公开(公告)号：US20130301357A1

公开(公告)日：2013-11-14

申请号：US13943254

申请日：2013-07-16

Applicant: Micron Technology, Inc.

Inventor： Vishal Sarin ,  Frankie Roohpavar ,  Hoei Jung Sheng

IPC: G11C16/26

CPC classification number: G11C16/26 ,  G11C11/5642 ,  G11C16/3418

Abstract: The present disclosure includes methods, devices, modules, and systems for reducing noise in semiconductor devices. One method embodiment includes applying a reset voltage to a control gate of a semiconductor device for a period of time. The method further includes sensing the state of the semiconductor device after applying the reset voltage.