OPTICAL TESTING OF FK MODULATORS FOR SILICON PHOTONICS APPLICATIONS

    公开(公告)号:US20180335653A1

    公开(公告)日:2018-11-22

    申请号:US15597835

    申请日:2017-05-17

    CPC classification number: G02F1/025 G02F2001/0157

    Abstract: An method for characterizing a modulator for fabricating a silicon photonics circuit and an apparatus (e.g., a silicon photonics wafer) made via the method are described. The method includes determining an absorption spectrum of a modulator and determining, based at least on the determined absorption spectrum, an operational bandwidth of the modulator. The method further includes selecting a laser for coupling with the modulator using the operational bandwidth of the modulator. In this way, the laser is selected such that it has an emission bandwidth that corresponds to the operational bandwidth of the modulator.

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