公开(公告)号：US20240126448A1

公开(公告)日：2024-04-18

申请号：US17967265

申请日：2022-10-17

Applicant: Micron Technology, Inc.

Inventor： Animesh R. Chowdhury ,  Kishore K. Muchherla ,  Nicola Ciocchini ,  Akira Goda ,  Jung Sheng Hoei ,  Niccolo' Righetti ,  Jonathan S. Parry

IPC: G06F3/06

CPC classification number: G06F3/0619 ,  G06F3/0653 ,  G06F3/0679

Abstract: Apparatuses, systems, and methods for adapting a read disturb scan. One example method can include determining a delay between a first read command and a second read command, incrementing a read count based on the determined delay between the first read command and the second read command, and adapting a read disturb scan rate based on the incremented read count.

公开(公告)号：US20250014655A1

公开(公告)日：2025-01-09

申请号：US18895236

申请日：2024-09-24

Applicant: Micron Technology, Inc.

Inventor： Nicola Ciocchini ,  Animesh R. Chowdhury ,  Kishore Kumar Muchherla ,  Akira Goda ,  Jung Sheng Hoei ,  Niccolo' Righetti ,  Jonathan S. Parry

IPC: G11C16/34 ,  G11C16/08 ,  G11C16/26

Abstract: Methods, systems, and apparatuses include receiving a read command including a logical address. The read command is directed to a portion of memory composed of blocks and each block is composed of wordline groups. The physical address for the read command is identified using the logical address. The wordline group is determined using the physical address. A slope factor is retrieved using the wordline group. A read counter is incremented using the slope factor.

公开(公告)号：US20240071522A1

公开(公告)日：2024-02-29

申请号：US17895886

申请日：2022-08-25

Applicant: Micron Technology, Inc.

Inventor： Nicola Ciocchini ,  Animesh R. Chowdhury ,  Kishore Kumar Muchherla ,  Akira Goda ,  Jung Sheng Hoei ,  Niccolo' Righetti ,  Jonathan S. Parry

IPC: G11C16/34 ,  G11C16/08 ,  G11C16/26

CPC classification number: G11C16/3427 ,  G11C16/08 ,  G11C16/26

Abstract: Methods, systems, and apparatuses include receiving a read command including a logical address. The read command is directed to a portion of memory composed of blocks and each block is composed of wordline groups. The physical address for the read command is identified using the logical address. The wordline group is determined using the physical address. A slope factor is retrieved using the wordline group. A read counter is incremented using the slope factor.

公开(公告)号：US12216915B2

公开(公告)日：2025-02-04

申请号：US17967265

申请日：2022-10-17

Applicant: Micron Technology, Inc.

Inventor： Animesh R. Chowdhury ,  Kishore K. Muchherla ,  Nicola Ciocchini ,  Akira Goda ,  Jung Sheng Hoei ,  Niccolo′ Righetti ,  Jonathan S. Parry

IPC: G06F3/06

Abstract: Apparatuses, systems, and methods for adapting a read disturb scan. One example method can include determining a delay between a first read command and a second read command, incrementing a read count based on the determined delay between the first read command and the second read command, and adapting a read disturb scan rate based on the incremented read count.

公开(公告)号：US12131788B2

公开(公告)日：2024-10-29

申请号：US17895886

申请日：2022-08-25

Applicant: Micron Technology, Inc.

Inventor： Nicola Ciocchini ,  Animesh R. Chowdhury ,  Kishore Kumar Muchherla ,  Akira Goda ,  Jung Sheng Hoei ,  Niccolo' Righetti ,  Jonathan S. Parry

IPC: G11C7/00 ,  G11C16/08 ,  G11C16/26 ,  G11C16/34

CPC classification number: G11C16/3427 ,  G11C16/08 ,  G11C16/26

Abstract: Methods, systems, and apparatuses include receiving a read command including a logical address. The read command is directed to a portion of memory composed of blocks and each block is composed of wordline groups. The physical address for the read command is identified using the logical address. The wordline group is determined using the physical address. A slope factor is retrieved using the wordline group. A read counter is incremented using the slope factor.