公开(公告)号：US20220005538A1

公开(公告)日：2022-01-06

申请号：US17476115

申请日：2021-09-15

Applicant: Micron Technology, Inc.

Inventor： Daniel James Gunderson ,  Eugene Dvoskin ,  Vehid Suljic ,  Brandon R. Nixon

IPC: G11C29/38 ,  G11C29/12

Abstract: Methods, systems, and devices for a capacitor health check are described. A health check manager can detect a trigger for a capacitor health check for a memory sub-system. The health check manager can determine a number of write commands in a set of one or more pending commands for a memory die of the memory sub-system and set a start time for the capacitor health check based on the number of write commands in the set of one or more pending commands. In some cases, the health check manager can perform the capacitor health check in accordance with the start time.

公开(公告)号：US11139042B2

公开(公告)日：2021-10-05

申请号：US16721729

申请日：2019-12-19

Applicant: Micron Technology, Inc.

Inventor： Daniel James Gunderson ,  Eugene Dvoskin ,  Vehid Suljic ,  Brandon R. Nixon

IPC: G11C29/00 ,  G11C29/38 ,  G11C29/12

Abstract: Methods, systems, and devices for a capacitor health check are described. A health check manager may detect a trigger for a capacitor health check for a memory sub-system. The health check manager may determine a number of write commands in a set of one or more pending commands for a memory die of the memory sub-system and set a start time for the capacitor health check based on the number of write commands in the set of one or more pending commands. In some cases, the health check manager may perform the capacitor health check in accordance with the start time.

公开(公告)号：US11664082B2

公开(公告)日：2023-05-30

申请号：US17476115

申请日：2021-09-15

Applicant: Micron Technology, Inc.

Inventor： Daniel James Gunderson ,  Eugene Dvoskin ,  Vehid Suljic ,  Brandon R. Nixon

IPC: G11C29/00 ,  G11C29/38 ,  G11C29/12

CPC classification number: G11C29/38 ,  G11C29/12015

Abstract: A health check manager may detect a trigger for a capacitor health check for a memory sub-system. The health check manager may determine a number of write commands in a set of one or more pending commands for a memory die of the memory sub-system and set a start time for the capacitor health check based on the number of write commands in the set of one or more pending commands. In some cases, the health check manager may perform the capacitor health check in accordance with the start time.

公开(公告)号：US20210193243A1

公开(公告)日：2021-06-24

申请号：US16721729

申请日：2019-12-19

Applicant: Micron Technology, Inc.

Inventor： Daniel James Gunderson ,  Eugene Dvoskin ,  Vehid Suljic ,  Brandon R. Nixon

IPC: G11C29/38 ,  G11C29/12

Abstract: Methods, systems, and devices for a capacitor health check are described. A health check manager can detect a trigger for a capacitor health check for a memory sub-system. The health check manager can determine a number of write commands in a set of one or more pending commands for a memory die of the memory sub-system and set a start time for the capacitor health check based on the number of write commands in the set of one or more pending commands. In some cases, the health check manager can perform the capacitor health check in accordance with the start time.