tip mounting member in which is disposed at least a first a non-compressive set, resilient member (56). First and second probing tips (42, 44) are disposed over the non-compressive, resilient member (56) and secured to the housing by latching means (60, 66, 92, 96, 100, 130). The attachable/detachable probing tip system allows mounting of the probing tips (42, 44) to probing contacts on a device under test without a probe body or probing tip member (38) being attached. The attachment arms (16, 18) allows a probe body or probing tip member (38) to be attached and detached to the probing tip system (10). The probing tip member (38) includes contact pins that engage contact areas (82, 82, 92) of the probing tips (42, 44).
摘要翻译： 可附接/可拆卸探测尖端系统（10）具有壳体（12），该壳体包括探测尖端安装构件（14）和从探测尖端安装构件延伸的相对的基本正交的附件（16,18）臂。 连接臂限定探测尖端安装构件的内表面，其中至少设置有第一非压缩组合弹性构件（56）。 第一和第二探测尖端（42,44）设置在非压缩弹性构件（56）上方并且通过锁定装置（60,66,92,96,100,130）固定到壳体。 可附接/可拆卸探测尖端系统允许将探测尖端（42,44）安装在被测设备上的探测触点上，而无需探测主体或探测尖端部件（38）被附接。 附接臂（16,18）允许探针主体或探测尖端构件（38）被附接并分离到探测尖端系统（10）。 探测尖端构件（38）包括接合引脚，其接合探测尖端（42,44）的接触区域（82,82,92）。
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公开(公告)号：US06600330B1
公开(公告)日：2003-07-29
申请号：US10047558
申请日：2002-01-11
IPC分类号： G01R3102
CPC分类号： G01R1/06788
摘要： A probe head holder for a measurement probe head has a probe head mount and a highly elastic, high hoop strength retention member that flexibly secures the measurement probe head to the probe head holder. The probe head mount has a first surface adapted to receive the measurement probe head and a second surface extending from the first surface having at least a first groove formed therein normal to the first surface. The retention member is positioned around the holder and the probe head with a portion of the retention member being disposed in the groove. The probe head holder may be attached to a probe arm of a probing station.
摘要翻译： 用于测量探针头的探针头支架具有探针头安装座和高度弹性的高箍强度保持构件，其将测量探头头部灵活地固定到探头头架上。 探针头安装件具有适于容纳测量探针头的第一表面和从第一表面延伸的第二表面，其中至少第一凹槽垂直于第一表面形成。 保持构件围绕保持器定位并且探针头具有保持构件的一部分设置在凹槽中。 探针头支架可以连接到探测台的探针臂。
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公开(公告)号：US06614221B2
公开(公告)日：2003-09-02
申请号：US10150397
申请日：2002-05-17
申请人： Kelly F. Cushing , Mark W. Nightingale , John F. Stoops , John C. Calvin , Marc A. Gessford , Marie Ottum
发明人： Kelly F. Cushing , Mark W. Nightingale , John F. Stoops , John C. Calvin , Marc A. Gessford , Marie Ottum
IPC分类号： G01R3102
CPC分类号： G01R31/31922 , G01R1/0408 , G01R1/06772
摘要： A deskew fixture has a multilayer circuit board from which pairs of mirrored signal launch contact extend from both sides of the circuit board. One pair of contacts is coupled to electrical ground and the other pair is connected via equal length, electromagnetically coupled strip lines to a signal source. Probe holders are mounted on the circuit boards to support measurement probes with the probing contacts of the measurement probes coupled to the signal launch contacts. Additional pairs of signal launch contacts may be provided with one pair receiving a positive signal from the signal source and another pair receiving a negative signal via equal length, electromagnetically coupled strip lines from the signal source for deskewing differential measurement probes.
