Measurement apparatus and techniques for ultrashort events using
electron photoemission with a superlinear photoemission active element
    1.
    发明授权
    Measurement apparatus and techniques for ultrashort events using electron photoemission with a superlinear photoemission active element 失效
    使用具有超线性光电子发射活性元件的电子发光的超短事件的测量装置和技术

    公开(公告)号:US5308971A

    公开(公告)日:1994-05-03

    申请号:US8478

    申请日:1993-01-25

    CPC classification number: G01J11/00 G04F13/02

    Abstract: Method and apparatus for measuring the time of short events, such as characteristics of a source of short radiation pulses or lifetime of excited states of a sample. The method and apparatus is based on a multi-step photoemission process from an active element target exhibiting superlinear photoemission. A short prompt radiation pulse is used to raise electrons to an excited state, and a following overlapping short probe pulse is used to raise the excited electrons to the vacuum level where they leave the sample, changing its charge state. The number of escaped electrons is measured as a function of the time delay between the prompt and probe pulses to provide the sought after information. Preferably, the charged target is suspended or supported in an electric field, and the voltage needed to restore the charge-changed target to its original position is used.

    Abstract translation: 用于测量短时间的时间的方法和装置,例如短辐射脉冲源的特征或样品的激发态的寿命。 该方法和装置基于表现出超级线性光电子发射的活性元素靶的多步光电子发射过程。 使用短暂的辐射脉冲将电子提升到激发态,并且使用以下重叠的短探针脉冲将激发的电子升高到它们离开样品的真空水平,从而改变其电荷状态。 测量逃逸电子的数量作为提示和探测脉冲之间的时间延迟的函数,以提供所追求的信息。 优选地,充电目标被悬挂或支撑在电场中,并且使用将电荷改变的目标恢复到其原始位置所需的电压。

    Apparatus and Method for Heating an Infrared-Initiated Splice Seal
    2.
    发明申请
    Apparatus and Method for Heating an Infrared-Initiated Splice Seal 有权
    用于加热红外线接头密封件的装置和方法

    公开(公告)号:US20070196082A1

    公开(公告)日:2007-08-23

    申请号:US11674209

    申请日:2007-02-13

    CPC classification number: H02G1/14 H02G1/128 H05B3/0061 H05B2203/032

    Abstract: An apparatus for heating a splice seal includes structural members defining a heating area that receives a splice seal. At least one of the structural members is moveable between an open position and a closed position. At least one heat source is arranged in the heating area. The heat source directs infrared radiation toward the splice seal when the structural member is in the closed position. At least one cooling device cools the heating area when the structural member is in the closed position.A method for heating a splice seal includes providing structural members that define a heating area; supporting the splice seal in the heating area; directing infrared radiation toward the splice seal; and cooling the heating area with a cooling device simultaneously with directing the infrared radiation toward the splice seal.

    Abstract translation: 用于加热接头密封件的装置包括限定接收接合密封件的加热区域的结构构件。 结构构件中的至少一个可在打开位置和关闭位置之间移动。 至少一个热源布置在加热区域中。 当结构构件处于关闭位置时,热源将红外辐射引导到接头密封。 当结构构件处于关闭位置时,至少一个冷却装置冷却加热区域。 用于加热接合密封件的方法包括提供限定加热区域的结构构件; 支撑加热区域的拼接密封; 将红外辐射导向拼接密封; 并且用冷却装置同时冷却加热区域,同时将红外辐射引向接头密封。

    Apparatus and method for heating an infrared-initiated splice seal
    3.
    发明授权
    Apparatus and method for heating an infrared-initiated splice seal 有权
    用于加热红外引发的接头密封的装置和方法

    公开(公告)号:US07565067B2

    公开(公告)日:2009-07-21

    申请号:US11674209

    申请日:2007-02-13

    CPC classification number: H02G1/14 H02G1/128 H05B3/0061 H05B2203/032

    Abstract: An apparatus for heating a splice seal includes structural members defining a heating area that receives a splice seal. At least one of the structural members is moveable between an open position and a closed position. At least one heat source is arranged in the heating area. The heat source directs infrared radiation toward the splice seal when the structural member is in the closed position. At least one cooling device cools the heating area when the structural member is in the closed position.

    Abstract translation: 用于加热接头密封件的装置包括限定接收接合密封件的加热区域的结构构件。 结构构件中的至少一个可在打开位置和关闭位置之间移动。 至少一个热源布置在加热区域中。 当结构构件处于关闭位置时,热源将红外辐射引导到接头密封。 当结构构件处于关闭位置时,至少一个冷却装置冷却加热区域。

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