公开(公告)号：US20220157396A1

公开(公告)日：2022-05-19

申请号：US17099694

申请日：2020-11-16

Applicant: Micron Technology, Inc.

Inventor： Markus H. Geiger ,  Anthony D. Newton ,  Ron A. Hughes ,  Eric J. Stave

IPC: G11C29/02 ,  G01R31/317 ,  G01R31/30 ,  G01R31/28

Abstract: Apparatuses for characterizing system channels and associated methods and systems are disclosed. In one embodiment, a tester is coupled to an adaptor configured to plug into a CPU socket of a system platform (e.g., a motherboard). The motherboard includes a memory socket that is connected to the CPU socket through system channels. The adaptor may include a connector configured to physically and electrically engage with the CPU socket, an interface configured to receive test signals from the tester, and circuitry configured to internally route the test signals to the connector. The adaptor, if plugged into the CPU socket, can facilitate the tester to directly assess signal transfer characteristics of the system channels. Accordingly, the tester can determine optimum operating parameters for the memory device in view of the system channel characteristics.

公开(公告)号：US11728001B2

公开(公告)日：2023-08-15

申请号：US17099694

申请日：2020-11-16

Applicant: Micron Technology, Inc.

Inventor： Markus H. Geiger ,  Anthony D. Newton ,  Ron A. Hughes ,  Eric J. Stave

IPC: G01R31/28 ,  G11C29/02 ,  G01R31/317 ,  G01R31/30 ,  G11C29/04

CPC classification number: G11C29/025 ,  G01R31/2818 ,  G01R31/2863 ,  G01R31/30 ,  G01R31/317 ,  G11C2029/0407

Abstract: Apparatuses for characterizing system channels and associated methods and systems are disclosed. In one embodiment, a tester is coupled to an adaptor configured to plug into a CPU socket of a system platform (e.g., a motherboard). The motherboard includes a memory socket that is connected to the CPU socket through system channels. The adaptor may include a connector configured to physically and electrically engage with the CPU socket, an interface configured to receive test signals from the tester, and circuitry configured to internally route the test signals to the connector. The adaptor, if plugged into the CPU socket, can facilitate the tester to directly assess signal transfer characteristics of the system channels. Accordingly, the tester can determine optimum operating parameters for the memory device in view of the system channel characteristics.