Abstract:
A method for providing an on-chip variation determination and an integrated circuit utilizing the same are provided. The method includes: outputting, by a launch register circuit, a test data to the capture register circuit according to the first clock; receiving, by a capture register circuit, the test data from the launch register circuit according to the second clock; adjusting, by a control circuit, a first number of a first chain of delay elements to generate the first clock and a second number of a second chain of delay elements for the capture register circuit to just capture the test data to generate the second clock; and determining, by the control circuit, a path delay between the launch register circuit and the capture register circuit based on the first number of the first chain of delay elements and the second number of the second chain of delay elements.
Abstract:
A signal generator includes a main ring oscillator and a first ring oscillator. The main ring oscillator is supplied by a power voltage, and is configured to generate an output oscillation signal. The main ring oscillator is coupled through a power mesh to the power voltage. The first ring oscillator is supplied by the power voltage. The first ring oscillator is similar or identical to the main ring oscillator. The first ring oscillator is coupled through the power mesh to the power voltage. The first ring oscillator is used to calibrate a frequency of the output oscillation signal.