公开(公告)号：US06697163B2

公开(公告)日：2004-02-24

申请号：US09761638

申请日：2001-01-18

申请人： Masahiro Fukuda ,  Hitoshi Kamezawa ,  Kyouichi Hirouchi

发明人： Masahiro Fukuda ,  Hitoshi Kamezawa ,  Kyouichi Hirouchi

IPC分类号： G01B1124

CPC分类号： G01B11/245

摘要： A shape measuring apparatus for measuring an outer surface of a measurement object, includes: a photo-sensor unit including two photo-sensors each provided with a number of pixels, first and second signal processing sections which executes combination processing to light reception signals outputted from the photo-sensors. The first signal processing section includes a corrector for correcting errors of light reception signals from one photo-sensor with respect to light reception signals from another photo-sensor in the incident direction or the direction perpendicular to the incident direction based on the relative displacement stored in the displacement memory. The second signal processing section includes a corrector for correcting the relative displacement by delaying the sending of the reception signals from one photo-sensor with respect to the sending of the reception signals from another photo-sensor. The first and second signal processing sections are selectively changed over.

摘要翻译： 一种用于测量被测物体的外表面的形状测量装置，包括：光电传感器单元，包括两个光电传感器，每个光电传感器均设有多个像素;第一和第二信号处理部分，对从 光电传感器。 第一信号处理部分包括校正器，用于相对于来自另一光传感器的入射方向的光接收信号或垂直于入射方向的方向校正来自一个光电传感器的光接收信号的误差，基于存储在入射方向上的相对位移 位移记忆。 第二信号处理部分包括一个校正器，用于相对于来自另一个光电传感器的接收信号的发送延迟来自一个光电传感器的接收信号的发送来校正相对位移。 选择性地切换第一和第二信号处理部分。

公开(公告)号：US06778172B2

公开(公告)日：2004-08-17

申请号：US09932936

申请日：2001-08-21

申请人： Koji Harada ,  Hitoshi Kamezawa ,  Yoshihisa Abe

发明人： Koji Harada ,  Hitoshi Kamezawa ,  Yoshihisa Abe

IPC分类号： G06T1500

CPC分类号： G06T17/20

摘要： The apparatus sets a standard surface or a standard line with respect to three-dimensional shape data comprising polygons representing an object in a space where the three-dimensional shape data exist, extracts from the three-dimensional shape data polygons having inclination angles with respect to the set standard surface or the set standard line in a predetermined range, and set each collection of the extracted polygons as an extracted surface. Further, the apparatus displays each of the collection of extracted polygons as a surface on a display with putting a color or pattern to each of the collection of the polygons extracted correspondingly to one of the set inclination angles that is different from those of other collections of polygons.

摘要翻译： 该装置相对于包含存在三维形状数据的空间中的对象的多边形的三维形状数据设置标准表面或标准线，从具有相对于三维形状数据的倾斜角度的三维形状数据多边形中提取 设定的标准面或设定的标准线在规定的范围内，将所提取的多边形的各集合设定为提取面。 此外，该装置将所提取的多边形的集合中的每一个作为显示器上的表面显示，并将颜色或图案放置到相应于与其他集合的集合的集合倾斜角度不同的多边形集合中的每一个 多边形

公开(公告)号：US4986665A

公开(公告)日：1991-01-22

申请号：US227999

申请日：1988-08-03

申请人： Akio Yamanishi ,  Hitoshi Kamezawa ,  Takao Sakai ,  Sadafusa Tsuji ,  Mitsunobu Ota

发明人： Akio Yamanishi ,  Hitoshi Kamezawa ,  Takao Sakai ,  Sadafusa Tsuji ,  Mitsunobu Ota

IPC分类号： G01N21/31 ,  G01N21/63 ,  G01N21/84

CPC分类号： G01N21/3151 ,  G01N2021/3181 ,  G01N2021/635 ,  G01N2021/8466 ,  G01N2201/0621

摘要： An optical density detector which comprises a first light source for emitting a first light which belongs to a wavelength region in which the first light is hardly absorbed by a specific material contained in a sample, a second light source for emitting a second light which belongs to a wavelength region in which the second light is absorbed, substantially as compared with the first light, by the specific material, wherein a peak-wavelength of the second light is shifted by change of a temperature and change of an absorption of the specific material caused by the peak-wavelength shift is characteristic of a linear equation with a gentle grade, light receiving device for measuring a quantity of the first and the second lights which are transmitted through the sample, an arithmetic unit for calculating difference of absorbance between the first light and the second light of which both change depending on the density of the specific material, a temperature measuring device for measuring the temperature of the first and the second light sources and the light receiving device, or measuring the ambient temperature around the first and the second light sources and the light receiving device and compensation unit for compensating the difference of absorbance which is calculated by the arithmetic unit, with the absorption coefficient of the specific material at a shifted peak-wavelength of the second light, wherein the shifted peak-wavelength is calculated on the basis of a measured value measured by said temperature measuring device.

摘要翻译： 一种光密度检测器，包括：第一光源，用于发射属于其中第一光几乎不被包含在样品中的特定材料吸收的波长区域的第一光;第二光源，用于发射属于 基本上与第一光相比，第二光被特定材料吸收的波长区域，其中第二光的峰值波长通过温度的变化和特定材料的吸收变化而偏移 通过峰值波长偏移是具有平缓等级的线性方程的特征，用于测量透射通过样本的第一和第二光的量的光接收装置，用于计算第一光和第二光之间的吸光度差的运算单元 并且其中的第二光二者根据特定材料的密度而变化，用于测量t的温度测量装置 第一和第二光源和光接收装置的温度，或测量第一和第二光源周围的环境温度，以及用于补偿由运算单元计算的吸光度差的光接收装置和补偿单元 ，其中特定材料在第二光的偏移峰值波长处的吸收系数，其中基于由所述温度测量装置测量的测量值计算偏移的峰值波长。