摘要翻译： 一种偏移固定装置具有多层电路板，成对的镜像信号发射接触件从电路板的两侧延伸出来。 一对触点耦合到电接地，另一对触点通过等长的电磁耦合带状线连接到信号源。 探头支架安装在电路板上，以支持测量探头，测量探头的探头触点连接到信号发射触点。 可以提供附加的信号发射接点对，其中一对从信号源接收正信号，另一对通过相等长度接收负信号，从信号源的电磁耦合带状线用于偏移校正差分测量探针。
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公开(公告)号：US06400167B1
公开(公告)日：2002-06-04
申请号：US09668753
申请日：2000-09-22
IPC分类号： G01R3102
CPC分类号： G01R1/06788 , G01R1/0416 , G01R1/06705 , G01R1/06738
摘要： A probe tip adapter for a measurement probe has at least a first electrically conductive element with a bore at one end and a probing contact formed on the other end. The bore of the electrically conductive element has an electrically conductive elastomer disposed therein having sufficient tensile strength, compression set, hardness, deflection force, elongation and percent recovery for repeatably securing the electrically conductive element to the probing tip of the measurement probe. An element holder is positionable on the measurement probe and has a cavity formed in one end for receiving the measurement probe. At least a first bore is formed in the other end of the element holder extending to the cavity and aligned with the probing tip of the measurement probe. The electrically conductive element is positioned in the holder bore such that the probing tip penetrates the elastomer and the probing contact extends from the holder. The probing contact may be configured as a probing tip having a shaft that tapers at one end to a point and as a square pin adapter with a bore formed in the electrically conductive element that receives a spring contact. The probe tip adapter is useable with both single ended and differential measurement probes.
摘要翻译： 用于测量探头的探针尖端适配器具有至少第一导电元件，其一端具有孔，另一端形成探测触点。 导电元件的孔具有设置在其中的导电弹性体，其具有足够的拉伸强度，压缩永久变形，硬度，偏转力，伸长率和百分比恢复，用于将导电元件重复地固定到测量探针的探测尖端。 元件保持器可定位在测量探针上，并且在一端形成有用于接收测量探针的空腔。 至少第一孔形成在元件保持器的另一端延伸到空腔并与测量探针的探测尖端对准。 导电元件定位在保持器孔中，使得探针尖端穿透弹性体，并且探测接触件从保持器延伸。 探测触点可以被配置为具有在一端到一点渐缩的轴的探针尖端，以及具有形成在导电元件中形成的接收弹簧触点的孔的方形销适配器。 探头尖适配器可用于单端和差分测量探头。
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公开(公告)号：US06603297B1
公开(公告)日：2003-08-05
申请号：US09668750
申请日：2000-09-22
IPC分类号： G01R3102
CPC分类号： G01R1/06738 , G01R1/06788
摘要： A probe tip adapter for a measurement probe has at least a first electrically conductive element with a bore at one end and a probing contact formed on the other end. The bore of the electrically conductive element has an electrically conductive elastomer disposed therein having sufficient tensile strength, compression set, hardness, deflection force, elongation and percent recovery for repeatably securing the electrically conductive element to the probing tip of the measurement probe. The probing contact may be configured as a probing tip having a shaft that tapers at one end to a point and as a square pin adapter with a bore formed in the electrically conductive element that receives a spring contact. The probe tip adapter is useable with both single ended and differential measurement probes.
摘要翻译： 用于测量探头的探针尖端适配器具有至少第一导电元件，其一端具有孔，另一端形成探测触点。 导电元件的孔具有设置在其中的导电弹性体，其具有足够的拉伸强度，压缩永久变形，硬度，偏转力，伸长率和百分比恢复，用于将导电元件重复地固定到测量探针的探测尖端。 探测触点可以被配置为具有在一端到一点渐缩的轴的探针尖端，以及具有形成在导电元件中形成的接收弹簧触点的孔的方形销适配器。 探头尖适配器可用于单端和差分测量探头。
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公开(公告)号：US06191594B1
公开(公告)日：2001-02-20
申请号：US08738861
申请日：1996-10-28
IPC分类号： G01R104
CPC分类号： G01R1/0425
摘要： A probe adapter for coupling probe tip contacts of a electrical measurement probe to leads of a surface mounted integrated circuit IC device has an insulating housing from which extend first and second flexible electrically conductive leads having a pitch geometry compatible with the leads of the IC device. First and second electrical contacts, respectively coupled to the first and second flexible electrically conductive leads, are disposed in the housing and have a pitch geometry compatible with the probe tip contacts of the electrical measurement probe.
摘要翻译： 用于将电测量探针的探针尖端触点耦合到表面安装的集成电路IC器件的引线的探针适配器具有绝缘壳体，第一和第二柔性导电引线具有与IC器件的引线相容的节距几何形状。 分别耦合到第一和第二柔性导电引线的第一和第二电触点设置在壳体中并且具有与电测量探针的探针尖端触点相容的俯仰几何形状。
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公开(公告)号：USD672722S1
公开(公告)日：2012-12-18
申请号：US29423687
申请日：2012-06-04
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公开(公告)号：USD684928S1
公开(公告)日：2013-06-25
申请号：US29416952
申请日：2012-03-28
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公开(公告)号：USD663269S1
公开(公告)日：2012-07-10
申请号：US29369994
申请日：2010-09-16
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