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公开(公告)号:US11907570B2
公开(公告)日:2024-02-20
申请号:US16801072
申请日:2020-02-25
Applicant: Micron Technology, Inc.
Inventor: Daniel James Gunderson
CPC classification number: G06F3/0659 , G06F3/0619 , G06F3/0653 , G06F3/0673 , G06F11/1402
Abstract: Methods, systems, and devices for predictive media management for read disturb are described. A read disturbance manager can monitor a bit error rate for a block of a memory die. The read disturbance manager can detect that a degradation of the bit error rate satisfies a degradation threshold specific to the memory die. In some cases, the read disturbance manager can perform a write operation to write data from the block of the memory die to a second block of the memory die based on detecting that the degradation of the bit error rate satisfies the degradation threshold.
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公开(公告)号:US11664082B2
公开(公告)日:2023-05-30
申请号:US17476115
申请日:2021-09-15
Applicant: Micron Technology, Inc.
Inventor: Daniel James Gunderson , Eugene Dvoskin , Vehid Suljic , Brandon R. Nixon
CPC classification number: G11C29/38 , G11C29/12015
Abstract: A health check manager may detect a trigger for a capacitor health check for a memory sub-system. The health check manager may determine a number of write commands in a set of one or more pending commands for a memory die of the memory sub-system and set a start time for the capacitor health check based on the number of write commands in the set of one or more pending commands. In some cases, the health check manager may perform the capacitor health check in accordance with the start time.
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公开(公告)号:US20210193243A1
公开(公告)日:2021-06-24
申请号:US16721729
申请日:2019-12-19
Applicant: Micron Technology, Inc.
Inventor: Daniel James Gunderson , Eugene Dvoskin , Vehid Suljic , Brandon R. Nixon
Abstract: Methods, systems, and devices for a capacitor health check are described. A health check manager can detect a trigger for a capacitor health check for a memory sub-system. The health check manager can determine a number of write commands in a set of one or more pending commands for a memory die of the memory sub-system and set a start time for the capacitor health check based on the number of write commands in the set of one or more pending commands. In some cases, the health check manager can perform the capacitor health check in accordance with the start time.
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公开(公告)号:US12175133B2
公开(公告)日:2024-12-24
申请号:US18420887
申请日:2024-01-24
Applicant: Micron Technology, Inc.
Inventor: Daniel James Gunderson
Abstract: Methods, systems, and devices for predictive media management for read disturb are described. A read disturbance manager can monitor a bit error rate for a block of a memory die. The read disturbance manager can detect that a degradation of the bit error rate satisfies a degradation threshold specific to the memory die. In some cases, the read disturbance manager can perform a write operation to write data from the block of the memory die to a second block of the memory die based on detecting that the degradation of the bit error rate satisfies the degradation threshold.
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公开(公告)号:US20240272829A1
公开(公告)日:2024-08-15
申请号:US18420887
申请日:2024-01-24
Applicant: Micron Technology, Inc.
Inventor: Daniel James Gunderson
CPC classification number: G06F3/0659 , G06F3/0619 , G06F3/0653 , G06F3/0673 , G06F11/1402
Abstract: Methods, systems, and devices for predictive media management for read disturb are described. A read disturbance manager can monitor a bit error rate for a block of a memory die. The read disturbance manager can detect that a degradation of the bit error rate satisfies a degradation threshold specific to the memory die. In some cases, the read disturbance manager can perform a write operation to write data from the block of the memory die to a second block of the memory die based on detecting that the degradation of the bit error rate satisfies the degradation threshold.
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公开(公告)号:US20220005538A1
公开(公告)日:2022-01-06
申请号:US17476115
申请日:2021-09-15
Applicant: Micron Technology, Inc.
Inventor: Daniel James Gunderson , Eugene Dvoskin , Vehid Suljic , Brandon R. Nixon
Abstract: Methods, systems, and devices for a capacitor health check are described. A health check manager can detect a trigger for a capacitor health check for a memory sub-system. The health check manager can determine a number of write commands in a set of one or more pending commands for a memory die of the memory sub-system and set a start time for the capacitor health check based on the number of write commands in the set of one or more pending commands. In some cases, the health check manager can perform the capacitor health check in accordance with the start time.
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公开(公告)号:US20250094089A1
公开(公告)日:2025-03-20
申请号:US18962836
申请日:2024-11-27
Applicant: Micron Technology, Inc.
Inventor: Daniel James Gunderson
Abstract: Methods, systems, and devices for predictive media management for read disturb are described. A read disturbance manager can monitor a bit error rate for a block of a memory die. The read disturbance manager can detect that a degradation of the bit error rate satisfies a degradation threshold specific to the memory die. In some cases, the read disturbance manager can perform a write operation to write data from the block of the memory die to a second block of the memory die based on detecting that the degradation of the bit error rate satisfies the degradation threshold.
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公开(公告)号:US11139042B2
公开(公告)日:2021-10-05
申请号:US16721729
申请日:2019-12-19
Applicant: Micron Technology, Inc.
Inventor: Daniel James Gunderson , Eugene Dvoskin , Vehid Suljic , Brandon R. Nixon
Abstract: Methods, systems, and devices for a capacitor health check are described. A health check manager may detect a trigger for a capacitor health check for a memory sub-system. The health check manager may determine a number of write commands in a set of one or more pending commands for a memory die of the memory sub-system and set a start time for the capacitor health check based on the number of write commands in the set of one or more pending commands. In some cases, the health check manager may perform the capacitor health check in accordance with the start time.
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公开(公告)号:US20210263679A1
公开(公告)日:2021-08-26
申请号:US16801072
申请日:2020-02-25
Applicant: Micron Technology, Inc.
Inventor: Daniel James Gunderson
Abstract: Methods, systems, and devices for predictive media management for read disturb are described. A read disturbance manager can monitor a bit error rate for a block of a memory die. The read disturbance manager can detect that a degradation of the bit error rate satisfies a degradation threshold specific to the memory die. In some cases, the read disturbance manager can perform a write operation to write data from the block of the memory die to a second block of the memory die based on detecting that the degradation of the bit error rate satisfies the degradation threshold.
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