公开(公告)号：US10914780B2

公开(公告)日：2021-02-09

申请号：US16227348

申请日：2018-12-20

Applicant: Micron Technology, Inc.

Inventor： Binoy Jose Panakkal ,  Rajesh N. Gupta

IPC: G01R31/26 ,  G05F3/26 ,  G01R19/165 ,  H03F3/50 ,  H03K19/0948

Abstract: A measurement circuit may include a transistor having a first terminal, a second terminal, and a third terminal, wherein the first terminal is coupled to a first reference voltage. The measurement circuit may further include a first operational amplifier including a first input coupled to the second terminal of the transistor and an output coupled to the third terminal of the transistor. The first operational amplifier may further include a second input configured to receive a second reference voltage. The measurement circuit may also include a first unity-gain voltage follower including a second operational amplifier having a first input coupled to the first input of the first operational amplifier. Methods of measuring a threshold voltage, semiconductor devices, and electronic systems are also described.