公开(公告)号：US07317325B2

公开(公告)日：2008-01-08

申请号：US11290932

申请日：2005-11-29

申请人： Matthias Brunner ,  Young Seop Ko

发明人： Matthias Brunner ,  Young Seop Ko

IPC分类号： G01R31/00

CPC分类号： G09G3/006 ,  G01R31/2853 ,  G01R31/302 ,  G09G3/3648

摘要： A method and apparatus for identifying a location of a short between two or more signal lines on a substrate having a plurality of thin film transistors and a plurality of pixels associated with the thin film transistors. The method includes locating the two or more signal lines having the short, locating one or more defective pixels disposed between the two or more signal lines having the short, and identifying the defective pixels as the location of the short.

摘要翻译： 一种用于识别具有多个薄膜晶体管和与该薄膜晶体管相关联的多个像素的衬底上的两条或更多条信号线之间的短路位置的方法和装置。 该方法包括定位两条或更多条信号线，该信号线具有设置在具有短路的两条或多条信号线之间的一个或多个缺陷像素，并且识别缺陷像素作为短路的位置。