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公开(公告)号：US20170356946A1
公开(公告)日：2017-12-14
申请号：US15606109
申请日：2017-05-26
Applicant: Micron Technology, Inc.
Inventor： Paul E. Gregory , Randon K. Richards
Abstract: The present disclosure includes apparatuses and methods related to test devices, for example testing devices by measuring signals emitted by a device. One example apparatus can include a first portion including a number of sidewalls positioned to at least partially surround a device under test; and a second portion electrically coupled to the first portion, wherein the second portion is configured to move in the x-direction, the y-direction, and z-direction.
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公开(公告)号：US20200348349A1
公开(公告)日：2020-11-05
申请号：US16931912
申请日：2020-07-17
Applicant: Micron Technology, Inc.
Inventor： Paul E. Gregory , Randon K. Richards
Abstract: The present disclosure includes apparatuses and methods related to test devices, for example testing devices by measuring signals emitted by a device. One example apparatus can include a first portion including a number of sidewalls positioned to at least partially surround a device under test; and a second portion electrically coupled to the first portion, wherein the second portion is configured to move in the x-direction, the y-direction, and z-direction.
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公开(公告)号：US10718805B2
公开(公告)日：2020-07-21
申请号：US15606109
申请日：2017-05-26
Applicant: Micron Technology, Inc.
Inventor： Paul E. Gregory , Randon K. Richards
Abstract: The present disclosure includes apparatuses and methods related to test devices, for example testing devices by measuring signals emitted by a device. One example apparatus can include a first portion including a number of sidewalls positioned to at least partially surround a device under test; and a second portion electrically coupled to the first portion, wherein the second portion is configured to move in the x-direction, the y-direction, and z-direction.
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公开(公告)号：US10989748B2
公开(公告)日：2021-04-27
申请号：US16931912
申请日：2020-07-17
Applicant: Micron Technology, Inc.
Inventor： Paul E. Gregory , Randon K. Richards
Abstract: The present disclosure includes apparatuses and methods related to test devices, for example testing devices by measuring signals emitted by a device. One example apparatus can include a first portion including a number of sidewalls positioned to at least partially surround a device under test; and a second portion electrically coupled to the first portion, wherein the second portion is configured to move in the x-direction, the y-direction, and z-direction.
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