MULTI-PHOTODIODE PIXEL CELL
    1.
    发明申请

    公开(公告)号:US20230084614A1

    公开(公告)日:2023-03-16

    申请号:US17849264

    申请日:2022-06-24

    Abstract: Methods and systems for image sensing are provided. In one example, an apparatus comprises a semiconductor substrate comprising a light incident surface to receive light, a first pinned photodiode, and a second pinned photodiode, the first pinned photodiode and the second pinned photodiode forming a stack structure in the semiconductor substrate along an axis perpendicular to the light incident surface, the stack structure enabling the first pinned photodiode and the second pinned photodiode to, respectively, convert a first component of the light and a second component of the light to first charge and second charge. The apparatus further comprises one or more capacitors formed in the semiconductor substrate and configured to generate a first voltage and a second voltage based on, respectively, the first charge and the second charge.

    OPTICAL COMPONENTS HAVING ATHERMALIZATION AND ABERRATION CORRECTION CHARACTERISTICS

    公开(公告)号:US20230024433A1

    公开(公告)日:2023-01-26

    申请号:US17379690

    申请日:2021-07-19

    Abstract: According to examples, a system for designing optical components to provide passive athermalization and aberration correction is described. The system may include a processor and a memory storing instructions. The processor, when executing the instructions, may cause the system to select one or more optical elements to be included in the optical component based on the received design specifications, select one or more optical element configurations based on the selected one or more optical elements and implement an optimization function to optimize the selected one or more optical element configurations. The processor, when executing the instructions, may then determine if the one or more optical element configurations meet one or more initial specifications, enable one or more adjustment(s) to the one or more optical element configurations and determine if an optical element configuration meet one or more additional specifications.

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